Scanning probe microscope
The present invention is intended to solve the problem that the tip of the probe of a scanning probe microscope cannot be conditioned stably due to overload in a contact region. This problem is solved by a scanning probe microscope for scanning the probe and a sample relative to each other. The microscope has a cantilever, a vibration means for vibrating the cantilever, and a vibration signal-switching means for switching a vibration signal applied to the vibration means between at least two different signals. The cantilever has a resilient body that supports the probe.
1. A scanning probe microscope for scanning a probe and a sample relative to each other, said scanning probe microscope comprising:
a vibration means for vibrating the probe;
a Z motion drive means for varying the distance between said probe and said sample;
a feedback circuit for controlling the distance between the probe and the sample by controlling said Z motion drive means according to an effect of a physical property that the vibrating probe undergoes from the sample; and
a computer-controlled multiple throw switch for switching a reference value between at least two different values, the reference value stipulating the distance between the probe and the sample controlled by the feedback circuit one of said two reference values being a value at which the sample is imaged and observed in the non-contact mode and the other at which the tip of the probe is brought into contact with a surface to adjust the shape of the probe tip.
2. A scanning probe microscope for scanning in X and Y directions a probe and a sample relative to each other, said scanning probe microscope comprising:
a cantilever having a resilient body that supports the probe;
a vibration means for vibrating the cantilever;
a Z motion drive means for varying the distance between said probe and said sample;
a feedback circuit for controlling the distance between the probe and the sample by controlling said Z motion drive according to an effect of an interatomic force that the vibrating probe undergoes from the sample; and
a computer-controlled multiple throw switch for switching a reference value between at least two different values, the reference value stipulating the distance between the probe and the sample controlled by the feedback circuit one of said two reference values being a value at which the sample is imaged and observed in the non-contact mode and the other at which the tip of the probe is brought into contact with a surface to adjust the shape of the probe tip.
3. A scanning probe microscope as set forth in claim 1 or 2 , wherein during the scanning, the shape of the probe is adjusted.
4. A scanning probe microscope as set forth in claim 1 or 2 , wherein the sample has a surface for adjusting the shape of the probe.