Scanning microscope and method for examining a sample by using scanning microscopy

1. A scanning microscope, comprising:

a light source for generating an illumination light beam,

a beam deflection apparatus for guiding solely the illumination light beam via an illumination light path over and/or through a sample,

at least one objective for focusing the illumination light beam onto and/or into the sample,

means for generating a manipulation illumination pattern,

means for imaging the manipulation illumination pattern onto and/or into the sample via a manipulation light path, and

a detection device for receiving detected light emanating from the sample,

wherein the manipulation light path is arranged for omitting the beam deflection apparatus,

wherein the manipulation light path is separate from the illumination light path, and

wherein the means for generating a manipulation illumination pattern comprises a liquid crystal display element.

2. The scanning microscope according to claim 1 , wherein the detection device is adapted for receiving detected light emanating from individual scan points of the sample; and wherein the image of the manipulation illumination pattern encompasses several scan points.

3. The scanning microscope according to claim 1 , wherein the means for generating a manipulation illumination pattern comprises at least one laser.

4. The scanning microscope according to claim 1 , wherein the manipulation illumination pattern and a focus of the illumination light beam are imageable into the same plane.

5. The scanning microscope according to claim 1 , wherein the manipulation illumination pattern is adapted to provide at least one of the following: bleaching the sample, optically exiting the sample, triggering induced emission, triggering a release of bound dyes, and inducing photoactivation.

6. The scanning microscope according to claim 1 , wherein the scanning microscope is a confocal scanning microscope.

7. A scanning microscope, comprising:

a light source for generating an illumination light beam,

a beam deflection apparatus for guiding solely the illumination light beam via an illumination light path over and/or through a sample,

at least one objective for focusing the illumination light beam onto and/or into the sample,

means for generating a manipulation illumination pattern,

means for imaging the manipulation illumination pattern onto and/or into the sample via a manipulation light path, and

a detection device for receiving detected light emanating from the sample,

wherein the manipulation light path is arranged for omitting the beam deflection apparatus,

wherein the manipulation light path is separate from the illumination light path,

wherein the scanning microscope comprises an intermediate image plane, and

wherein the manipulation illumination pattern is imageable into the intermediate image plane.

8. The scanning microscope according to claim 7 , wherein the means for generating a manipulation illumination pattern comprises a laser array.

9. The scanning microscope according to claim 7 , wherein the means for generating a manipulation illumination pattern comprises an addressable fiber bundle.

10. The scanning microscope according to claim 7 , further comprising incoupling means reflecting the illumination light beam and allowing the light emanating from the means for generating a manipulation illumination pattern to pass at least in part or incoupling means allowing the illumination light beam to pass at least in part, and reflecting the light emanating from the means for generating manipulation illumination pattern.

11. The scanning microscope according to claim 10 , wherein the incoupling means comprises a mirror.

12. The scanning microscope according to claim 10 , wherein the incoupling means comprises a beam splitter.

13. The scanning microscope according to claim 10 , wherein the incoupling means comprises a filter.

14. The scanning microscope according to claim 10 , wherein the incoupling means comprises photonic crystals or diffractive optics.

15. A scanning microscope, comprising:

a light source for generating an illumination light beam,

a beam deflection apparatus for guiding solely the illumination light beam via an illumination light path over and/or through a sample,

at least one objective for focusing the illumination light beam onto and/or into the sample,

means for generating a manipulation illumination pattern,

means for imaging the manipulation illumination pattern onto and/or into the sample via a manipulation light path,

incoupling means allowing the illumination light beam to pass at least in part, and reflecting the light emanating from the means for generating a manipulation illumination pattern, and

a detection device for receiving detected light emanating from the sample,

wherein the manipulation light path is arranged for omitting the beam deflection apparatus,

wherein the manipulation light path is separate from the illumination light path,

wherein the imaging means comprises at least one objective,

wherein the manipulation illumination pattern is imageable through the at least one objective,

wherein the incoupling means comprises a prism or a grating, and

wherein the means for generating a manipulation illumination pattern comprises a liquid crystal display element or wherein the scanning microscope comprises an intermediate image plane and the manipulation illumination pattern is imageable into the intermediate image plane.

16. A method for examination of a sample by scanning microscopy, comprising the steps of:

guiding an illumination light beam of a light source over and/or through the sample via an illumination light path by using a beam deflection apparatus;

focusing the illumination light beam onto and/or into the sample by using at least one objective;

generating a manipulation illumination pattern by using means for generating a manipulation illumination pattern;

imaging the manipulation illumination pattern onto and/or into the sample via a manipulation light path by using imaging means; and

detecting detected light emanating from the sample by using a detection device;

wherein the manipulation light path is arranged for omitting the beam deflection apparatus,

wherein the manipulation light path is separate from the illumination light path, and

wherein the means for generating a manipulation illumination pattern comprises a liquid crystal display element.

17. The method according to claim 16 , further comprising the steps of:

acquiring a preview image;

selecting a manipulation region from the preview image; and

imaging the manipulation illumination pattern onto the manipulation region.

18. The method according to claim 16 , wherein the detection device is adapted for receiving detected light emanating from individual scan points of the sample; and wherein the image of the manipulation illumination pattern encompasses several scan points.

19. The method according to claim 16 , wherein the means for generating a manipulation illumination pattern comprises at least one laser.

20. The method according to claim 16 , wherein the manipulation illumination pattern and a focus of the illumination light beam are imageable into the same plane.

21. The method according to claim 16 , wherein the manipulation illumination pattern is adapted to provide at least one of the following: bleaching the sample, optically exiting the sample, triggering induced emission, inducing photoactivation, and releasing components by means of light.

22. A method for examination of a sample by scanning microscopy, comprising the steps of:

guiding an illumination light beam of a light source over and/or through the sample via an illumination light path by using a beam deflection apparatus;

focusing the illumination light beam onto and/or into the sample by using at least one objective;

generating a manipulation illumination pattern by using means for generating a manipulation illumination pattern;

imaging the manipulation illumination pattern onto and/or into the sample via a manipulation light path by using imaging means; and

detecting detected light emanating from the sample by using a detection device;

wherein the manipulation light path is arranged for omitting the beam deflection apparatus,

wherein the manipulation light path is separate from the illumination light path,

wherein the scanning microscope comprises an intermediate image plane,

and wherein the manipulation illumination pattern is imageable into the intermediate image plane.

23. The method according to claim 22 , wherein the means for generating a manipulation illumination pattern comprises a laser diode array.

24. The method according to claim 22 , wherein the means for generating a manipulation illumination pattern comprises an addressable fiber bundle.

25. The method according to claim 22 , further comprising the step of incoupling light emanating from the means for generating a manipulation illumination pattern by using an incoupling means allowing the light emanating from the means for generating a manipulation illumination pattern to pass at least in part and reflecting the illumination light beam or an incoupling means allowing the illumination light beam to pass at least in part and reflecting light emanating from the means for generating a manipulation illumination pattern.

26. The method according to claim 25 , wherein the incoupling means contains a mirror.

27. The method according to claim 25 , wherein the incoupling means comprises a beam splitter.

28. The method according to claim 25 , wherein the incoupling means comprises a filter.

29. The method according to claim 25 , wherein the incoupling means comprises photonic crystals or diffractive optics.

30. A method for examination of a sample by scanning microscopy, comprising the steps of:

guiding an illumination light beam of a light source over and/or through the sample via an illumination light path by using a beam deflection apparatus;

focusing the illumination light beam onto and/or into the sample by using at least one objective;

generating a manipulation illumination pattern by using means for generating a manipulation illumination pattern;

imaging the manipulation illumination pattern onto and/or into the sample via a manipulation light path by using imaging means;

detecting detected light emanating from the sample by using a detection device; and

incoupling light emanating from the means for generating a manipulation illumination pattern by using an incoupling means allowing the illumination light beam to pass at least in part and reflecting light emanating from the means for generating a manipulation illumination pattern;

wherein the manipulation light path is arranged for omitting the beam deflection apparatus,

wherein the manipulation light path is separate from the illumination light path,

wherein the imaging means comprise at least one objective,

wherein the manipulation illumination pattern is imageable through the at least one objective,

wherein the incoupling means comprises a prism, and

wherein the means for generating a manipulation illumination pattern comprises a liquid crystal display element or wherein the scanning microscope comprises an intermediate image plane and the manipulation illumination pattern is imageable into the intermediate image plane.