Resiliently retaining state information of a many-core processor
In one embodiment, the present invention includes a method for performing dynamic testing of a many-core processor including a plurality of cores, manipulating data obtained from the dynamic testing into profile information of the many-core processor, and storing the profile information in a non-volatile memory. The non-volatile memory may be within the many-core processor, in some embodiments. Other embodiments are described and claimed.
1. An apparatus comprising:
a many-core processor including a plurality of cores coupled via an interconnection fabric, each of the plurality of cores including at least one execution unit, register, buffer and cache; and
a non-volatile memory coupled to the many-core processor to store resilient state data including a profile for each of the plurality of cores, the profile including an operational frequency, a power consumption level, and a functional correctness indicator for the associated core to indicate whether operation of the core is correct, as determined via self-testing performed within and by the many-core processor.
2. The apparatus of claim 1 , wherein the many-core processor and the non-volatile memory are located in a single integrated circuit (IC).
3. The apparatus of claim 2 , wherein the many-core processor and the non-volatile memory are located on a single substrate of the IC.
4. The apparatus of claim 1 , wherein each of the plurality of cores includes a portion of the non-volatile memory.
5. The apparatus of claim 1 , wherein the many-core processor is to update the profile of a core after an operational change to the core corresponding to a degraded performance level for the core, and to indicate the update by association of an update flag with the updated profile.
6. The apparatus of claim 1 , wherein the many-core processor is to access the resilient state data upon initialization to determine one or more of the plurality of cores to enable.
7. The apparatus of claim 1 , wherein the resilient state data includes bin information corresponding to a segmentation of the plurality of cores into a plurality of performance bins and configuration information of the interconnection fabric.
8. The apparatus of claim 1 , wherein the apparatus comprises a semiconductor package including a first substrate supporting the many-core processor and a second substrate supporting the non-volatile memory.
9. The apparatus of claim 1 , wherein the non-volatile memory further comprises a basic input/output system (BIOS).
10. The apparatus of claim 1 , wherein the profile further includes task allocation information regarding one or more cores to be allocated to a task.
11. The apparatus of claim 5 , wherein the updated profile is to provide trending information, and the many-core processor is to reconfigure at least one core based on the updated profile.
12. The apparatus of claim 11 , wherein the reconfiguration is to reassign the at least one core from a first bin to a second bin of a plurality of bins.
13. The apparatus of claim 12 , wherein the reconfiguration is to further reassign a spare core of the many-core processor to the first bin.
14. The apparatus of claim 1 , wherein the self-testing of a first core is to be performed by a neighboring core of the many-core processor.
15. The apparatus of claim 1 , wherein the self-testing of a first core is to be performed by a dedicated tester core of the many-core processor.
16. A processor comprising:
a plurality of cores coupled via an interconnection fabric, each of the plurality of cores including at least one execution unit, register, buffer and cache, the plurality of cores partitioned into a plurality of bins based on dynamic self-testing performed in the plurality of cores, wherein at least one spare core is controllable to be inserted into one of the plurality of bins based on a failure of the dynamic self-test of another core in the one bin, and a non-volatile memory coupled to the plurality of cores to store resilient state data including a profile for each of the plurality of cores, the profile including a functional correctness indicator for the associated core to indicate whether operation of the core is correct, as determined by the dynamic self-testing.
17. The processor of claim 16 , wherein the plurality of cores and the non-volatile memory are located in a single integrated circuit (IC).
18. The processor of claim 17 , wherein the plurality of cores and the non-volatile memory are located on a single substrate of the IC.
19. The processor of claim 16 , wherein each of the plurality of cores includes a portion of the non-volatile memory.