Test circuit for flat panel display device

1. A test circuit for a flat panel display device, comprising: a substrate including at least one scan side, at least one data side and a pixel area; a plurality of pixel structures formed in the pixel area, each pixel structure having n sub-pixels, where n is a positive integer; a plurality of signal lines formed on the substrate, each signal line being connected to a corresponding sub-pixel; a plurality of shorting bar sets, being formed on at least one of the at least one scan side and the at least one data side, wherein the shorting bar sets are electrically connected to the signal lines and each shorting bar set is disconnected from each other, wherein the shorting bar sets respectively receive first testing signals corresponding to the signal lines for testing corresponding pixel structures; and a plurality of shorting bar buses being electrically connected to the shorting bar sets, wherein the shorting bar buses respectively receive second testing signals corresponding to the signal lines for testing corresponding pixel structures.

2. The test circuit of claim 1 , wherein the signal lines comprise a plurality of data lines.

3. The test circuit of claim 2 , wherein each shorting bar set includes:

p shorting bars, each shorting bar set being electrically connected to p*m data lines, where p=k*n, m is a positive integer, and k=1 or 2; and

p first testing pads being electrically connected to the p shorting bars, for receiving the first testing signals.

4. The test circuit of claim 3 , wherein the shorting bar buses comprise even data shorting bar buses formed on the at least one data side, and each even data shorting bar bus includes a plurality of second testing pads which are adapted to receive the second testing signals.

5. The test circuit of claim 4 , wherein the p shorting bars of each shorting bar set are electrically connected to the even data shorting bar buses, respectively.

6. The test circuit of claim 3 , wherein the shorting bar buses comprise odd data shorting bar buses formed on the at least one data side, and each odd data shorting bar bus includes a plurality of second testing pads which are adapted to receive the second testing signals.

7. The test circuit of claim 6 , wherein the p shorting bars of each shorting bar set are electrically connected to the odd data shorting bar buses, respectively.

8. The test circuit of claim 1 , wherein the signal lines comprise a plurality of scan lines.

9. The test circuit of claim 8 , wherein each shorting bar set includes:

p′ shorting bars, each shorting bar set being electrically connected to p′*m′ scan lines, where p′ is greater than or equal to 2, and m′ is a positive integer; and

p′ first testing pads being electrically connected to the p′ shorting bars, for receiving the first testing signals.

10. The test circuit of claim 9 , wherein the shorting bar buses comprise at least two scan shorting bar buses formed on the at least one scan side, wherein the at least two scan shorting bar buses are electrically connected to the p′ shorting bars of each shorting bar set, respectively, and each scan shorting bar bus includes a plurality of second testing pads which are adapted to receive the second testing signals.

11. A test circuit for a flat panel display device, comprising:

a substrate including at least one scan side and a pixel area; a plurality of pixel structures formed in the pixel area, each pixel structure having n sub-pixels, where n is a positive integer; a plurality of data lines formed on the substrate, each data line being connected to a corresponding sub-pixel; a plurality of scan lines formed on the substrate, and substantially intersected with the data lines; a plurality of scan shorting bar sets, being formed on the at least one scan side, wherein the scan shorting bar sets are electrically connected to the scan lines and each scan shorting bar set is disconnected from each other, wherein the scan shorting bar sets respectively receive first testing signals corresponding to the scan lines for testing corresponding pixel structures; and a plurality of shorting bar buses, being electrically connected to the scan shorting bar sets, wherein the shorting bar buses respectively receive second testing signals corresponding to the scan lines for testing corresponding pixel structures.

12. The test circuit of claim 11 , wherein each scan shorting bar set includes:

p′ shorting bars, each shorting bar set being electrically connected to p′*m′ scan lines, where p′ is greater than or equal to 2, and m′ is a positive integer; and

p′ first testing pads being electrically connected to the p′ shorting bars, for receiving the first testing signals.

13. The test circuit of claim 12 , wherein the shorting bar buses comprise at least two scan shorting bar buses formed on the at least one scan side, wherein the at least two scan shorting bar buses are electrically connected to the p′ shorting bars of each scan shorting bar set, respectively, and each scan shorting bar bus includes a plurality of second testing pads which are adapted to receive the second testing signals.

14. The test circuit of claim 11 , further comprising:

at least one data side formed on the substrate, wherein the at least one data side includes a plurality of data shorting bar sets, and the data shorting bar sets are electrically connected to the data lines, respectively, and each data shorting bar set is disconnected from each other, and the data shorting bar sets are used for respectively receiving third testing signals to corresponding data lines for testing corresponding pixel structures.

15. The test circuit of claim 14 , wherein each data shorting bar set includes:

p shorting bars, each data shorting bar set being electrically connected to p*m data lines, where p=k*n, m is a positive integer, and k=1 or 2; and

p first testing pads being electrically connected to the p shorting bars, for receiving the third testing signals.

16. The test circuit of claim 15 , wherein the shorting bar buses comprise even data shorting bar buses formed on the at least one data side and being electrically connected to the data shorting bar sets, and each even data shorting bar bus includes a plurality of second testing pads which are adapted to receive the second testing signals.

17. The test circuit of claim 16 , wherein the p shorting bars of each data shorting bar set are electrically connected to the even data shorting bar buses, respectively.

18. The test circuit of claim 15 , wherein the shorting bar buses comprise odd data shorting bar buses formed on the at least one data side and being electrically connected to the data shorting bar sets, and each odd data shorting bar bus includes a plurality of second testing pads which are adapted to receive the second testing signals.

19. The test circuit of claim 18 , wherein the p shorting bars of each data shorting bar set are electrically connected to the odd data shorting bar buses, respectively.