Inspection method and apparatus, lithographic apparatus, lithographic processing cell and device manufacturing method
The present invention refers to the simultaneous measurement of four separately polarized beams upon diffraction from a substrate in order to determine properties of the substrate. Circularly or elliptically polarized light sources are passed via up to three polarizing elements. This polarizes the light sources by 0, 45, 90 and 135°. The plurality of polarizing beamsplitters replaces the use of a phase modulator, but enables the measurement of the intensity of all four beams and thus the measurement of the phase modulation and amplitude of the combined beams to give the features of the substrate.
1. An inspection apparatus configured to measure a property of a substrate, the inspection apparatus comprising:
a light source configured to supply a radiation beam;
an optical element configured to focus the radiation beam onto a substrate;
a polarizing device configured to polarize at least four portions of the radiation beam into four different polarization orientations; and
a detector system configured to detect simultaneously an angle-resolved spectrum of the four polarization orientations of the radiation beam.
2. An inspection apparatus configured to measure a property of a substrate, the inspection apparatus comprising:
a light source configured to supply a radiation beam;
an optical element configured to focus the radiation beam onto a surface of the substrate;
a beamsplitter configured to separate the radiation beam once reflected from the surface of the substrate into first and second sub-beams;
a first polarizing beamsplitter configured to split the first sub-beam into two orthogonally polarized sub-sub-beams;
a second polarizing beamsplitter configured to split the second sub-beam into two further orthogonally polarized sub-sub-beams; and
a detector system configured to detect simultaneously an angle-resolved spectrum of all four sub-sub-beams reflected from the surface of the substrate.
3. The inspection apparatus according to claim 2 , wherein the radiation beam reflected from the substrate is elliptically polarized.
4. The inspection apparatus according to claim 2 , further comprising an optical wedge configured to deflect the sub-sub-beams onto the detector system.
5. The inspection apparatus according to claim 2 , further comprising a deflector configured to deflect the sub-sub-beams onto the detector system.
6. The inspection apparatus according to claim 2 , wherein the beamsplitter and the first and second polarizing beamsplitters comprise polarizing prisms.
7. The inspection apparatus according to claim 2 , wherein the beamsplitter and the first and second polarizing beamsplitters comprise Wollaston prisms.
8. The inspection apparatus according to claim 2 , wherein the sub-beams comprise a TE-beam and a TM-beam.
9. The inspection apparatus according to claim 2 , further comprising:
a focusing system, and
an optical wedge placed in the image plane of the focusing system that is configured to redirect the polarized sub-sub-beams in different directions such that the sub-sub-beams are received at different positions on the detector.
10. A lithographic apparatus configured to measure a property of a substrate, the lithographic apparatus comprising:
a light source configured to supply a radiation beam;
an optical element configured to focus the radiation beam onto a surface of a substrate;
a polarizing device configured to polarize at least four portions of the radiation beam into four different polarization orientations; and
a detector system configured to detect simultaneously an angle-resolved spectrum of the four polarization orientations of the radiation beam.
11. A lithographic apparatus configured to measure a property of a substrate, the lithographic apparatus comprising:
a light source configured to supply a radiation beam;
an optical element configured to focus the radiation beam onto a surface of a substrate;
a beamsplitter configured to separate the radiation beam once reflected from the surface of the substrate into first and second sub-beams;
a first polarizing beamsplitter configured to split the first sub-beam into two orthogonally polarized sub-sub-beams;
a second polarizing beamsplitter configured to split the second sub-beam into two further orthogonally polarized sub-sub-beams; and
a detector system configured to detect simultaneously an angle-resolved spectrum of all four sub-sub-beams reflected from the surface of the substrate.
12. A lithographic cell configured to measure a property of a substrate, the lithographic cell comprising:
a light source configured to supply a radiation beam;
an optical element configured to focus the radiation beam onto a substrate;
a polarizing device configured to polarize at least four portions of the radiation beam into four different polarization orientations; and
a detector system configured to detect simultaneously an angle-resolved spectrum of the four polarization orientations of the radiation beam.
13. A lithographic cell configured to measure a property of a substrate, the lithographic cell comprising:
a light source configured to supply a radiation beam;
an optical element configured to focus the radiation beam onto a surface of a substrate;
a beamsplitter configured to separate the radiation beam once reflected from the surface of the substrate into first and second sub-beams;
a first polarizing beamsplitter configured to split the first sub-beam into two orthogonally polarized sub-sub-beams;
a second polarizing beamsplitter configured to split the second sub-beam into two further orthogonally polarized sub-sub-beams; and
a detector system configured to detect simultaneously an angle-resolved spectrum of all four sub-sub-beams reflected from the surface of the substrate.