IP Library Granted Patent US 7,652,566
Granted Patent B2
US 7,652,566 · App. 11/905,508 · Granted Jan 26, 2010

Arc wave generator for testing an arc-fault circuit interrupter

Assignee: Hetko, Inc.
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Quick Facts
Patent No.
US 7,652,566
App. No.
11/905,508
Granted
Jan 26, 2010
Kind
B2
Abstract

Apparatus includes an arc wave generator for testing an arc fault circuit interrupter (AFCI) for use in a test system for testing whether or not an arc fault circuit interrupter (AFCI) is operating normally, in which a false arc is generated for use in testing the arc fault circuit interrupter (AFCI). The arc wave generator includes a rectifier which receives a commercial power source as an input source and rectifies alternating-current voltage of the commercial power source to generate a rectified signal. A drop resistor drops the voltage of the rectified signal to generate a voltage-dropped signal. A mono-stable multivibrator adjusts a voltage level and a pulse width of the voltage-dropped signal and generates a pulse signal which is used to generate a false arc for testing the arc fault circuit interrupter (AFCI). Thus, a false arc is generated with a simple circuit to accurately test the actions of the arc fault circuit interrupter (AFCI).

Claims (39)

1. An arc wave generator for use in a test system for testing whether or not an arc fault circuit interrupter (AFCI) is operating normally, the arc wave generator comprising:

a rectifier which rectifies alternating-current voltage of a commercial power source to generate a rectified signal;

a drop resistor which drops voltage of the rectified signal to generate a voltage-dropped signal; and

a mono-stable multivibrator which adjusts a voltage level and a pulse width of the voltage-dropped signal and generates a pulse signal used to provide a false arc for testing the arc fault circuit interrupter (AFCI).

2. The arc wave generator according to claim 1 , wherein the rectifier comprises diodes which are connected in the form of a bridge for rectifying the alternating-current voltage of the commercial power source to generate a half-wave form.

3. The arc wave generator according to claim 1 , wherein the mono-stable multivibrator comprises:

a Zener diode connected in parallel with the drop resistor for determining a voltage level of the voltage-dropped signal, and

a resistor and a capacitor for determining a tilt representing a voltage drop based on a time constant for changing a pulse width.

4. The arc wave generator according to claim 1 , further comprising:

a high-frequency generator for generating a high-frequency signal; and

an AND gate which performs a logical multiplication operation to multiply the high-frequency signal generated by the high-frequency generator by the pulse signal generated by the mono-stable multivibrator to generate a multiplied pulse signal used to generate a false arc pulse for testing the arc fault circuit interrupter (AFCI).

5. The arc wave generator according to claim 1 , further comprising:

a high-frequency generator for generating a high-frequency signal; and

a switching unit which performs a switching operation with respect to the high-frequency signal that is generated by the high-frequency generator according to the pulse signal output from the mono-stable multivibrator to generate a switched pulse signal used to generate a false arc pulse for testing the arc fault circuit interrupter (AFCI).

6. The arc wave generator according to claim 5 , wherein the switching unit comprises:

a first transistor having a collector, an emitter, and a base, said first transistor being turned “ON/OFF” according to the pulse signal output by the mono-stable multivibrator into said base of said first transistor, and outputting a direct-current voltage that is applied to the collector of the first transistor via the emitter thereof; and

a second transistor having a collector, an emitter, and a base, said base being connected with the emitter of the first transistor through a resistor, said collector being connected to the high-frequency generator, and said second transistor being operated in linkage with the “ON/OFF” operations of the first transistor such that the second transistor is turned on as the first transistor is turned on thereby outputting the high-frequency signal which is generated by the high-frequency generator and applied to the collector of the second transistor via the emitter of the second transistor.

7. An arc fault circuit interrupter having circuitry for detecting an arcing condition and for interrupting operation of a circuit when the arcing condition is detected, said arc fault circuit interrupter comprising:

a testing circuit for generating a false arcing condition, said testing circuit including a sinusoidal wave processing unit for receiving a sinusoidal AC power signal and processing said power signal to approximate a predetermined arc wave form, a square wave generator for generating a square wave of a predetermined frequency, and a multiplication unit for multiplying the square wave by the processed power signal to produce a false arc pulse.

8. The arc fault circuit interrupter according to claim 7 , wherein the multiplication unit comprises a switching unit or an AND gate that produces a logic high output when the square wave and the processed power signal is logic high.

9. The arc fault circuit interrupter according to claim 7 , wherein the sinusoidal wave processing unit comprises a rectifier for rectifying the AC power signal into a half wave pulse signal, a Zener diode for adjusting a level of the half wave pulse signal, and at least one capacitor and resistor for adjusting a width of the half wave pulse signal in accordance with a time constant determined by the at least one capacitor and resistor.

10. The arc fault circuit interrupter according to claim 7 , wherein the AC power signal has a frequency that is substantially less than the predetermined frequency of the square wave.

11. The arc fault circuit interrupter according to claim 7 , wherein the multiplication unit comprises:

a first transistor turned ON and OFF based on the processed power signal output; and

a second transistor connected to the first transistor such that said second transistor is turned ON and OFF when the first transistor is turned ON and OFF, respectively, said second transistor outputting said square wave when said second transistor is ON.

12. The arc fault circuit interrupter according to claim 7 , wherein said sinusoidal wave processing unit comprises a rectifier connected in series with a mono-stable multi-vibrator.

13. The arc fault circuit interrupter according to claim 12 , wherein said rectifier comprises a bridge-type rectifier including a plurality of diodes.

14. A method of generating an arc wave for use in a test system for testing whether or not an arc fault circuit interrupter (AFCI) is operating normally, the method comprising the steps of:

receiving an alternating-current voltage;

rectifying the alternating current voltage to form a half-wave signal having a plurality of pulses;

adjusting a voltage level and a pulse width of the pulses of the half-wave signal; and

generating a false arc signal based on the adjusted half-wave signal and providing the false arc signal to the AFCI for testing.

15. The method according to claim 14 , wherein the step of adjusting the voltage level comprises reducing the voltage of the half-wave signal using a voltage drop resistor, adjusting the voltage level of the half-wave signal using a Zener diode, and adjusting a pulse width of the pulses of the half-wave signal using an RC circuit.

16. The method according to claim 14 , further comprising:

generating a high frequency signal;

ANDing the high frequency signal with the adjusted half-wave signal to perform a logical multiplication to generate a false arc pulse for testing the AFCI.

17. The method according to claim 14 , further comprising:

generating a high-frequency signal; and

switching the high frequency signal as an output false arc pulse when the half wave signal is above a predetermined voltage using at least one transistor.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 12, 2021
From: HETKO, INC.
To: ARCONTEK CO. LTD.
Reel/Frame 056864/0135 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 30, 2008
From: LEE, JUN BAE; JO, SHIN YON
To: HETKO, INC.
Reel/Frame 020438/0326 →
Continuity (1)
Related Publication 20080284450A1 · Nov 20, 2008