IP Library Granted Patent US 7,489,566
Granted Patent B2
US 7,489,566 · App. 11/774,054 · Granted Feb 10, 2009

High voltage generator and related flash memory device

Assignee: Samsung Electronics Co., Ltd.
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Quick Facts
Patent No.
US 7,489,566
App. No.
11/774,054
Granted
Feb 10, 2009
Kind
B2
Abstract

A high voltage generator includes a charge pump generating a high voltage in response to a pumping clock signal, a charge/discharge circuit responsive to the pumping clock signal and charging the high voltage to generate an output voltage, a comparator for comparing the output voltage with a reference voltage to generate a comparison result, and a clock modification circuit adjusting a pumping slope of the charge pump in relation to the comparison result, wherein the clock modification circuit reduces the pumping slope when the high voltage reaches a target voltage level.

Claims (52)

1. A high voltage generator comprising:

a charge pump generating a high voltage in response to a pumping clock signal;

a charge/discharge circuit responsive to the pumping clock signal and charging the high voltage to generate an output voltage;

a comparator for comparing the output voltage with a reference voltage to generate a comparison result; and

a clock modification circuit adjusting a pumping slope of the charge pump in relation to the comparison result, wherein the clock modification circuit reduces the pumping slope when the high voltage reaches a target voltage level.

2. The high voltage generator circuit of claim 1 , wherein the clock modification circuit reduces the pumping slope of the charge pump by at least one of changing a pulse width for the pumping clock signal, adjusting a frequency of the pumping clock signal, or adjusting an amplitude of the pumping clock signal.

3. The high voltage generator circuit of claim 2 , wherein the clock modification circuit reduces the pumping slope of the charge pump in relation to a first and second phase of the pumping clock signal.

4. The high voltage generator circuit of claim 1 , wherein the clock modification circuit comprises:

a first inverter inverting a clock signal;

a control circuit responsive to the comparison result and adjusting the speed with which the clock signal applied to the first inverter is inverted; and

a second inverter inverting the output of the first inverter to generate the pumping clock signal.

5. The high voltage generator circuit of claim 1 , wherein the clock modification circuit reduces the pumping slope by changing a driving capacitance value associated with the charge pump.

6. The high voltage generator circuit of claim 5 , wherein the clock modification circuit comprises:

a plurality of capacitors and a corresponding plurality of switches,

wherein each one of the plurality of capacitors is selectively connected to a corresponding capacitor associated with the charge pump through a switching operation applied to the plurality of switches.

7. The high voltage generator circuit of claim 1 , wherein the charge/discharge circuit comprises:

a first charge/discharge circuit charging the high voltage received from the charge pump in response to a first phase of the pumping clock signal and generating the output voltage in response to a second phase of the pumping clock signal; and

a second charge/discharge circuit supplying the output voltage from the first charge/discharge circuit to the comparator in response to the second phase of the pumping clock signal.

8. The high voltage generator circuit of claim 7 , wherein the first charge/discharge circuit comprises:

a first high voltage switch outputting the high voltage in response to the first phase of the pumping clock signal;

a first capacitor charging the high voltage received from the first high voltage switch; and

a second high voltage switch outputting a voltage charged in the first capacitor as the output voltage in response to the second phase of the pumping clock signal.

9. The high voltage generator circuit of claim 8 , wherein the second charge/discharge circuit includes:

a second capacitor outputting a voltage from the second high voltage switch to the comparator; and

a discharge switch discharging a charged voltage in the second capacitor to ground in response to the first phase of the pumping clock signal, during a charging period of the first capacitor.

10. A flash memory device comprising:

a memory cell array having a plurality of memory cells arranged in word lines and bit lines; and

a high voltage generator circuit generating a high voltage supplied to a selected word line and comprising:

a charge pump generating a high voltage in response to a pumping clock signal;

a charge/discharge circuit responsive to the pumping clock signal and charging the high voltage to generate an output voltage;

a comparator for comparing the output voltage with a reference voltage to generate a comparison result; and

a clock modification circuit adjusting a pumping slope of the charge pump in relation to the comparison result, wherein the clock modification circuit reduces the pumping slope when the high voltage reaches a target voltage level.

11. The flash memory device of claim 10 , wherein the clock modification circuit reduces the pumping slope of the charge pump by at least one of changing a pulse width for the pumping clock signal, adjusting a frequency of the pumping clock signal, or adjusting an amplitude of the pumping clock signal.

12. The flash memory device of claim 11 , wherein the clock modification circuit reduces the pumping slope of the charge pump in relation to a first and second phase of the pumping clock signal.

13. The flash memory device of claim 10 , wherein the clock modification circuit comprises:

a first inverter inverting a clock signal;

a control circuit responsive to the comparison result and adjusting the speed with which the clock signal applied to the first inverter is inverted; and

a second inverter inverting the output of the first inverter to generate the pumping clock signal.

14. The flash memory device of claim 10 , wherein the clock modification circuit reduces the pumping slope by changing a driving capacitance value associated with the charge pump.

15. The flash memory device of claim 14 , wherein the clock modification circuit comprises:

a plurality of capacitors and a corresponding plurality of switches,

wherein each one of the plurality of capacitors is selectively connected to a corresponding capacitor associated with the charge pump through a switching operation applied to the plurality of switches.

16. The flash memory device of claim 10 , wherein the charge/discharge circuit comprises:

a first charge/discharge circuit charging the high voltage received from the charge pump in response to a first phase of the pumping clock signal and generating the output voltage in response to a second phase of the pumping clock signal; and

a second charge/discharge circuit supplying the output voltage from the first charge/discharge circuit to the comparator in response to the second phase of the pumping clock signal.

17. The flash memory device of claim 16 , wherein the first charge/discharge circuit comprises:

a first high voltage switch outputting the high voltage in response to the first phase of the pumping clock signal;

a first capacitor charging the high voltage received from the first high voltage switch; and

a second high voltage switch outputting a voltage charged in the first capacitor as the output voltage in response to the second phase of the pumping clock signal.

18. The flash memory device of claim 17 , wherein the second charge/discharge circuit includes:

a second capacitor outputting a voltage from the second high voltage switch to the comparator; and

a discharge switch discharging a charged voltage in the second capacitor to ground in response to the first phase of the pumping clock signal, during a charging period of the first capacitor.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 6, 2007
From: KANG, YONG HOON
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 019527/0008 →
Priority Claims (1)
KR 10-2006-0063941 · Jul 7, 2006 · national
Continuity (1)
Related Publication 20080031078A1 · Feb 7, 2008