IP Library Granted Patent US 7,473,578
Granted Patent B2
US 7,473,578 · App. 11/761,111 · Granted Jan 6, 2009

Encapsulation for particle entrapment

Assignee: Texas Instruments Incorporated
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Quick Facts
Patent No.
US 7,473,578
App. No.
11/761,111
Granted
Jan 6, 2009
Kind
B2
Abstract

A packaged micromechanical device ( 100 ) having a blocking material ( 116 ) encapsulating debris-generating regions thereof. The blocking material ( 116 ) prevents the generation of debris that could interfere with the operation of the micromechanical device ( 100 ). Debris-generating regions of the device ( 100 ), including debris-creating sidewalls and any debris-harboring cavities, as well as electrical connections ( 108 ) linking the device ( 100 ) to the package substrate ( 102 ) are encapsulated by the blocking material ( 116 ). The blocking material ( 116 ) avoids contact with any debris-intolerant regions ( 118 ) of the device ( 100 ). A package lid ( 122 ), which is glass in the case of many DMD packages, seals the device ( 100 ) in package cavity ( 120 ).

Claims (21)

1. A method of protecting debris-intolerant micromechanical devices, said method comprising:

providing a device having at least one debris-generating region, and at least one debris-intolerant region;

encapsulating at least one of said debris-generating regions and at least a portion of at least one of said debris-intolerant regions with a blocking material;

removing said blocking material from said at least one of said debris-intolerant regions; and

attaching a package lid to said package substrate, to enclose said device and said blocking material.

2. The method of claim 1 , said attaching a device step further comprising:

attaching a device to a substrate, said device having at least one said debris-generating region comprising a sidewall.

3. The method of claim 1 , said encapsulating step further comprising:

encapsulating at least one of said debris-generating regions using an adhesive blocking material.

4. The method of claim 1 , said encapsulating step further comprising:

encapsulating at least one of said debris-generating regions using a photo-curable adhesive blocking material.

5. The method of claim 1 , said encapsulating step further comprising:

encapsulating at least one of said debris-generating regions using an adhesive blocking material that remains tacky to perform a gettering function.

6. The method of claim 1 , further comprising the step of:

electrically connecting at least one bond pad on said substrate with at least one bond pad on said device using an electrical connection.

7. The method of claim 6 , said encapsulating step comprising:

encapsulating at least one of said debris-generating regions and said electrical connection.

8. The method of claim 6 , said encapsulating step comprising:

electrically connecting at least one bond pad on said substrate with at least one bond pad on said device using a bond wire.

9. The method of claim 6 , said encapsulating step comprising:

encapsulating at least one of said debris-generating regions and said bond wires.

Continuity (4)
Division 1095508300 · Sep 30, 2004
Division 0970546600 · Nov 3, 2000
Provisional Application 6016386200 · Nov 5, 1999
Related Publication 20070254403A1 · Nov 1, 2007