IP Library › Granted Patent US 7,476,816
Granted Patent B2
US 7,476,816 · App. 11/401,160 · Granted Jan 13, 2009

Current sensor

Assignee: Allegro Microsystems, Inc.
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,476,816
App. No.
11/401,160
Granted
Jan 13, 2009
Kind
B2
Abstract

An integrated circuit current sensor includes a lead frame having at least two leads coupled to provide a current conductor portion, and a substrate having a first surface in which is disposed one or more magnetic field sensing elements, with the first surface being proximate to the current conductor portion and a second surface distal from the current conductor portion. In one particular embodiment, the substrate is disposed having the first surface of the substrate above the current conductor portion and the second surface of the substrate above the first surface. In this particular embodiment, the substrate is oriented upside-down in the integrated circuit in a flip-chap arrangement. The lead frame also includes a shunt conductor portion formed as a coupling of the at least two leads.

Claims (45)

1. A current sensor, comprising:

a lead frame comprising:

a plurality of leads;

a first current conductor portion comprising at least two of the plurality of leads, wherein the first current conductor portion is adapted to carry a first portion of a current; and

a shunt conductor portion comprising a coupling of the at least two of the plurality of leads, wherein the shunt conductor portion is adapted to carry a second portion of the current;

a substrate having first and second opposing surfaces, the first surface proximate to the first current conductor portion and the second surface distal from the first current conductor portion; and

one or more magnetic field transducers disposed on the first surface of said substrate.

2. The current sensor of claim 1 , wherein said shunt conductor portion has a size and a shape selected to provide a selected resistance, which is selected to carry the second portion of the current.

3. The current sensor of claim 1 , wherein each one of the leads has a bend in a direction selected to result in each one of the leads being closer to the first surface of the substrate than to the second surface of the substrate throughout a length of the lead.

4. The current sensor of claim 1 , wherein the first current conductor portion comprises another coupling of the at least two of the plurality of leads and wherein said one or more magnetic field transducers are disposed proximate to the first current conductor portion.

5. The current sensor of claim 1 , further comprising a second current conductor portion deposited on the first surface of the substrate, disposed proximate to the one or more magnetic field transducers, and coupled to the first current conductor portion.

6. The current sensor of claim 1 , further comprising an insulating layer disposed between the first surface of the substrate and the first current conductor portion.

7. The current sensor of claim 1 , further comprising a flux shield disposed generally between the shunt conductor portion and the one or more magnetic field transducers.

8. The current sensor of claim 1 , further comprising a flux concentrator disposed on the shunt conductor portion.

9. The current sensor of claim 1 , wherein said substrate has at least one bonding pad coupled to a corresponding one of the plurality of leads with a bond wire.

10. The current sensor of claim 1 , wherein said substrate is coupled to said lead frame with a selected one of a solder ball, a gold bump, a eutectic and high lead solder bump, a no-lead solder bump, a gold stud bump, a polymeric conductive bump, an anisotropic conductive paste, or a conductive film coupled to a corresponding one of the plurality of leads.

11. The current sensor of claim 1 , wherein at least a part of the first current conductor portion has a T-shaped cross section, the T-shaped cross section taken through a thickness direction of the first current conductor portion, the T-shaped cross section resulting in an increased magnetic field proximate to the first current conductor portion, and therefore, proximate to said one or more magnetic field transducers.

12. The current sensor of claim 1 , wherein at least a part of the first current conductor portion has a thinned rectangular cross section having a minimum dimension less than a thickness of other portions of said lead frame, the thinned rectangular cross section taken through a thickness direction of the first current conductor portion, the thinned rectangular cross section resulting in an increased magnetic field proximate to the first current conductor portion, and therefore, proximate to said one or more magnetic field transducers.

13. The current sensor of claim 1 , further comprising at least one amplifier disposed on said substrate.

14. The current sensor of claim 1 , wherein the substrate and the lead frame are relatively disposed in a flip-chip arrangement resulting in said first current conductor portion being proximate to said one or more magnetic field transducers, and further resulting in an increased sensitivity of the integrated circuit to a magnetic field.

15. A current sensor, comprising:

a lead frame having a plurality of leads;

a current conductor portion comprising at least two of the plurality of leads, wherein the first-current conductor portion is adapted to carry a first portion of a current;

a shunt conductor portion comprising a coupling of the at least two of the plurality of leads, wherein the shunt conductor portion is adapted to carry a second portion of the current;

a substrate having first and second opposing surfaces, the first surface proximate to said current conductor portion and the second surface distal from said current conductor portion; and

one or more magnetic field transducers disposed on the first surface of said substrate, wherein the substrate and the lead frame are relatively disposed in a flip-chip arrangement resulting in the current conductor portion being proximate to said one or more magnetic field transducers, and further resulting in an increased sensitivity of the integrated circuit to a magnetic field.

16. The current sensor of claim 15 , wherein said substrate is coupled to said lead frame with a selected one of a solder ball, a gold bump, a eutectic and high lead solder bump, a no-lead solder bump, a gold stud bump, a polymeric conductive bump, an anisotropic conductive paste, or a conductive film coupled to a corresponding one of the plurality of leads.

17. The current sensor of claim 15 , wherein each one of the leads has a bend in a direction selected to result in each one of the leads being closer to the first surface of the substrate than to the second surface of the substrate throughout a length of the lead.

18. A current sensor, comprising:

a lead frame having a plurality of leads;

a current conductor portion comprising at least two of the plurality of leads, wherein the current conductor portion is adapted to carry a first portion of a current;

a shunt conductor portion comprising a coupling of the at least two of the plurality of leads, wherein at least one of the current conductor portion or the shunt conductor portion is formed as a conductive clip coupled to the at least two of the plurality of leads, and wherein the shunt conductor portion is adapted to carry a second portion of the current;

a substrate having first and second opposing surfaces, the first surface proximate to said current conductor portion and the second surface distal from said current conductor portion; and

one or more magnetic field transducers disposed on the first surface of said substrate.

19. The current sensor of claim 18 , wherein said substrate is disposed having the first surface of said substrate above said conductive clip and the second surface of said substrate above the first surface.

20. The current sensor of claim 18 , wherein said substrate is disposed having the first surface of said substrate below said conductive clip and the second surface below the first surface.

21. A current sensor, comprising:

a lead frame having a plurality of leads;

a current conductor portion comprising at least two of the plurality of leads, wherein the current conductor portion is adapted to carry a first portion of a current;

a shunt conductor portion comprising a coupling of the at least two of the plurality of leads, wherein the shunt conductor portion is adapted to carry a second portion of the current;

a substrate having first and second opposing surfaces, the first surface proximate to said current conductor portion and the second surface distal from said first current conductor portion;

one or more magnetic field transducers disposed on the first surface of said substrate; and

a flux concentrator disposed on the shunt conductor portion.

22. The current sensor of claim 21 , wherein each one of the leads has a bend in a direction selected to result in each one of the leads being closer to the first surface of the substrate than to the second surface of the substrate throughout a length of the lead.

23. The current sensor of claim 21 , wherein the substrate and the lead frame are relatively disposed in a flip-chip arrangement resulting in the current conductor portion being proximate to said one or more magnetic field transducers, and further resulting in an increased sensitivity of the integrated circuit to a magnetic field.

Assignments (7)
RELEASE OF SECURITY INTEREST IN PATENTS AT REEL 053957/FRAME 0874 Recorded Nov 1, 2023
From: CREDIT SUISSE AG, CAYMAN ISLANDS BRANCH, AS COLLATERAL AGENT
To: ALLEGRO MICROSYSTEMS, LLC
Reel/Frame 065420/0572 →
PATENT SECURITY AGREEMENT Recorded Jun 22, 2023
From: ALLEGRO MICROSYSTEMS, LLC
To: MORGAN STANLEY SENIOR FUNDING, INC., AS THE COLLATERAL AGENT
Reel/Frame 064068/0459 →
RELEASE OF SECURITY INTEREST IN PATENTS (R/F 053957/0620) Recorded Jun 22, 2023
From: MIZUHO BANK, LTD., AS COLLATERAL AGENT
To: ALLEGRO MICROSYSTEMS, LLC
Reel/Frame 064068/0360 →
PATENT SECURITY AGREEMENT Recorded Oct 1, 2020
From: ALLEGRO MICROSYSTEMS, LLC
To: MIZUHO BANK LTD., AS COLLATERAL AGENT
Reel/Frame 053957/0620 →
PATENT SECURITY AGREEMENT Recorded Oct 1, 2020
From: ALLEGRO MICROSYSTEMS, LLC
To: CREDIT SUISSE AG, CAYMAN ISLANDS BRANCH, AS COLLATERAL AGENT
Reel/Frame 053957/0874 →
CONVERSION AND NAME CHANGE Recorded Apr 10, 2013
From: ALLEGRO MICROSYSTEMS, INC.
To: ALLEGRO MICROSYSTEMS, LLC
Reel/Frame 030426/0178 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 10, 2006
From: DOOGUE, MICHAEL C.; MANGTANI, VIJAY; TAYLOR, WILLIAM P.
To: ALLEGRO MICROSYSTEMS, INC.
Reel/Frame 017748/0644 →
Continuity (5)
Continuation In Part 1133660200 · Jan 20, 2006
Continuation In Part 1114497000 · Jun 3, 2005
Continuation In Part 1114025000 · May 27, 2005
Continuation In Part 1064945000 · Aug 26, 2003
Related Publication 20060181263A1 · Aug 17, 2006