Graphical user interface for creation of IBIST tests

1. A graphical user interface (GUI) embodied on a computer readable medium which, when executed on a processor configures a test for a circuit, the circuit having a circuit definition that includes information defining the circuit, a built-in-self-test (BIST) compatible device within the circuit, and a value associated with the BIST compatible device, the GUI comprising:

a GUI object representing the circuit;

a GUI object representing the BIST compatible device; and

a GUI object representing the associated value;

wherein a respective GUI object is configured based on information contained in the circuit definition,

wherein a modification of the circuit definition automatically causes a corresponding modification to the GUI, and

wherein a modification of the respective GUI object automatically causes a modification of the circuit definition and the circuit test configured by the GUI.

2. The GUI of claim 1 , wherein the BIST compatible device is an interconnect built-in self test (IBIST) compatible device.

3. The GUI of claim 1 , wherein the device further comprises a register, and wherein the associated value comprises an address of the register.

4. The GUI of claim 1 , wherein the device further comprises a port, and wherein the associated value comprises a lane number associated with the port.

5. The GUI of claim 1 , further comprising a screen that enables a port of the device.

6. The GUI of claim 1 , further comprising a screen that sets one or more test defaults.

7. The GUI of claim 1 , further comprising a screen that sets one or more test patterns.

8. The GUI of claim 1 , further comprising a screen that customizes the GUI object representing the device.

9. The GUI of claim 8 , wherein global test options are applied to the device.

10. The GUI of claim 1 , further comprising a screen that sets global test options.

11. A method embodied on a computer readable medium which, when executed on a processor configures a test for a circuit which includes a built-in self-test (BIST) compatible device, the BIST compatible device having an associated value, the circuit, the BIST compatible device, and the associated value being defined in a circuit definition, the method comprising:

creating a first graphical user interface (GUI) object representing the circuit;

creating a second GUI object representing the BIST compatible device;

creating a third GUI object representing the associated value;

reconfiguring the test configuration by modifying at least one of the created GUI objects; and

modifying at least one of the created GUI objects by modifying the circuit definition.

12. The method of claim 11 , wherein the device further comprises an interconnect built-in self test (IBIST) compatible device.

13. The method of claim 11 , wherein the device further comprises a register, and wherein the associated value comprises an address of the register.

14. The method of claim 11 , wherein the device further comprises a port, and wherein the associated value comprises a lane number associated with the port.

15. The method of claim 11 , further comprising creating a screen that enables a port of the device.

16. The method of claim 11 , further comprising creating a screen that sets one or more test defaults.

17. The method of claim 11 , further comprising creating a screen that sets one or more test patterns.

18. The method of claim 11 , further comprising creating a screen that customizes the GUI object representing the device.

19. The method of claim 18 , wherein global test options are applied to the device.

20. The method of claim 11 , further comprising creating a screen that sets global test options.

21. A computer program product that configures a test for a circuit, the circuit including a built-in-self-test (BIST) compatible device, the BIST compatible device having an associated value, the circuit, the BIST compatible device, and the associated value being defined in a circuit definition, the computer program product having a computer readable medium storing executable program code which, when executed by a processor, performs a method comprising:

creating a first graphical user interface (GUI) object representing the circuit;

creating a second GUI object representing the BIST compatible device;

creating a third GUI object representing the associated value;

reconfiguring the test configuration by modifying at least one of the created GUI objects; and

modifying at least one of the created GUI objects by modifying the circuit definition.

22. The computer program product of claim 21 , the method further comprising:

creating a screen that enables a port of the device.

23. The computer program product of claim 21 , the method further comprising:

creating a screen that sets one or more test defaults.

24. The computer program product of claim 21 , the method further comprising:

creating a screen that sets one or more test patterns.

25. The computer program product of claim 21 , the method further comprising:

creating a screen that customizes the GUI object representing the device.

26. The computer program product of claim 21 , the method further comprising:

creating a screen that sets global test options.

27. The computer program product of claim 21 , wherein the device is an interconnect built-in self test (IBIST) compatible device.