Carrier for holding test samples
A carrier for holding up to N test sample devices as they are moved through a sample testing instrument. Each of the test sample devices are held in a receiving structure such as a slot in the carrier. The carrier also includes N optical interrupt positioning features, each placed in registry with one of the receiving structures (and thereby in registry with the test sample device). The instrument includes fixed optical interrupt sensors for detecting the position of the positioning feature as the carrier is moved through the instrument. In the illustrated embodiment, the position features comprise voids formed in a rib on the lower surface of the carrier. The optical interrupt sensors are positioned below the path the carrier travels over, whereby as the carrier moves past the sensor the voids, and hence position of the test sample devices, are detected.
1. In a carrier for movement of test sample devices through an automated sample testing instrument, said carrier having N receiving structures for receiving N test sample devices and N vessel receiving structures for receiving N vessels containing a fluid test sample, where N is an integer greater than one, each receiving structure for receiving a test sample device, the improvement comprising:
providing N optical interrupt positioning features formed in said carrier, each of said positioning features placed in registry with one of said receiving structures, whereby detection of one of said positioning features by a fixed optical interrupt sensor in said sample testing instrument detects a position of a test sample device placed in the receiving structure corresponding to said positioning feature;
wherein said carrier is moved through said instrument in a direction along a path of movement having a longitudinal axis, said test sample devices are oriented in said carrier in a direction orthogonal to said longitudinal axis, and wherein said positioning features are arranged on said carrier in a direction parallel to the direction of movement of said carrier in said instrument; and
wherein said carrier comprises an upper surface and a lower surface and first and second side regions, and wherein said positioning features comprise voids formed in a rib projecting from said lower surface, said rib placed between said first and second side regions, wherein said fixed optical interrupt sensor is positioned in said instrument along the path of movement of said carrier wherein said rib passes over said optical interrupt sensor.
2. The improvement of claim 1 , wherein said carrier further comprises a first portion having a handle and an opposite second portion having a flat panel, said panel for receiving a bar code associated with said carrier.
3. The improvement of claim 1 , wherein said N vessel receiving structures comprise N test tube receiving structures placed in registry with said N test device receiving structures.
4. The improvement of claim 1 , wherein said carrier further comprises alphanumerical indicia for said receiving structures.
5. The improvement of claim 4 , wherein said alphanumerical indicia comprise numerals provided on said carrier 1 . . . N in registry with said receiving structures.
6. The improvement of claim 1 , wherein said test sample devices comprises multi-well test sample cards.