Circuitry and method for an at-speed scan test
An integrated circuit has a plurality of clock domains and a plurality of memory cells being configurable as operational memory cells or as scan test memory cells for testing the integrated circuit. A pulse generator of the integrated circuit generates pulses for triggering the memory cells when being configured as scan test memory cells, the pulse generator comprising a plurality of pulse outputs. The pulses are provided to the memory cells by multiplexer circuits selecting one of the pulses of the pulse generator and an operational clock.
1. An integrated circuit comprising:
a plurality of memory cells being configurable as operational memory cells or as scan test memory cells;
a pulse generator configured to generate pulses for triggering the memory cells when the memory cells are configured as scan test memory cells; and
a multiplexer circuit in communication with the memory cells and configured to select one of the pulses of the pulse generator, an operational clock and a test shift clock according to an operational mode,
the pulse generator comprising an input receiving the operational clock and an input receiving the test shift clock.
2. The integrated circuit of claim 1 ,
wherein the integrated circuit comprises a phase-locked loop configured to generate the operational clock from a reference clock and a phase-locked loop configured to generate a test clock from the reference clock, the pulse generator being configured to generate the pulses from the test clock.
3. The integrated circuit of claim 1 ,
wherein the integrated circuit comprises a test shift clock input in communication with the multiplexer circuit.
4. The integrated circuit of claim 1 ,
wherein the integrated circuit comprises a plurality of clock domains, each clock domain coupled to a multiplexer circuit.
5. An integrated circuit comprising:
a plurality of memory cells being configurable as operational memory cells or as scan test memory cells;
a plurality of clock domains each comprising a subset of the plurality of memory cells;
a pulse generator configured to generate pulses to trigger the memory cells when the memory cells are configured as scan test memory cells, the pulse generator comprising a plurality of pulse outputs; and
a plurality of multiplexer circuits each in communication with the memory cells of one clock domain and configured to select one of the pulses of the pulse generator and an operational clock according to an operational mode;
wherein each of the plurality of pulse outputs of the pulse generator is coupled to an input of a different multiplexer.
6. The integrated circuit of claim 5 ,
wherein the pulse generator comprises a synchronizing circuit configured to synchronize a test enable signal to the operational clock.
7. The integrated circuit of claim 5 ,
wherein the pulse generator is configured to generate the pulses by gating the operational clock with enable signals.
8. The integrated circuit of claim 5 ,
wherein the pulse generator is configured to generate the pulses by gating a test shift clock with enable signals.
9. The integrated circuit of claim 8 ,
wherein the integrated circuit comprises an on-chip phase-locked loop configured to generate the test shift clock.
10. The integrated circuit of claim 5 ,
wherein the pulse generator is configured to select the pulse outputs for delivering the pulses based on a scan test configuration.
11. The integrated circuit of claim 10 ,
wherein the scan test configuration comprises a launch information and a capture information, and the pulse generator is configured to generate two pulses and is configured to output the first pulse at a pulse output indicated by the launch information and the second pulse at a pulse output indicated by the capture information.
12. The integrated circuit of claim 5 ,
wherein the integrated circuit comprises a plurality of on-chip phase-locked loops configured to generate operational clocks.
13. An integrated circuit comprising:
a plurality of memory cells being configurable in an operational mode or in a scan test mode;
a plurality of clock domains; and
pulse configuration circuitry configured to receive a scan test mode indicator and configured to generate scan test control signals controlling an application of scan test pulses within the plurality of clock domains to trigger the memory cells when configured in a scan test mode; and
wherein the pulse configuration circuitry is configured to generate a launch scan test control signal for one of the plurality of clock domains to indicate whether the memory cells in said clock domain are triggered by a launch scan test pulse, and a capture scan test control signal to indicate whether the memory cells in said clock domain are triggered by a capture scan test pulse.