IP Library Granted Patent US 7,561,263
Granted Patent B2
US 7,561,263 · App. 11/644,275 · Granted Jul 14, 2009

Apparatus for illuminating and inspecting a surface

Assignee: Vistec Semiconductor Systems GmbH
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Quick Facts
Patent No.
US 7,561,263
App. No.
11/644,275
Granted
Jul 14, 2009
Kind
B2
Abstract

The present invention relates to an apparatus for illuminating and inspecting a specular surface, comprising a light source, a collector optics for collecting the light from the light source, a homogenizing optics for transmitting the light from the collector optics having a first micro-lens array downstream of the collector optics, and a second micro-lens array downstream of the first micro-lens array, a Fourier optics for transmitting the light from the homogenizing optics onto the specular surface, an objective optics, and a detector for receiving an image, wherein the collector optics and the first micro-lens array project the light source onto the second micro-lens array and wherein the second micro-lens array and the Fourier optics project the first micro-lens array onto the specular surface, and wherein the objective optics projects the specular surface onto the detector.

Claims (29)

1. An apparatus for inspecting a specular surface, comprising:

a light source;

a collector optics for collecting the light from the light source;

a homogenizing optics for transmitting the light from the collector optics having a first micro-lens array downstream of the collector optics;

a second micro-lens array downstream of the first micro-lens array;

a Fourier optics for transmitting the light from the homogenizing optics onto the specular surface;

an objective optics;

a detector for recording an image; and

wherein the collector optics and the first micro-lens array project the light source onto the second micro-lens array, and wherein the second micro-lens array and the Fourier optics project the first micro-lens array onto the specular surface, and wherein the objective optics projects the specular surface onto the detector, the Fourier optics is arranged at a distance greater than its focal length downstream of the homogenizing optics and in that the objective optics is not telecentric on the side of an object.

2. The apparatus according to claim 1 , wherein the Fourier optics projects the second micro-lens array onto the input pupil of the objective optics via the specular surface.

3. The apparatus according to claim 1 , wherein the objective optics projects the surface at a reduction of 1:6.5.

4. An apparatus for illuminating a surface, comprising:

a light source;

a collector optics for collecting the light from the light source;

a homogenizing optics for transmitting the light from the collector optics having a first micro-lens array downstream of the collector optics;

a second micro-lens array downstream of the first micro-lens array;

a Fourier optics for transmitting the light from the homogenizing optics onto the surface; and,

wherein the collector optics and the first micro-lens array project the light source onto the second micro-lens array, and wherein the second micro-lens array and the Fourier optics project the first micro-lens array onto the surface, wherein the first micro-lens array is arranged at a distance of the focal length of the collector optics downstream of the collector optics and wherein the second micro-lens array is arranged at a distance of the focal length of the micro lenses downstream of the first micro-lens array in parallel.

5. The apparatus according to claim 4 , wherein the collector optics is arranged at a distance of its focal length from the light source.

6. The apparatus according to claim 4 , wherein the focal length of the micro lenses of the micro-lens array is between 1 mm and 4 mm.

7. The apparatus according to claim 4 , wherein the distance of the micro lenses of the micro-lens array is between 1/20 and ⅕, of their focal lengths.

8. The apparatus according to claim 4 , wherein the second micro-lens array is equal to the first micro-lens array.

9. The apparatus according to claim 4 , wherein the second micro-lens array is arranged with its lenses parallel and not offset with respect to the lenses of the first micro-lens array.

10. The apparatus according to claim 4 , wherein the first micro-lens array and the second micro-lens array are configured as an integral double array having the lens curvatures face outside.

11. The apparatus according to claim 4 , wherein the first micro-lens array and the second micro-lens array are provided with cushion-shaped lenses.

12. The apparatus according to claim 4 , wherein the first micro-lens array and the second micro-lens array are configured with cylindrical lenses and have two crossed micro-lens pairs, wherein the first micro-lens pair is of a first and a second micro-lens array with parallel and non-offset associated cylindrical lenses, and the second micro-lens pair is of a third and fourth micro-lens array with parallel non-offset associated cylindrical lenses.

13. The apparatus according to claim 4 , wherein the Fourier optics is at a distance of its focal length upstream of the surface.

14. The apparatus according to claim 4 , wherein the Fourier optics consists of two identical plano-convex lenses having their curvatures face each other.

15. The apparatus according to claim 4 , wherein the micro-lens array and the Fourier optics project a light dot of about 40 mm by 40 mm.

Assignments (2)
CHANGE OF ADDRESS INCL. ENGLISH TRANSLATION Recorded Jun 1, 2009
From: VISTEC SEMICONDUCTOR SYSTEMS GMBH
To: VISTEC SEMICONDUCTOR SYSTEMS GMBH
Reel/Frame 022775/0607 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 22, 2006
From: DANNER, LAMBERT; HEIDEN, MICHAEL; BUETTNER, ALEXANDER
To: VISTEC SEMICONDUCTOR SYSTEMS GMBH
Reel/Frame 018745/0019 →
Priority Claims (1)
DE 10 2006 001 435 · Jan 10, 2006 · national
Continuity (1)
Related Publication 20070159700A1 · Jul 12, 2007