IP Library › Granted Patent US 7,312,734
Granted Patent B2
US 7,312,734 · App. 11/349,400 · Granted Dec 25, 2007

Calibratable analog-to-digital converter system

Assignee: Analog Devices, Inc.
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Quick Facts
Patent No.
US 7,312,734
App. No.
11/349,400
Granted
Dec 25, 2007
Kind
B2
Abstract

A calibratable analog-to-digital converter system with a split analog-to-digital converter architecture including N Analog-to-Digital Converters (ADCs) each configured to convert the same analog input signal into a digital signal. Calibration logic is responsive to the digital signals output by the N ADCs and is configured to calibrate each of the ADCs based on the digital signals output by each ADC.

Claims (44)

1. A calibratable analog-to-digital converter system comprising:

a split analog-to-digital converter architecture including N Analog-to-Digital Converters (ADCs) each configured to convert the same analog input signal into a digital signal; and

calibration logic, responsive to the digital signals output by the N ADCs, and configured to calibrate each of the ADCs based on the digital signals output by each ADC.

2. The system of claim 1 further including averaging logic for averaging the digital signals output by the ADCs to produce a system output signal.

3. The system of claim 1 further including logic for differencing the digital signals output by the ADCs, the calibration logic responsive to the differencing and configured to calibrate the ADCs until the difference in the digital signals output by the ADCs is minimized.

4. The system of claim 3 in which each ADC includes redundancy and the calibration logic is configured to drive each ADC to produce its digital signal based on the analog input signal via a different sequence of decisions.

5. The system of claim 4 in which the calibration logic is responsive to the decisions of each ADC and the differences between the digital signals output by each ADC, and the calibration logic is configured to calculate the errors in each ADC and to drive the errors to a minimum.

6. The system of claim 5 in which each ADC has an architecture selected from the group consisting of SAR, cyclic, and pipeline ADC architectures.

7. The system of claim 1 in which each ADC occupies approximately 1/N of the die area of the system.

8. The system of claim 1 in which each ADC consumes approximately 1/N of the power of the system.

9. The system of claim 1 in which the calibration logic is deterministic, background, and digital.

10. The system of claim 1 in which the ADCs are interleaved.

11. The system of claim 1 in which N equals 2.

12. The system of claim 1 in which N is greater than 2.

13. A calibratable analog-to-digital converter system comprising:

a split analog-to-digital converter architecture including N redundant Analog-to-Digital Converters (ADCs) each configured to convert the same analog input signal into a digital signal;

logic for differencing the digital signals output by the ADCs; and

calibration logic configured to drive each ADC to produce its digital signal based on the analog input signal via a different sequence of decisions and to calculate the errors in each ADC and to drive the errors to a minimum.

14. The system of claim 13 further including averaging logic for averaging the digital signals output by the ADCs to produce a system output signal.

15. The system of claim 13 in which each ADC occupies substantially 1/N of the die area of the system.

16. The system of claim 13 in which each ADC consumes substantially 1/N of the power of the system.

17. The system of claim 13 in which the calibration logic is deterministic, background, and digital.

18. The system of claim 13 in which the ADCs are interleaved.

19. An analog-to-digital converter calibration method comprising:

driving N Analog-to-Digital Converters (ADCs) to each convert the same analog input signal into N digital signals; and

using the N digital signals output by the ADCs to calibrate each ADC.

20. The method of claim 19 further including the step of averaging the digital signals output by the ADCs to produce a system output signal.

21. The method of claim 19 further including the step of differencing the digital signals output by the ADCs and using the differences to calibrate the ADCs.

22. The method of claim 19 in which calibration includes driving each ADC to produce its digital output signal based on the analog input signal via a different sequence of decisions.

23. The method of claim 22 in which calibration includes calculating the errors in each ADC and driving the errors to a minimum.

24. The method of claim 19 in which calibration is performed deterministically, in the background, and in the digital domain.

25. An ADC calibration method comprising:

driving N Analog-to-Digital Converters (ADCs) to each convert the same analog input signal into N digital signals; and

calibrating each of the ADCs based on the digital signal output by each ADC.

26. The method of claim 25 further including the step of averaging the digital signals output by the ADCs to produce a system output signal.

27. The method of claim 25 further including the step of differencing the digital signals output by the ADCs and using the differences to calibrate the ADCs.

28. The method of claim 27 in which calibration includes driving each ADC to produce its digital output signal based on the analog input signal via a different sequence of decisions.

29. The method of claim 28 in which calibration includes calculating the errors in each ADC and driving the errors to a minimum.

30. The method of claim 25 in which calibration is performed deterministically, in the background, and in the digital domain.

31. A calibratable analog-to-digital converter system comprising:

a split Analog-to-Digital Converter (ADC) architecture including N ADCs each configured to convert the same analog input signal into a digital signal;

calibration logic configured to calibrate one ADC while at least one other ADC converts the analog signal into a digital signal and to calibrate a different ADC while at least another ADC converts the analog signal into a digital signal.

32. The system of claim 31 in which there are first and second ADCs and the calibration logic is configured to calibrate the first ADC while the second ADC provides its digital signal as the system output signal and to calibrate the second ADC while the first ADC provides its digital signal as the system output signal.

33. The system of claim 31 in which there are more than two ADCs and the calibration logic is configured to calibrate one ADC while the other ADCs provide digital signals averaged to produce the system output signal.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 6, 2006
From: MCNEILL, JOHN A.; COLN, MICHAEL C.
To: ANALOG DEVICES, INC.
Reel/Frame 017543/0008 →
Continuity (2)
Provisional Application 6065065800 · Feb 7, 2005
Related Publication 20060176197A1 · Aug 10, 2006