Contact device to contact an electrical test specimen to be tested and a corresponding contact process

1. A contacting device for contacting an electrical test piece to be tested, the test piece provided with contacts, the contacting device comprising:

at least two guide elements having openings through which contact elements pass generally axially and which project from the test piece on a side of the associated guide element facing the test piece for contacting the test piece;

wherein at least one of an axial distance between the guide elements and an axial position of the guide element facing the test piece may be adjusted to fit the projecting length;

wherein the axial distance is adjusted by at least one spacer selected from a group including a removable spacer and a generally radially displaceable spacer;

wherein the removable spacer has a frame-like design or is composed of frame parts;

wherein the frame-like design is provided as a frame configuration that is open on at least one side.

2. The contacting device according to claim 1 , wherein removal of the at least one removable spacer reduces the axial distance between the guide elements.

3. The contacting device according to claim 1 , wherein a thickness of the at least one spacer is changeable.

4. The contacting device according to claim 1 , wherein the at least one spacer includes a plurality of spacers which are individually removable.

5. The contacting device according to claim 4 , wherein the stacked spacers are rotationally offset relative to one another about an axial axis.

6. A method for contacting an electrical test piece to be tested, the method comprising:

providing a contacting device having at least two guide elements with openings through which contact elements pass generally axially and which project from the test piece on a side of the associated guide element facing the test piece for contacting the test piece;

positioning at least one removable spacer between the at least two guide elements, the at least one removable spacer having a frame-like design that is open on at least one side; and

removing a first spacer of the at least one removable spacers to adjust at least one of an axial distance between the guide elements and an axial position of the guide element facing the test piece.

7. The method according to claim 6 , wherein positioning includes positioning a plurality of removable spacers.

8. The method according to claim 7 , further comprising stacking the plurality of removable spacers.

9. The method according to claim 8 , further comprising rotationally offsetting the plurality of removable spacers relative to one another about an axial axis.

10. A contacting device for contacting an electrical test piece to be tested comprising:

at least two guide elements having openings through which contact elements pass generally axially and which project from the test piece on a side of the associated guide element facing the test piece for contacting the test piece;

wherein at least one of an axial distance between the guide elements and an axial position of the guide element facing the test piece may be adjusted to fit the projecting length;

wherein the axial distance is adjusted by at least one spacer selected from a group including a removable spacer and a generally radially displaceable spacer;

wherein the removable spacer has a frame-like design or is composed of frame parts;

wherein the frame-like design is formed by U-shaped frame parts.

11. The contacting device according to claim 10 , wherein the at least one spacer includes a plurality of spacers.

12. The contacting device according to claim 11 , wherein the plurality of spacers are stacked.

13. The contacting device according to claim 12 , wherein the plurality of stacked spacers are rotationally offset relative to one another about an axial axis.