High speed materials sorting using x-ray fluorescence
A system and process for classifying a piece of material of unknown composition at high speeds, where the system connected to a power supply. The piece is irradiated with first x-rays from an x-ray source, causing the piece to fluoresce x-rays. The fluoresced x-rays are detected with an x-ray detector, and the piece of material is classified from the detected fluoresced x-rays. Detecting and classifying may be cumulatively performed in less than one second. An x-ray fluorescence spectrum of the piece of material may be determined from the detected fluoresced x-rays, and the detection of the fluoresced x-rays may be conditioned such that accurate determination of the x-ray fluorescence spectrum is not significantly compromised, slowed or complicated by extraneous x-rays. The piece of material may be classified by recognizing the spectral pattern of the determined x-ray fluorescence spectrum. The piece of material may be flattened prior to irradiation and detection. The x-ray source may irradiate the first x-rays at a high intensity, and the x-ray source may be an x-ray tube.
1. A high-speed process for classifying a piece of material of unknown composition, the process comprising acts of:
irradiating the piece with x-rays from an x-ray source, causing the piece to fluoresce x-rays;
detecting the fluoresced x-rays with an x-ray detector;
determining an x-ray fluorescence spectrum of the piece of material from the detected fluoresced x-rays, wherein the determined x-ray fluorescence spectrum has a spectral pattern;
recognizing the spectral pattern of the determined x-ray fluorescence spectrum; and
classifying the piece based on the recognition of the spectral pattern,
wherein the acts of detecting, determining, recognizing and classifying are cumulatively performed in less than one second.
2. The process of claim 1 , wherein the piece comprises a metal.
3. The process of claim 2 , wherein the piece is metal.
4. The process of claim 2 , wherein the fluoresced x-rays have energies within an energy range comprising 5 keV-30 keV.
5. The process of claim 4 , wherein detecting the fluoresced x-rays with an x-ray detector comprises detecting fluoresced x-rays having energies within the energy range comprising 5 keV-30 keV.
6. The process of claim 5 , wherein detecting the fluoresced x-rays with an x-ray detector comprises detecting substantially any fluoresced x-rays having energies within an energy range of 5 keV-30 keV.
7. The process of claim 4 , wherein determining an x-ray fluorescence spectrum comprises determining an x-ray fluorescence spectrum of fluoresced x-rays having energies within the energy range comprising 5 keV-30 keV.
8. The process of claim 4 , wherein recognizing the spectral pattern of the determined x-ray fluorescence spectrum comprises identifying a plurality of energy peaks within an energy range of approximately 5 keV-30 keV.
9. The process of claim 8 , wherein classifying the piece based on the recognition of the spectral pattern comprises classifying the piece based, at least in part, on the plurality of energy peaks within the energy range of approximately 5 keV-30 keV.
10. The process of claim 1 , wherein irradiating the piece with x-rays from an x-ray source comprises irradiating the piece through an air gap across which the piece is moved.
11. The process of claim 10 , wherein the air gap is formed between a first end of a first conveyor belt and a second end of a second conveyor belt, and wherein the piece is moved across the air gap by being transferred from the first conveyor belt to the second conveyor belt.
12. The process of claim 11 , wherein the first end is disposed at a first height, the second end is disposed at a second height lower than the first height, and the x-ray source is disposed at a third height lower than the first height.
13. The process of claim 1 , wherein irradiating the piece with x-rays from an x-ray source comprises irradiating the piece through an aperture in a conveyor belt on which the piece is conveyed.
14. The process of claim 1 , wherein the determined x-ray fluorescence spectrum comprises three or more discrete energy levels.
15. The process of claim 1 , wherein recognizing the spectral pattern comprises normalizing energy counts of the x-ray fluorescence spectrum to produce a normalized detected x-ray fluorescence spectrum.
16. The process of claim 15 , wherein recognizing the spectral pattern further comprises comparing the normalized detected x-ray fluorescence spectrum and a reference x-ray fluorescence spectrum.
17. The process of claim 1 , wherein the determined x-ray fluorescence spectrum comprises a plurality of energy peaks.
18. The process of claim 17 , wherein recognizing the spectral pattern of the determined x-ray fluorescence spectrum comprises recognizing at least two of the plurality of energy peaks.
19. The process of claim 18 , wherein classifying the piece based on the recognition of the spectral pattern comprises classifying the piece based, at least partially, on the at least two of the plurality of energy peaks.
20. The process of claim 1 , wherein the spectral pattern comprises a plurality of energy peaks.