IP Library Granted Patent US 7,462,869
Granted Patent B2
US 7,462,869 · App. 11/685,375 · Granted Dec 9, 2008

Semiconductor light emitting device and semiconductor light emitting apparatus

Assignee: Kabushiki Kaisha Toshiba
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Quick Facts
Patent No.
US 7,462,869
App. No.
11/685,375
Granted
Dec 9, 2008
Kind
B2
Abstract

A first semiconductor light emitting device includes: a transparent substrate; a light emitting layer; and a roughened region. The transparent substrate has a first major surface and a second major surface, and is translucent to light in a first wavelength band. The light emitting layer is selectively provided in a first portion on the first major surface of the transparent substrate and configured to emit light in the first wavelength band. The roughened region is provided in a second portion different from the first portion on the first major surface. A second semiconductor light emitting device includes: a transparent substrate; a light emitting layer; a first electrode; and at least one groove. The groove is provided on the second major surface of the transparent substrate and extends from a first side face to a second side face opposing the first side face of the transparent substrate.

Claims (17)

1. A semiconductor light emitting device comprising:

a transparent substrate having a first major surface and a second major surface, and being translucent to light in a first wavelength band;

a light emitting layer selectively provided in a first portion on the first major surface of the transparent substrate and configured to emit light in the first wavelength band;

a first electrode provided on the light emitting layer; and

a roughened region provided in a second portion different from the first portion on the first major surface, wherein

the first portion includes a center portion on the first major surface and a periphery portion distantly surrounding the center portion, part of the periphery portion being connected to the center portion,

the second portion is a portion located between the center portion and the periphery portion,

the light emitting layer being not provided in the second portion, and

the first electrode is provided on both of the center portion and the periphery portion of the light emitting layer.

2. A semiconductor light emitting device according to claim 1 , wherein irregularities constituting the roughened region have an average bottom length of 0.1to 3micrometers.

3. A semiconductor light emitting device according to claim 1 , wherein irregularities constituting the roughened region have an average height of 0.05 to 1.5 micrometers.

4. A semiconductor light emitting device according to claim 1 , wherein the first portion has an area of 0.6 to 0.9 times the area of the first major surface.

5. A semiconductor light emitting device according to claim 1 , wherein

the transparent substrate is made of GaP, and

the light emitting layer is made of InGaAlP-based compound semiconductor.

6. A semiconductor light emitting device according to claim 1 , wherein irregularities constituting the roughened region have an average bottom length of 0.5to 2 micrometers.

7. A semiconductor light emitting device according to claim 1 , wherein a part of the first electrode which is provided on the center portion of the light emitting layer and a part of the first electrode which is provided on the periphery portion of the light emitting layer are connected via wiring.

Priority Claims (1)
JP 2004-146231 · May 17, 2004 · national
Continuity (2)
Division 1110274400 · Apr 11, 2005
Related Publication 20070145385A1 · Jun 28, 2007