Wet etch processing
View Patent ↗A method of wet etching produces high-precision microneedle arrays for use in medical applications. The method achieves precise process control over microneedle fabrication, at single wafer or batch-level, using wet etching of silicon with potassium hydroxide (KOH) solution by accurately identifying the etch time endpoint. Hence, microneedles of an exactly required height, shape, sharpness and surface quality are achieved. The outcome is a reliable, reproducible, robust and relatively inexpensive microneedle fabrication process. Microneedles formed by KOH wet etching have extremely smooth surfaces and exhibit superior mechanical and structural robustness to their dry etched counterparts. These properties afford extra reliability to such silicon microneedles, making them ideal for medical applications. The needles can also be hollowed. Wet etched silicon microneedles can then be employed as masters to replicate the improved surface and structural properties in other materials (such as polymers) by moulding.
1. A process for manufacturing a microstructure needle article having a stem and a tip with a desired needle shape, the process comprising the steps of:
providing a semiconductor bulk material,
applying a mask to the bulk material, the mask having openings,
exposing the pattern-masked bulk material to an hydroxide liquid etchant,
allowing the hydroxide liquid etchant to enter the mask openings and to etch the bulk material until the desired needle shape is achieved, in which the needle tip is under, and pointing towards, the mask, and
predicting remaining etch time by monitoring dimensions of the bulk material during etching, calculating actual etch rates in particular directions, and using said calculations to predict the remaining etch time until a stop time.
2. The process as claimed in claim 1 , wherein the prediction step is performed to recognize a transition from one etching stage to a next etching stage.
3. The process as claimed in claim 1 , wherein the prediction step is performed to recognize a transition from one etching stage to a next etching stage; and wherein etch rates for particular crystal planes for each stage are calculated.
4. The process as claimed in claim 1 , wherein the prediction step comprises predicting:
(a) a time t 1 for etching to a base of the needle; and
(b) a time t 2 for etching to the tip of the needle.
5. The process as claimed in claim 1 , wherein the prediction step includes taking measurements a plurality of times close to the end of the etching.
6. The process as claimed in claim 1 , wherein the prediction step includes taking measurements a plurality of times close to the end of the etching; and wherein the etching is temporarily stopped while the monitoring takes place.
7. The process as claimed in claim 1 , wherein the prediction step includes calculating a plurality of different etch rates.
8. The process as claimed in claim 1 , wherein the prediction step includes predicting the stop time as being when bulk material crystal planes will intersect under the mask to form the needle tip.
9. The process as claimed in claim 1 , wherein the prediction step includes predicting the stop time as being when the crystal planes will intersect under the mask to form the needle tip; and wherein the end point is when the mask will detach.
10. The process as claimed in claim 1 , wherein the prediction step includes predicting the stop time as being when the crystal planes will intersect under the mask to form a point; and wherein eight planes intersect at the stop time.
11. The process as claimed in claim 1 , wherein the prediction step includes predicting a stop time as being when crystal planes will intersect under the mask to form a point; and wherein the end point is when the mask will detach; and wherein eight planes intersect at the stop time.
12. The process as claimed in claim 1 , wherein the prediction step includes predicting the stop time as being when crystal planes will intersect under the mask to form a point; and wherein eight planes intersect at the stop time.
13. The process as claimed in claim 1 , wherein the prediction step includes predicting the stop time as being when crystal planes will intersect under the mask to form a point; and wherein the article base has {121} crystal planes.
14. The process as claimed in claim 1 , wherein the prediction step includes predicting when certain crystal planes will be removed.
15. The process as claimed in claim 1 , wherein the prediction step includes predicting different etching rates for different dimensions.
16. The process as claimed in claim 1 , wherein the prediction step includes predicting different etching rates for different dimensions; and predicting a different etching rate in the top width of the needle frustum than diagonal width of the base.
17. The process as claimed in claim 1 , wherein the prediction step includes predicting different etching rates for different dimensions; and predicting a different etching rate in the top width of the needle frustum than diagonal width of the base; and wherein the process simultaneously fabricates an array of upright out-of-plane needles.
18. The process as claimed in claim 1 , wherein the prediction step includes predicting different reduction rates for different dimensions; and predicting a different etching rate in the top width of the needle frustum than diagonal width of the base; and wherein the process simultaneously fabricates an array of upright out-of-plane needles; and wherein the process simultaneously fabricates a plurality of arrays of needles.
19. The process as claimed in claim 1 , wherein the prediction step is performed with only a subset of the arrays.
20. The process as claimed in claim 1 , wherein the prediction step includes predicting different reduction rates for different dimensions; and predicting a different etching rate in the top width of the needle frustum than diagonal width of the base; and wherein the process simultaneously fabricates an array of upright out-of-plane needles; and wherein the process simultaneously fabricates a plurality of arrays of needles; and wherein the plurality of needles are fabricated on a semiconductor wafer.
21. The process as claimed in claim 1 , wherein the prediction step includes predicting etch time according to predicted changes in crystal plane indices.
22. The process as claimed in claim 1 , comprising a further step of automatically generating an etch mask design according to target needle parameters, etch parameters, and predicted etch rates.
23. The process as claimed in claim 1 , comprising a further step of using the microstructure needle as a master to produce a plurality of microstructure needles in a polymer material.
24. The process as claimed in claim 1 , comprising further steps of using the microstructure needle as a master to produce a plurality of microstructure needles in a polymer material; and wherein the semiconductor needle is used as a master in a mould.
25. The process as claimed in claim 1 , comprising a further step of creating a hollow in the microstructure needle.
26. The process as claimed in claim 1 , wherein the mask is of nitride material.
27. The process as claimed in claim 1 , wherein the mask openings are formed by plasma etching.
28. The process as claimed in claim 1 , wherein the etchant is potassium hydroxide.
29. The process as claimed in claim 1 , wherein the etchant temperature is above 70° C.
30. The process as claimed in claim 1 , wherein the etchant temperature is approximately 79° C. and the etchant is potassium hydroxide.
31. A process controller comprising a processor and an input interface, the input interface being for receiving process conditions and the processor being for performing the prediction step of claim 1 .
32. A computer readable medium comprising software for performing the prediction step of claim 1 when executing on a digital processor.