IP Library › Granted Patent US 7,443,758
Granted Patent B2
US 7,443,758 · App. 11/361,579 · Granted Oct 28, 2008

Circuit and method of generating high voltage for programming operation of flash memory device

Assignee: Samsung Electronics Co., Ltd.
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Quick Facts
Patent No.
US 7,443,758
App. No.
11/361,579
Granted
Oct 28, 2008
Kind
B2
Abstract

Provided is a high voltage generator for a flash memory device including a voltage pumping unit configured to generate a high voltage in response to a pumping clock signal, a transistor having a gate coupled to the high voltage and a source coupled to a program voltage, a voltage distributor coupled to the drain of the transistor, the voltage distributor configured to generate a distributor voltage, and a pumping clock controller configured to compare the distributor voltage to a reference voltage and to generate the pumping clock signal when the high voltage is less than a voltage substantially equal to the program voltage plus the threshold voltage of the transistor.

Claims (26)

1. A high voltage generator for a flash memory device comprising:

a voltage pumping unit configured to generate a high voltage in response to a pumping clock signal;

a transistor having a gate coupled to the high voltage and a source coupled to a program voltage;

a voltage distributor coupled to the drain of the transistor, the voltage distributor configured to generate a distributor voltage; and

a pumping clock controller configured to compare the distributor voltage to a reference voltage and to generate the pumping clock signal when the high voltage is less than a voltage substantially equal to the program voltage plus the threshold voltage of the transistor.

2. The high voltage generator of claim 1 , wherein the transistor is a high voltage transistor.

3. The high voltage generator of claim 1 , wherein the voltage distributor is further configured to set the distributor voltage at a level substantially equal to the reference voltage when the voltage on the drain of the transistor is substantially equal to the program voltage.

4. The high voltage generator of claim 1 , wherein:

the transistor further comprises a feedback transistor; and

the voltage distributor further comprises:

a first resistor having one end coupled to the drain of the feedback transistor;

a distributor transistor having a source coupled to the other end of the first resistor, and a gate coupled to a power supply; and

a second resistor coupled between a drain of the distributor transistor and a ground.

5. The high voltage generator of claim 1 , wherein the pumping clock controller comprises:

a comparator configured to compare the distributor voltage to the reference voltage; and

a NAND gate configured to receive the output signal of the comparator, a control signal instructing the high voltage to be generated, and a clock signal, and configured to generate the pumping clock signal.

6. The high voltage generator of claim 1 , further comprising a high voltage discharging unit configured to discharge the high voltage to a power supply in response to an enable signal instructing the high voltage to be discharged.

7. The high voltage generator of claim 6 , wherein the high voltage discharging unit comprises:

a PMOS transistor having a source coupled to the power supply voltage and a gate coupled to the enable signal;

a first NMOS transistor having a source coupled to the drain of the PMOS transistor and a gate coupled to an inverted version of the enable signal; and

a second NMOS transistor having a source coupled to the drain of the first NMOS transistor, a gate coupled to the power supply voltage, and a drain coupled to the high voltage.

8. A high voltage generator for a flash memory device comprising:

a voltage pumping unit configured to generate a high voltage in response to a pumping clock signal;

a transistor having a gate coupled to the high voltage and a source coupled to a read voltage;

a voltage distributor coupled to the drain of the transistor, the voltage distributor configured to generate a distributor voltage; and

a pumping clock controller configured to compare the distributor voltage to a reference voltage and to generate the pumping clock signal when the high voltage is less than a voltage substantially equal to the program voltage plus the threshold voltage of the transistor.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 16, 2006
From: HA, HYUN-CHUL; KIM, JONG-HWA
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 017625/0084 →
Priority Claims (1)
KR 10-2005-0052010 · Jun 16, 2005 · national
Continuity (1)
Related Publication 20060285388A1 · Dec 21, 2006