Semiconductor device and manufacturing the same
Disclosed is a semiconductor device which makes it easy to design a wiring pattern for a wiring substrate on which the semiconductor device is to be mounted. In manufacturing plural semiconductor devices for providing different amounts of output current, arrangements and numbers of leads to which semiconductor chips for power transistors of the semiconductor devices are to be electrically connected are changed according to output current requirements for the semiconductor devices, whereas arrangements and numbers of leads to which semiconductor chips for control circuits of the semiconductor devices are to be electrically connected are fixed to be common to the semiconductor devices. In this way, the probability of malfunction of control circuits (PWM circuits) of the semiconductor devices can be reduced, so that a semiconductor device which makes it easy to design a wiring pattern for a wiring substrate on which the semiconductor device is to be mounted can be provided.
1. A method of manufacturing a semiconductor device, comprising the steps of:
(a) preparing first and second wiring substrates, each having first and second principal surfaces provided on opposite sides across a thickness thereof;
(b) mounting a semiconductor chip for a first power transistor and a semiconductor chip for a first control circuit over the first principal surface of the first wiring substrate;
(c) mounting a semiconductor chip for a second power transistor and a semiconductor chip for a second control circuit over the first principal surface of the second wiring substrate;
(d) forming a first sealing body for sealing the semiconductor chip for the first power transistor and the semiconductor chip for the first control circuit; and
(e) forming a second sealing body for sealing the semiconductor chip for the second power transistor and the semiconductor chip for the second control circuit,
wherein an arrangement of external terminals, to be electrically connected to the semiconductor chip for the first control circuit, of the first wiring substrate and an arrangement of external terminals, to be electrically connected to the semiconductor chip for the second control circuit, of the second wiring substrate are identical, and
wherein an arrangement of external terminals, to be electrically connected to the semiconductor chip for the first power transistor, of the first wiring substrate and an arrangement of external terminals, to be electrically connected to the semiconductor chip for the second power transistor, of the second wiring substrate are not identical.
2. The method of manufacturing a semiconductor device according to claim 1 ,
wherein each of the first and second sealing bodies has first and second principal surfaces provided on opposite sides across a thickness thereof,
wherein the first and second principal surfaces of the first and second sealing bodies are quadrilateral,
wherein each of the first and second principal surfaces of the first and second sealing bodies has first and second sides, the first sides extending in a direction intersecting a direction in which the second sides extend,
wherein the first sides of the first and second sealing bodies have an equal length, and
wherein the second sides of the first sealing body are shorter than the second sides of the second sealing body.
3. The method of manufacturing a semiconductor device according to claim 2 ,
wherein the first sides of the second sealing body are shorter than the second sides of the second sealing body.
4. The method of manufacturing a semiconductor device according to claim 1 ,
wherein the semiconductor chip for the first power transistor and the semiconductor chip for the first control circuit are arranged such that longitudinal directions of the semiconductor chips intersect each other, and
wherein the semiconductor chip for the second power transistor and the semiconductor chip for the second control circuit are arranged such that longitudinal directions of the semiconductor chips intersect each other.
5. The method of manufacturing a semiconductor device according to claim 1 ,
wherein the semiconductor chip for the second power transistor is arranged such that the longitudinal direction thereof is along a longitudinal direction of the second sealing body.
6. The method of manufacturing a semiconductor device according to claim 1 ,
wherein the semiconductor chip for the first control circuit and the semiconductor chip for the second control circuit have an equal area.
7. The method of manufacturing a semiconductor device according to claim 1 ,
wherein each of the semiconductor chips for the first and second control circuits has a circuit which generates a pulse width modulation signal.
8. A method of manufacturing a semiconductor device, comprising the steps of:
(a) preparing a wiring substrate having first and second principal surfaces provided on opposite sides across a thickness thereof; and
(b) mounting a semiconductor chip for a power transistor and a semiconductor chip for a control circuit over the first principal surface of the wiring substrate,
wherein the step (a) includes fixing an arrangement of external terminals, out of external terminals arranged over the second principal surface of the wiring substrate, to be electrically connected to the semiconductor chip for the control circuit and changing an arrangement of external terminals, out of the external terminals arranged over the second principal surface of the wiring substrate, to be electrically connected to the semiconductor chip for the power transistor.
9. The method of manufacturing a semiconductor device according to claim 8 ,
wherein the semiconductor chip for the power transistor is arranged such that a longitudinal direction thereof intersects a longitudinal direction of the semiconductor chip for the control circuit, and
wherein the method includes changing lengths of sides of the semiconductor chip for the power transistor.
10. The method of manufacturing a semiconductor device according to claim 9 ,
wherein the method includes changing the lengths of sides, out of the sides of the semiconductor chip for the power transistor, which extend in a direction intersecting the longitudinal direction of the semiconductor chip for the control circuit.