IP Library Granted Patent US 7,767,518
Granted Patent B2
US 7,767,518 · App. 12/266,876 · Granted Aug 3, 2010

Field effect transistor

Assignee: Infineon Technologies AG
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Quick Facts
Patent No.
US 7,767,518
App. No.
12/266,876
Granted
Aug 3, 2010
Kind
B2
Abstract

A field effect transistor is provided. The field effect transistor includes a channel region, electrically conductive channel connection regions, and a control region. The electrically conductive channel connection regions adjoin the channel region along with a transistor dielectric. The control region is separated from the channel region by the transistor dielectric. In addition, the control region may comprise a monocrystalline material.

Claims (13)

1. A method for producing a field effect transistor comprising the steps of:

forming a trench with at least one monocrystalline region of a monocrystalline substrate at a trench wall or at a trench bottom;

producing a dielectric at the monocrystalline region;

producing of a channel region in the trench after the step of producing of the dielectric;

forming electrically conductive channel connection regions; and

forming a gate control region adjacent the dielectric in the monocrystalline region.

2. The method as claimed in claim 1 , wherein a monocrystalline dielectric is produced by epitaxial growth on the monocrystalline region.

3. The method as claimed in claim 2 , wherein the monocrystalline dielectric is produced by means of molecular beam epitaxy.

4. The method as claimed in claim 2 , wherein the monocrystalline dielectric is produced by means of vapor phase epitaxy.

5. The method as claimed in claim 2 , wherein the monocrystalline dielectric is produced by means of atomic layer deposition.

6. The method as claimed in claim 1 , wherein a monocrystalline channel region is produced by epitaxial growth on the dielectric.

7. The method as claimed in claim 6 , wherein the monocrystalline channel region is produced by vapor phase deposition.

8. The method as claimed in claim 1 , wherein the gate control region is formed in the monocrystalline region and outside the trench.

Continuity (2)
Division 1140468200 · Apr 14, 2006
Related Publication 20090068806A1 · Mar 12, 2009