IP Library Granted Patent US 7,417,220
Granted Patent B2
US 7,417,220 · App. 11/220,405 · Granted Aug 26, 2008

Solid state device and light-emitting element

Assignee: Toyoda Gosei Co., Ltd.
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Quick Facts
Patent No.
US 7,417,220
App. No.
11/220,405
Granted
Aug 26, 2008
Kind
B2
Abstract

A solid-state device having: a flip-chip mounted solid-state element; a power receiving/feeding portion having a mounting substrate to allow that a mounting surface of the solid-state element forms substantially the same plane as a surface of the mounting substrate; and an inorganic sealing portion made of an inorganic sealing material having a thermal expansion coefficient equal to that of the power receiving/feeding portion for sealing the solid-state element.

Claims (52)

1. A solid-state device, comprising:

a flip-chip mounted solid-state element;

a power receiving/feeding portion comprising a mounting substrate to allow that a mounting surface of the solid-state element forms substantially the same plane as a surface of the mounting substrate; and

an inorganic sealing portion comprising an inorganic sealing material having a thermal expansion coefficient equal to that of the power receiving/feeding portion for sealing the solid-state element.

2. The solid-state device according to claim 1 , wherein the mounting substrate comprises:

an inorganic substrate; and

a conductive pattern formed thereon.

3. The solid-state device according to claim 1 , wherein the mounting substrate comprises:

an inorganic substrate; and

a circuit pattern comprising:

a first conductive pattern formed on the solid-state element mounting side;

a second conductive pattern formed on the backside thereof; and

a third conductive pattern for electrically connecting both the sides.

4. The solid-state device according to claim 3 , wherein:

the mounting substrate seals the solid-state element while being bonded to the inorganic sealing portion by chemical reaction.

5. The solid-state device according to claim 1 , wherein:

the inorganic sealing portion is formed by pressure-bonding a low melting point glass as the inorganic sealing material to the mounting substrate in a high-viscosity condition of 10 4 -10 9 poises.

6. The solid-state device according to claim 1 , wherein:

the solid-state element comprises an electrode comprising a light reflectivity on the mounting surface side.

7. The solid-state device according to claim 1 , wherein:

the solid-state element is mounted on the power receiving/feeding portion through a conductive adhesive.

8. The solid-state device according to claim 1 , wherein:

the solid-state element is mounted on the power receiving/feeding portion through an eutectic material.

9. The solid-state device according to claim 1 , wherein:

the solid-state element is mounted on the mounting substrate by fusion-bonding an electrode with the mounting surface to a circuit pattern formed on the mounting substrate.

10. The solid-state device according to claim 1 , wherein:

the inorganic sealing portion comprises a thermal expansion coefficient equal to or up to 4 times that of the solid-state element.

11. The solid-state device according to claim 1 , wherein the solid-state element comprises an optical element, and

wherein the inorganic sealing material comprises a light-transmitting material.

12. The solid-state device according to claim 11 , wherein:

the optical element comprises a light-emitting element.

13. The solid-state device according to claim 12 , wherein:

the light-emitting element comprises an optical catalytic portion formed on a surface of the inorganic sealing portion.

14. The solid-state device according to claim 13 , wherein the optical catalytic portion comprises a light-transmitting protective layer for protecting the surface of the inorganic sealing portion, and

wherein the surface of the protective layer comprises an optical catalytic layer comprised of TiO 2 .

15. The solid-state device according to claim 12 , wherein the light-emitting element comprises a GaN-based light-emitting element,

wherein the GaN-based light-emitting element comprises:

a sapphire substrate; and

a GaN-based semiconductor layer formed on the sapphire substrate.

16. The solid-state device according to claim 11 , wherein:

the optical element comprises a light-receiving element.

17. The solid-state device according to claim 2 , wherein:

the solid-state element is mounted on the mounting substrate to prevent the penetration of the inorganic sealing material between the solid-state element and the conductive pattern.

18. The solid state device according to claim 2 , wherein the conductive pattern comprises one of tungsten, nickel, and gold.

19. The solid state device according to claim 2 , wherein joined surfaces of a p-electrode and an n-electrode of the solid-state element are electrically connected to the conductive pattern on substantially the same plane.

20. A method of manufacturing a solid state device, comprising:

forming a circuit pattern layout on a surface of a mounting substrate having via holes;

forming the circuit pattern layout on the mounting substrate;

plating the circuit pattern layout to form a circuit pattern;

forming a conductive adhesive on a surface of the circuit pattern;

forming a solid-state element on the circuit pattern such that a mounting surface of a p-electrode and n-electrode of the solid state element are on substantially the same plane relative to the surface of the circuit pattern; and

forming an inorganic sealing portion by pressure-bonding a low melting point glass to the mounting substrate in a high-viscosity condition of 10 4 -10 9 poises.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 10, 2005
From: SUEHIRO, YOSHINOBU; ICHIKAWA, MASAYOSHI; WADA, SATOSHI; TASUMI, KOJI
To: TOYODA GOSEI CO., LTD.
Reel/Frame 017003/0610 →
Priority Claims (2)
JP 2004-263097 · Sep 9, 2004 · national
JP 2004-316007 · Oct 29, 2004 · national
Continuity (1)
Related Publication 20060049335A1 · Mar 9, 2006