Identifying process and temperature of silicon chips
Systems and techniques are disclosed relating to communications. The systems and techniques include determining the temperature and process speed of chips used in communications devices. The systems and techniques include measuring the output of ring oscillators embedded in the chips, and calculating the temperature and process speed therefrom.
1. A method for determining an operating parameter of a chip having first and second ring oscillators, comprising:
measuring a frequency of the first ring oscillator;
measuring a frequency of the second ring oscillator;
multiplying, by a processor, the measured frequency of the first ring oscillator by the measured frequency of the second ring oscillator to obtain a result; and
determining, by the processor, as a function of the result and characterization data of the chip, the chip's actual temperature.
2. The method of claim 1 wherein the measuring of the first ring oscillator frequency comprises:
obtaining two ring oscillator clock counts, separated by a time difference, from a ring oscillator;
obtaining two independent clock counts, separated by the time differences, from a clock output independent from the ring oscillator; and
calculating a ratio of the difference between the two ring oscillator clock values and the difference between the two independent clock values.
3. The method of claim 1 , further comprising:
calculating a scaled frequency value from the first and second measured ring oscillator frequencies and characterization data of the chip;
comparing the calculated scaled frequency value with a known range of scaled frequency values relative to temperature; and
determining, from the comparison, the actual temperature of the chip.
4. A computer-readable storage medium embodying a program of instructions executable by a computer to determine an operating parameter of a chip having first and second ring oscillators, the executable instructions for:
measuring a frequency of the first ring oscillator;
measuring a frequency of the second ring oscillator;
multiplying the measured frequency of the first ring oscillator by the measured frequency of the second ring oscillator to obtain a result; and
determining, as a function of the result and characterization data of the chip, the chip's temperature.
5. The computer-readable storage medium of claim 4 wherein the instructions for measuring the first ring oscillator frequency comprise instructions for:
obtaining two ring oscillator clock counts, separated by a time difference, from a ring oscillator;
obtaining two independent clock counts, separated by the time difference, from a clock output independent of the ring oscillator; and
calculating a ratio of the difference between the two ring oscillator clock values and the difference between the two independent clock values.
6. The computer-readable storage medium of claim 4 , further comprising executable instructions for:
calculating a scaled frequency value from the first and second measured ring oscillator frequencies and characterization data of the chip;
comparing the calculated scaled frequency value with a known range of scaled frequency values relative to temperature; and
determining, from the comparison, the actual temperature of the chip.
7. A system comprising:
a chip having first and second ring oscillators; and
a processor configured to:
measure a frequency of the first ring oscillator;
measure a frequency of the second ring oscillator;
multiply the measured frequency of the first ring oscillator by the measured frequency of the second ring oscillator to obtain a result; and
determine, as a function of the result and characterization data of the chip, the chip's actual temperature.
8. The system of claim 7 wherein the chip comprises the processor.
9. The system of claim 7 wherein the processor is separate from but operably connected to the chip.
10. The system of claim 7 wherein the chip additionally comprises:
a first counter configured to obtain two ring oscillator clock counts, separated by a time difference, from the first ring oscillator;
a second counter configured to obtain two independent clock counts, separated by the time difference, from a clock output independent of the first and second ring oscillators; and
wherein the processor is further configured to calculate a ratio of the difference between the two ring oscillator clock values and the difference between the two independent clock values.
11. The system of claim 7 , wherein the processor is further configured to:
calculate a scaled frequency value from the first and second measured ring oscillator frequencies and characterization data of the chip;
compare the calculated scaled frequency value with a known range of scaled frequency values relative to temperature; and
determine, from the comparison, the actual temperature of the chip.
12. A processor comprising:
means for measuring a frequency of a first ring oscillator;
means for measuring a frequency of the second ring oscillator;
means for multiplying the measured frequency of the first ring oscillator by the measured frequency of the second ring oscillator to obtain a result; and
means for determining, as a function of the result and characterization data of the chip, the chip's temperature.
13. The processor of claim 12 further comprising means for determining a process speed of the chip in response to the actual temperature.
14. A method for determining a process speed of the chip in response to the actual temperature, having first and second ring oscillators, comprising:
measuring a frequency of the first ring oscillator;
measuring a frequency of the second ring oscillator;
dividing, by a processor, the measured frequency of the first ring oscillator frequency by the measured frequency of the second ring oscillator to obtain a result; and
determining, by the processor, as a function of the division result and characterization data of the chip, the chip's process speed.
15. The method of claim 14 , further comprising:
multiplying the measured frequency of the first ring oscillator by the measured frequency of the second ring oscillator to obtain a second result;
determining, as a function of the second result and the characterization data, the chip's actual temperature; and
adjusting the determined process speed according to the determined actual temperature.
16. The method of claim 14 , further comprising:
calculating a scaled frequency value from the first and second measured ring oscillator frequencies and characterization data of the chip;
comparing the calculated scaled frequency value with a known range of scaled frequency numbers relative to process speed; and
determining, from the comparison, the process speed of the chip.
17. A computer-readable storage medium embodying a program of instructions executable by a computer to determine a process speed of the chip in response to the actual temperature, having first and second ring oscillators, the executable instructions for:
measuring a frequency of the first ring oscillator;
measuring a frequency of the second ring oscillator;
dividing the measured frequency of the first ring oscillator frequency by the measured frequency of the second ring oscillator to obtain a result; and
determining, as a function of the result and characterization data of the chip, the chip's process speed.
18. The computer-readable storage medium of claim 17 , further comprising executable instructions for:
multiplying the measured frequency of the first ring oscillator by the measured frequency of the second ring oscillator to obtain a second result;
determining, as a function of the second result and the characterization data, the chip's actual temperature; and
adjusting the determined process speed according to the determined actual temperature.
19. The computer-readable storage medium of claim 17 , further comprising executable instructions for:
calculating a scaled frequency value from the first and second measured ring oscillator frequencies and characterization data of the chip;
comparing the calculated scaled frequency value with a known range of scaled frequency numbers relative to process speed; and
determining, from the comparison, the process speed of the chip.
20. A system configured to determine a process speed of the chip in response to the actual temperature, comprising:
a chip having first and second ring oscillators; and
a processor configured to:
measure a frequency of the first ring oscillator;
measure a frequency of the second ring oscillator;
divide the measured frequency of the first ring oscillator frequency by the measured frequency of the second ring oscillator to obtain a result; and
determine, as a function of the result and characterization data of the chip, the chip's process speed.
21. The system of claim 20 , wherein the processor is further configured to:
multiply the measured frequency of the first ring oscillator by the measured frequency of the second ring oscillator to obtain a second result;
determine, as a function of the second result and the characterization data, the chip's actual temperature; and
adjust the determined process speed according to the determined actual temperature.
22. The system of claim 20 , wherein the processor is further configured to:
calculate a scaled frequency value from the first and second measured ring oscillator frequencies and characterization data of the chip;
compare the calculated scaled frequency value with a known rang of scaled frequency numbers relative to process speed; and
determine, from the comparison, the process speed of the chip.