Appearance inspection apparatus and projection method for projecting image of sample under inspection
An object of the present invention is to provide an appearance inspection apparatus that can change the method of illumination, the shape of illumination light, and a spatial filter for the projection of an image of a sample dynamically during inspection, and also to provide a projection method for projecting the image of the sample. Illumination optics 12 and 13 and imaging optics 21 and 22 in the appearance inspection apparatus are respectively configured to form reflecting optical systems with mirror array devices 16 and 26 disposed at points conjugate to the pupil position 8 of an objective lens 3 . The mirror array devices 16 and 26 are controlled in accordance with the field-of-view position of the objective lens 3 on the sample.
1. An appearance inspection apparatus comprising:
a light source;
an objective lens;
an illumination optical system for projecting illumination light from said light source onto a sample through said objective lens; and
an imaging optical system for projecting an image of said sample, projected through said objective lens, onto an imaging device, wherein
said illumination optical system is configured as a reflecting optical system with a first mirror array device disposed at a point conjugate to a pupil position of said objective lens, and
said imaging optical system is configured as a reflecting optical system with a second mirror array device disposed at a Fourier transformation plane in said imaging optical system.
2. An appearance inspection apparatus as claimed in claim 1 , further comprising mirror controller for controlling said first mirror array device in accordance with a field-of-view position of said objective lens on said sample.
3. An appearance inspection apparatus as claimed in claim 1 , further comprising mirror controller for controlling said second mirror array device in accordance with the field-of-view position of said objective lens on said sample.
4. A method of image projection in an appearance inspection apparatus, the method comprising:
projecting illumination light from a light source onto a sample through an objective lens;
projecting an image of said sample, projected through said objective lens, onto an imaging device;
disposing a first mirror array device at a point conjugate to a pupil position of said objective lens;
filtering said illumination light from said light source through said first mirror array device;
disposing a second mirror array device at a Fourier transformation plane in an imaging optical system; and
filtering the image of said sample projected through said objective lens through said second mirror array device.
5. A method of image projection as claimed in claim 4 , further comprising controlling said first mirror array device in accordance with a field-of-view position of said objective lens on said sample.
6. A method of image projection as claimed in claim 4 , further comprising controlling said second mirror array device in accordance with the field-of-view position of said objective lens on said sample.