Semiconductor device and manufacturing method therefor
View Patent ↗An active layer of an NTFT includes a channel forming region, at least a first impurity region, at least a second impurity region and at least a third impurity region therein. Concentrations of an impurity in each of the first, second and third impurity regions increase as distances from the channel forming region become longer. The first impurity region is formed to be overlapped with a side wall. A gate overlapping structure can be realized with the side wall functioning as an electrode.
1. A light emitting device comprising:
a substrate;
a thin film transistor over the substrate;
an interlayer insulating film over the thin film transistor;
a first electrode over the interlayer insulating film, the first electrode electrically connected to the thin film transistor through a contact hole formed in the interlayer insulating film; and
a light emitting layer disposed adjacent to a side edge of a bank, over the first electrode,
wherein the first electrode has a depression on a surface thereof due to the contact hole,
wherein the light emitting layer has a flattened upper surface over the depression,
wherein a portion of the light emitting layer resides in the contact hole, over the first electrode, and
wherein the light emitting layer does not extend to an upper surface of the bank.
2. The light emitting device according to claim 1 , wherein the light emitting device is incorporated into an electronic equipment selected from the group consisting of a video camera, a digital camera, a projector, a television, a head mount display, a car navigation system, an image reproduction device, a portable telephone, a computer, a goggle type display, and an electronic game equipment.
3. The light emitting device according to claim 1 , wherein an LDD region is formed in a semiconductor film of the thin film transistor.
4. The light emitting device according to claim 1 , wherein an LDD region is formed in a semiconductor film of the thin film transistor, and
wherein the LDD region is not overlapped with a gate electrode of the thin film transistor.
5. The light emitting device according to claim 1 , wherein the light emitting layer includes a high molecular material.