IP Library Granted Patent US 7,358,749
Granted Patent B2
US 7,358,749 · App. 11/336,494 · Granted Apr 15, 2008

Method, apparatus, and program for measuring an electromagnetic field and medium storing the program

Assignee: Taiyo Yuden, Co., Ltd.
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Quick Facts
Patent No.
US 7,358,749
App. No.
11/336,494
Granted
Apr 15, 2008
Kind
B2
Abstract

Provided is a method, apparatus and program for calculating an electric-field vector that allows for grasping the intensity, direction and phase of electric field on a scanning plane for an appliance, and a medium storing the program. An electric-field vector at an origin is calculated, based on potential-difference vectors in respective coordinate directions calculated depending upon a detected signal of at least a magnitude and phase of an electric-field component current by arranging a scanning electric-field sensor at an origin of a desired coordinate system established near an object-to-be-measured, signals detected at respective coordinates by sequential movement to desired coordinates on respective coordinate axes, and a detected reference signal of at least a magnitude and phase of a current by fixedly arranging a fixed magnetic-field sensor close to the object-to-be-measured, and distances between coordinates calculated based on the coordinates the scanning electric-field sensor is arranged and the origin.

Claims (38)

1. A method of measuring an electric-field vector formed by an electromagnetic radiation source, the method comprising:

detecting a reference signal comprising at least one of electric-field and magnetic-field component currents by fixedly placing a first probe near the radiation source;

detecting a first signal comprising at least an electric-field component current at a first location, by moving a second probe to the first location near the radiation source;

detecting a second signal comprising at least an electric-field component current at a second location by moving the second probe to the second location;

calculating a potential difference between the first and second signals based on at least in part the first signal, the second signal, and the reference signal;

calculating a distance between the first and second locations; and

calculating an electric-field vector at the first location based on at least in part the potential difference and the distance.

2. The method of claim 1 , further comprising calculating a distribution of electric-field vectors at multiple locations by sequentially moving the second probe to each location.

3. The method of claim 1 , further comprising;

detecting a third signal comprising at least a magnetic-field component current at a third location by moving a third probe to the third location; and

calculating a magnetic-field vector at the third location based on at least in part the third signal and the reference signal.

4. The method of claim 1 , further comprising

detecting a third signal comprising at least a magnetic-field component current at a first location when the second probe is moved to the first location; and

calculating a magnetic-field vector at the first location based on at least in part the third signal and the reference signal.

5. The method of claim 2 , further comprising calculating an electromagnetic-field intensity at a particular location distant from the radiation source based at least in part on the electric-field vector distribution.

6. The method of claim 3 , further comprising:

calculating a distribution of electric-field vectors at multiple locations by sequentially moving the second probe to each location;

calculating a distribution of magnetic-field vectors at multiple locations by sequentially moving the third probe to each location; and

calculating an electromagnetic-field intensity at a particular location distant from the radiation source based at least in part on the electric-field vector distribution and the magnetic-field vector distribution.

7. The method of claim 4 , further comprising:

calculating a distribution of electric-field vectors and distribution of magnetic-field vectors at multiple locations by sequentially moving the second probe to each location; and

calculating an electromagnetic-field intensity at a particular location distant from the radiation source based at least in part on the distribution of electric-field vectors and distribution of magnetic-field vectors.

8. An apparatus configured to measure an electromagnetic field formed by an electromagnetic radiation source, the apparatus comprising:

a first probe fixedly located near the radiation source for detecting a reference signal comprising at least one of electric-field and magnetic-field component currents;

a second probe near configured to be movable for detecting a signal comprising an electric-field component current at the location that the second probe moves to;

a computation unit configured to calculate the electric-field vector of the electromagnetic field based on signals generated by the first and the second probes; and

a control section configured to move the second probe to scan over the radiation source.

9. The apparatus of claim 8 , further comprising a third probe configured to be movable for detecting a signal comprising a magnetic-field component current at the location that the third probe moves to, wherein the computation unit is also configured to calculate a magnetic-field vector of the electromagnetic field based at least in part on signals generated by the first and the third probes.

10. The apparatus of claim 8 , wherein the second probe is further configured to detect a signal comprising a magnetic-field component current at the location of the second probe, and the computation unit is further configured to calculate a magnetic-field vector based at least in part on signals generated by the first and the second probes.

11. The apparatus of claim 8 , wherein the computation unit is further configured to calculate an electromagnetic-field intensity at a particular location distant from the radiation source, based at least in part on the electric-field vector at multiple locations.

12. The apparatus of claim 9 , wherein the computation unit is further configured to calculate a distribution of electric-field vectors and magnetic-field vectors at multiple locations and an electromagnetic-field intensity at a particular location distant from the radiation source based at least in part on signals generated from the first second, and third probes.

13. The apparatus of claim 10 , wherein the computation unit is further configured to calculate a distribution of electric-field vectors and magnetic-field vectors at multiple locations and an electromagnetic-field intensity at a particular location distant from the radiation source based at least in part on signals generated from the first and second probes.

14. A computer readable medium storing executable instructions for causing a general purpose computer to perform the calculating steps of claim 1 .

15. A computer readable medium storing executable instructions for causing a general purpose computer to perform the calculating steps of claim 3 .

16. A computer readable medium storing executable instructions for causing a general purpose computer to perform the calculating steps of claim 4 .

17. A computer readable medium storing executable instructions for causing a general purpose computer to perform the calculating steps of claim 5 .

18. A computer readable medium storing executable instructions for causing a general purpose computer to perform the calculating steps of claim 6 .

19. A computer readable medium storing executable instructions for causing a general purpose computer to perform the calculating steps of claim 7 .

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 18, 2006
From: KAZAMA, SATOSHI; SAKURADA, MASAHIKO; TSUTAGAYA, HIROSHI
To: TAIYO YUDEN CO., LTD.
Reel/Frame 017896/0240 →
Priority Claims (1)
JP 2005-012338 · Jan 20, 2005 · national
Continuity (1)
Related Publication 20060220635A1 · Oct 5, 2006