IP Library Granted Patent US 7,586,091
Granted Patent B2
US 7,586,091 · App. 10/549,587 · Granted Sep 8, 2009

Mass spectrometric system and mass spectrometry

Assignee: NEC Corporation
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Quick Facts
Patent No.
US 7,586,091
App. No.
10/549,587
Granted
Sep 8, 2009
Kind
B2
Abstract

After a sample is previously separated into plural components in a channel formed in a microchip ( 353 ), the channel is irradiated along a separation direction with a laser beam from a laser oscillator ( 361 ) to sequentially ionize each fraction separated in the channel. The ionized fraction is detected by a mass spectrometry unit ( 363 ) and analyzed by an analytical result analyzing unit ( 371 ). The analytical result is stored in a memory ( 369 ) while associated with position information in a driver control unit ( 367 ) and information on laser beam irradiation condition in a laser control unit ( 373 ), and the analytical result is imaged by an imaging unit ( 375 ). The imaged analytical result is displayed on a display ( 377 ).

Claims (15)

1. A mass spectrometry system comprising:

a microchip which has a channel through which a sample passes and a sample separation area being provided in said channel;

a light irradiation unit irradiating with a laser beam while moving a light irradiation position along said sample separation area; and

an analytical unit analyzing a fragment of said sample to obtain mass spectrometric data, said fragment of said sample being generated by a light irradiation,

wherein said channel is provided on a surface of a substrate, said sample separation area has a plurality of columnar bodies, and

said sample separation area having said plurality of columnar bodies is irradiated with said laser beam.

2. The mass spectrometry system according to claim 1 , wherein the density of said plurality of columnar bodies is gradually decreased toward a proceeding direction of said sample in said channel.

3. The mass spectrometry system according to claim 1 , wherein the density of said plurality of columnar bodies is gradually increased toward a proceeding direction of said sample in said channel.

4. The mass spectrometry system according to claim 1 , wherein said sample separation area and an adjustment area are alternately formed with respect to a proceeding direction of said sample in said channel, said plurality of columnar bodies being formed less densely in said adjustment area than in said sample separation area.

5. The mass spectrometry system according to claim 1 , wherein a metal layer is provided on a surface of at least one of said columnar bodies.

6. The mass spectrometry system according to claim 1 , wherein at least one of said columnar bodies is made of metal.

7. The mass spectrometry system according to claim 1 , wherein said laser beam is an infrared laser beam or an ultraviolet laser beam.

8. The mass spectrometry system according to claim 1 , wherein said sample separation area includes a plurality of columnar body arrangement portions in which said plurality of columnar bodies are arranged, and a path is provided between said plurality of adjacent columnar body arrangement portions, said sample passing though said path.

9. The mass spectrometry system according to claim 8 , wherein a width of said path is larger than an average interval between said plurality of columnar bodies in said plurality of columnar body arrangement portions.

10. The mass spectrometry system according to claims 8 or 9 , wherein said plurality of columnar body arrangement portions are combined and arranged such that a plane arrangement is to be a substantial rhombus, and said plurality of columnar bodies are arranged such that said plane arrangement of each of said plurality of columnar body arrangement portions is to be a substantial rhombus.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 2, 2009
From: NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
To: NEC CORPORATION
Reel/Frame 022765/0137 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 20, 2006
From: IIDA, KAZUHIRO; BABA, MASAKAZU; IGUCHI, NORIYUKI; SANO, TORU; KAWAURA, HISAO; SAKAMOTO, TOSHITSUGU; HATTORI, WATARU; SOMEYA, HIROKO
To: NEC CORPORARION
Reel/Frame 017351/0319 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 20, 2006
From: TAKAHASHI, KATSUTOSHI
To: NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
Reel/Frame 017351/0356 →
Priority Claims (1)
JP 2003-069793 · Mar 14, 2003 · national
Continuity (1)
Related Publication 20060214101A1 · Sep 28, 2006