Grouping systematic defects with feedback from electrical inspection
Methods and apparatus for categorizing defects on workpieces, such as semiconductor wafers and masks used in lithographically writing patterns into such wafers are provided. For some embodiments, by analyzing the layout in the neighborhood of the defect, and matching it to similar defected neighborhoods in different locations across the die, defects may be categorized by common structures in which they occur.
1. A method for inspecting a semiconductor wafer, comprising:
determining locations of visible defects on the semiconductor wafer via an optical inspection process;
determining locations of electrical defects on the semiconductor wafer via an electrical inspection process;
mapping the electrical defects to physical locations on the semiconductor wafer, allowing corresponding defects to be isolated to corresponding circuit areas involving a limited number of circuit elements;
analyzing the electrical defects to identify potential defects or defect locations associated with the common structures or circuit elements in corresponding circuit areas; and
adjusting the optical inspection process based on the identified common structures or circuit elements to identify electrical defects previously undetected by the optical inspection process.
2. The method of claim 1 , wherein determining locations of electrical defects on the semiconductor wafer via a second inspection process involving electrical tests comprises:
performing structural tests involving scan-chains to identify defective net structures; and
mapping defective net structures to physical locations on the wafer.
3. The method of claim 1 , wherein adjusting the optical inspection process based on the identified common structures or circuit elements comprises adjusting or creating a rule to identify and classify the identified common structures or circuit elements during the first optical inspection process.
4. The method of claim 1 , further comprising:
prioritizing defects detected in the optical inspection process for additional investigative operations using the identified common structures or circuit elements.
5. The method of claim 4 , wherein the additional investigative operations involve at least one of: inspection using a scanning electron microscope, cross-sectional analysis of the defect, and elemental analysis of the defect.
6. A computer-readable medium containing instructions which, when executed by a processor, perform operations for inspecting a semiconductor wafer, the operations comprising:
determining locations of visible defects on the semiconductor wafer via an optical inspection process;
determining locations of electrical defects on the semiconductor wafer via an electrical inspection process;
mapping the electrical defects to physical locations on the semiconductor wafer, allowing corresponding defects to be isolated to corresponding circuit areas involving a limited number of circuit elements;
analyzing the electrical defects to identify potential defects or defect locations associated with the common structures or circuit elements in corresponding circuit areas; and
adjusting the optical inspection process based on the identified common structures or circuit elements to identify electrical defects previously undetected by the optical inspection process.
7. A method for inspecting a semiconductor wafer, comprising:
determining visible defects on the semiconductor wafer by performing an optical inspection process;
identifying electrical defects by performing electrical tests on the semiconductor wafer;
mapping the electrical defects to physical locations on the semiconductor wafer, allowing corresponding defects to be isolated to corresponding circuit areas involving a limited number of circuit elements;
analyzing the physical locations to which one or more multiple defects are mapped to classify the multiple defects as random or systematic; and
adjusting the optical inspection process based on the analysis to identify electrical defects previously undetected by the optical inspection process.
8. The method of claim 7 , wherein analyzing the physical locations to which one or more multiple defects are mapped to identify the multiple defects as random or systematic comprises:
classifying multiple defects mapped to common physical locations as systematic.
9. The method of claim 8 , wherein analyzing the physical locations to which one or more multiple defects are mapped to identify the multiple defects as random or systematic comprises:
classifying a defect that is not mapped to common physical locations as random.
10. The method of claim 9 , further comprising:
prioritizing defects detected in the optical inspection process for additional investigative operations, wherein defects classified as random are given a different priority than defects classified as systematic.