IP Library › Granted Patent US 7,505,299
Granted Patent B2
US 7,505,299 · App. 11/976,531 · Granted Mar 17, 2009

Semiconductor memory device

Assignees: Hitachi Ltd.; Elpida Memory, Inc.
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,505,299
App. No.
11/976,531
Granted
Mar 17, 2009
Kind
B2
Abstract

A semiconductor memory device that can achieve high-speed operation or that is highly integrated and simultaneously can achieve high-speed operation is provided. Transistors are disposed on both sides of diffusion layer regions to which capacitor for storing information is connected and other diffusion layer region of each transistor is connected to the same bit line. When access to a memory cell is made, two transistors are activated and the information is read. When writing operation to the memory cell is carried out, two transistors are used and electric charges are written to the capacitor.

Claims (26)

1. A semiconductor memory device comprising:

a first bit line extending in a first direction;

an address buffer; and

a plurality of first memory cells each including first and second transistors disposed in the first direction and a first capacitor element connected to a first node shared with the first and second transistors, a second node of the first transistor and a second node of the second transistor being connected to the first bit line independently,

wherein at least one of the plurality of memory cell is selected according to a row address and a column address that are inputted to the address buffer simultaneously.

2. The semiconductor memory device according to claim 1 , further comprising:

a plurality of first word lines extending in a second direction across the first direction and each connected to a corresponding gate of the first transistor; and

a plurality of second word lines extending in the second direction and each connected to a corresponding gate of the second transistor.

3. The semiconductor memory device according to claim 2 ,

wherein the first word line and the second word line are simultaneously activated.

4. The semiconductor memory device according to claim 1 , further comprising:

a second bit line extending in the first direction;

a first sense amplifier connected between the first bit line and the second bit line; and

a plurality of second memory cells each including third and fourth transistors disposed in the first direction and a second capacitor element connected to a third node shared with the third and fourth transistors, a fourth node of the third transistor and a fourth node of the fourth transistor being connected to the second bit line independently.

5. The semiconductor memory device according to claim 4 , further comprising:

plurality of first word lines extending in a second direction across the first direction and each connected to a corresponding gate of the first transistor and a corresponding gate of the third transistor; and

a plurality of second word lines extending in the second direction and each connected to a corresponding gate of the second transistor and a corresponding gate of the fourth transistor.

6. The semiconductor memory device according to claim 1 , further comprising:

a plurality of bit lines including the first bit line and extending in the first direction;

a plurality of cross-couple circuit each connected between corresponding two of the plurality of bit lines;

a plurality of sense amplifier drivers each including a transistor whose source-drain path is connected between a first potential and a common source node of corresponding one of the plurality of cross-couple circuits; and

a plurality of write gates each connected to corresponding two of the plurality of bit lines, wherein the transistors of the plurality of sense amplifier drivers are off status when at least one of the plurality of write gates starts to supply a write data to corresponding bit lines.

7. The semiconductor memory device according to claim 1 , further comprising:

a second bit line extending in the first direction;

a plurality of second memory cells each including third and fourth transistors disposed in the first direction and a second capacitor element connected to a third node shared with the third and fourth transistors, a fourth node of the third transistor and a fourth node of the fourth transistor being connected to the second bit line independently;

a differential amplifier including a fifth transistor whose gate is connected to the first bit line and a sixth transistor whose gate is connected to the second bit line.

Assignments (6)
CHANGE OF NAME Recorded Aug 24, 2016
From: PS5 LUXCO S.A.R.L.
To: LONGITUDE SEMICONDUCTOR S.A.R.L.
Reel/Frame 039793/0880 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 24, 2016
From: PS4 LUXCO S.A.R.L.
To: PS5 LUXCO S.A.R.L.
Reel/Frame 039818/0506 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 15, 2014
From: ELPIDA MEMORY, INC.
To: PS4 LUXCO S.A.R.L.
Reel/Frame 032899/0588 →
SECURITY AGREEMENT Recorded Jul 29, 2013
From: PS4 LUXCO S.A.R.L.
To: ELPIDA MEMORY INC.
Reel/Frame 032414/0261 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 20, 2010
From: HITACHI, LTD.
To: ELPIDA MEMORY, INC.
Reel/Frame 024710/0428 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 25, 2007
From: TAKEMURA, RIICHIRO; AKIYAMA, SATORU; HANZAWA, SATORU; SEKIGUCHI, TOMONORI; KAJIGAYA, KAZUHIKO
To: HITACHI, LTD.; ELPIDA MEMORY, INC.
Reel/Frame 020065/0580 →
Priority Claims (1)
JP 2004-154753 · May 25, 2004 · national
Continuity (2)
Continuation 1113447600 · May 23, 2005
Related Publication 20080055958A1 · Mar 6, 2008