Pad conditioner design and method of use
View Patent ↗A polishing pad conditioning apparatus includes a laser beam generating unit along with a system to transmit or focus the beam. The unit is mounted on a conditioning arm, such that the laser beam may be directed perpendicular to the plane of the polishing pad, which is next to the polishing platen. The conditioning arm is capable of moving across the polishing table to scan the pad radius, allowing the laser to traverse the pad radius.
1. A pad conditioning apparatus comprising a laser source mounted to (i) condition a polishing pad with at least one laser beam while said polishing pad is polishing a wafer, and (ii) to traverse a polishing surface of the polishing pad during said polishing of the wafer.
2. The apparatus as in claim 1 , wherein the laser source is mounted off-center with respect to the polishing pad on a conditioning head.
3. The apparatus as in claim 1 , wherein the laser source is mounted such that the at least one laser beam is incident perpendicular to a plane of polishing pad.
4. The apparatus as in claim 1 , wherein the laser source is mounted such that the at least one laser beam is incident at an angle other than 90 degrees to a plane of the polishing pad.
5. The apparatus as in claim 1 , wherein the laser source comprises one of a diode, a CO 2 or a solid state laser source having power in the range of 1-500 watts.
6. The apparatus as in claim 1 , wherein the laser source is mounted so as to be capable of traversing the surface of the pad at a rate of 1-500 mm/sec.
7. The apparatus as in claim 1 , wherein the pad is supported so as to be capable of being rotated at 10-500 rpm.
8. A method, comprising bringing a polishing pad conditioning head in proximity to a surface of a polishing pad and directing a laser beam from the polishing pad conditioning head onto the surface of the polishing pad so as to traverse a radius of the polishing pad with the laser beam while rotating the polishing pad so as to effect full pad coverage and create a microgroove pattern in the surface of the polishing pad while a wafer is being pressed against the polishing pad.