Non-volatile semiconductor storage device and manufacturing method thereof
A non-volatile semiconductor storage device includes a substrate, a first insulating layer formed on the substrate, a semiconductor layer formed of polysilicon on the first insulating layer, a pair of conductor regions formed on the first insulating layer to pass through the semiconductor layer and to sandwich a part of the semiconductor layer, and formed of a metal or a silicide, a tunnel layer formed on the part of the semiconductor layer sandwiched between the pair of conductor regions, a charge storage layer formed on the tunnel layer, a second insulating layer formed on the charge storage layer, and a control gate formed on the second insulating layer.
1. A non-volatile semiconductor storage device comprising:
a substrate;
a first insulating layer formed on the substrate;
a semiconductor layer formed of polysilicon on the first insulating layer;
a pair of conductor regions formed on the first insulating layer to pass through the semiconductor layer and to sandwich a part of the semiconductor layer which includes a channel region, and formed of a metal or a silicide;
a tunnel layer formed on the part of the semiconductor layer sandwiched between the pair of conductor regions;
a charge storage layer formed on the tunnel layer;
a second insulating layer formed on the charge storage layer; and
a control gate formed on the second insulating layer,
wherein an average particle diameter of silicon-grains forming the semiconductor layer below the charge storage layer is less than a length of the charge storage layer in a direction along which the pair of conductor regions face each other, and the channel region includes at least one grain boundary intercepting a current path of the channel region.
2. The device according to claim 1 ,
wherein a length of the charge storage layer is equal to or less than 30 nm.
3. The device according to claim 1 , further comprising a pair of impurity regions which are interposed between the pair of conductor regions and the semiconductor region below the charge storage layer and in which an impurity having the same polarity as that of the semiconductor region is dosed.
4. The device according to claim 1 , further comprising a pair of impurity regions which are interposed between the pair of conductor regions and the semiconductor region below the charge storage layer and in which an impurity having a polarity opposite to that of the semiconductor region is dosed.
5. The device according to claim 1 ,
wherein the metal forming the pair of conductor regions contains at least one selected from the group consisting of Ni, Co, W, Ta, Pt, Mo, Ti, Cu, and Al.
6. The device according to claim 1 ,
wherein the silicide forming the pair of conductor regions contains at least one selected from the group consisting of Ni, Co, W, Ta, Pt, Mo, and Ti.
7. A non-volatile semiconductor storage device having a NAND structure which includes a plurality of elements each of which is constituted of the non-volatile semiconductor storage device according to claim 1 , and in which the plurality of elements are connected in series in a string form in such a manner that the elements adjacent to each other share one of the pair of conductor regions.
8. A non-volatile semiconductor storage device comprising:
a substrate;
a first insulating layer formed on the substrate;
a semiconductor layer formed of polysilicon on the first insulating layer;
a pair of conductor regions formed on the first insulating layer to pass through the semiconductor layer and to sandwich a part of the semiconductor layer, and formed of a metal or a silicide;
a tunnel layer formed on the part of the semiconductor layer sandwiched between the pair of conductor regions;
a charge storage layer formed on the tunnel layer;
a second insulating layer formed on the charge storage layer;
a control gate formed on the second insulating layer; and
a pair of impurity regions which are interposed between the pair of conductor regions and the semiconductor region below the charge storage layer and in which an impurity having the same polarity as that of the semiconductor region is dosed.
9. The device according to claim 8 , wherein an average particle diameter of the silicon-grains forming the semiconductor layer below the charge storage layer, which is a channel region, is less than a length of the charge storage layer in a direction along which the pair of conductor regions face each other, and the channel region includes at least one grain boundary intercepting a current path of the channel region.
10. The device according to claim 8 , wherein a length of the charge storage layer is equal to or less than 30 nm.
11. The device according to claim 8 , wherein the metal forming the pair of conductor regions contains at least one selected from the group consisting of Ni, Co, W, Ta, Pt, Mo, Ti, Cu, and Al.
12. The device according to claim 8 , wherein the silicide forming the pair of conductor regions contains at least one selected from the group consisting of Ni, Co, W, Ta, Pt, Mo, and Ti.
13. A non-volatile semiconductor storage device having an NAND structure which includes a plurality of elements each of which is constituted of the non-volatile semiconductor storage device according to claim 8 and in which the plurality of elements are connected in series in a string form in such a manner that the elements adjacent to each other share one of the pair of conductor regions.