Method and apparatus for clock deskew
A clock signal is deskewed relative to a data signal by sweeping a sampling point in time and sweeping an amplitude offset. Bit error measurements are made at each sampling point in time and compared. Bit error measurements may be made by comparing received data to predetermined data values. The predetermined data values may be sourced from a linear feedback shift register.
1. A method comprising:
receiving a digital data stream that includes a transition point between a string of one value and a string of a complementary value;
detecting an estimated transition point to approximate the transition point;
time aligning an internal data sequence to the estimated transition point, wherein time aligning comprises starting a linear feedback shift register;
receiving a training sequence, wherein receiving a training sequence comprises sweeping an input amplitude offset; and
comparing data from the training sequence and data from the linear feedback shift register.
2. The method of claim 1 further comprising measuring a bit error rate for multiple input amplitude offsets.
3. The method of claim 2 further comprising sweeping a sampling time.
4. The method of claim 3 further comprising selecting a sampling time corresponding to a lowest bit error rate.
5. The method of claim 3 further comprising selecting a sampling time corresponding to a lowest bit error rate extending to the largest offset.
6. A method comprising:
sampling at a first time point and a first amplitude offset and measuring a bit error rate;
sampling at a second time point and the first amplitude offset and measuring the bit error rate;
selecting the time point at which the bit error rate is lower; and
sampling and measuring bit error rates at a plurality of amplitude offsets.
7. The method of claim 6 further comprising selecting a time point based on an amplitude offset and bit error rate value combination.
8. The method of claim 6 further comprising adapting a filter.
9. A method comprising:
sampling at a first time point and a first amplitude offset and measuring a bit error rate;
sampling at a second time point and the first amplitude offset and measuring the bit error rate;
selecting the time point at which the bit error rate is lower; and
sampling at a plurality of time points in a coarse sweep followed by sampling at a plurality of time points in a fine sweep.
10. A method comprising:
sampling at a first time point and a first amplitude offset and measuring a bit error rate, wherein measuring a bit error rate comprises comparing received data to predetermined data values;
sampling at a second time point and the first amplitude offset and measuring the bit error rate; and
selecting the time point at which the bit error rate is lower.
11. A port circuit comprising:
a sampler having a clock control input;
a variable clock circuit coupled to the clock control input of the sampler, the variable clock circuit adapted to modify a sample time of received samples;
an amplitude offset circuit adapted to offset amplitude of received samples;
a data store; and
a circuit adapted to compare received samples and data from the data store.
12. The port circuit of claim 11 wherein the data store comprises a linear feedback shift register.
13. The port circuit of claim 11 wherein the data store comprises a shift register.
14. The port circuit of claim 13 wherein the data store is adapted to have a variable shift.
15. The port circuit of claim 11 wherein the amplitude offset circuit comprises a variable current source and a current summer.
16. An electronic system comprising a dynamic random access memory having a first port circuit, and a processor including a second port circuit coupled to the first port circuit, the second port circuit including:
a sampler having a clock control input;
a variable clock circuit coupled to the clock control input of the sampler, the variable clock circuit adapted to modify a sample time of received samples;
an amplitude offset circuit adapted to offset amplitude of received samples;
a data store; and
a circuit adapted to compare received samples and data from the data store.
17. The electronic system of claim 16 wherein the data store comprises a linear feedback shift register.
18. The electronic system of claim 16 wherein the data store comprises a shift register.
19. The electronic system of claim 18 wherein the data store is adapted to have a variable shift.
20. The electronic system of claim 16 wherein the amplitude offset circuit comprises a variable current source and a current summer.