IP Library Granted Patent US 7,820,968
Granted Patent B2
US 7,820,968 · App. 12/219,761 · Granted Oct 26, 2010

Image acquisition apparatus, conversion apparatus and image acquisition method

Assignee: Hitachi Maxell, Ltd.
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Quick Facts
Patent No.
US 7,820,968
App. No.
12/219,761
Granted
Oct 26, 2010
Kind
B2
Abstract

An image acquisition apparatus acquires an image indicating an intensity distribution of infrared light. The image acquisition apparatus includes a conductive thin film, a dielectric layer placed on the thin film, a base to support the thin film and the dielectric layer in this order on a principal surface, a light source to emit light to an interface between the thin film and the base, and an image pickup device to receive light reflected on the interface between the thin film and the base.

Claims (73)

1. An image acquisition apparatus for acquiring an image indicating an intensity distribution of infrared light, comprising:

a conductive thin film;

a dielectric layer placed on the conductive thin film;

a base to support the conductive thin film and the dielectric layer in this order on a principal surface;

a light source to emit light to an interface between the conductive thin film and the base; and

an image pickup device to receive light reflected on the interface between the conductive thin film and the base.

2. The image acquisition apparatus according to claim 1 , further comprising:

an infrared light absorbing layer placed on the dielectric layer.

3. The image acquisition apparatus according to claim 2 , further comprising:

a filter placed above the infrared light absorbing layer, to transmit externally incident infrared light and block externally incident light having a wavelength different from a desired wavelength.

4. The image acquisition apparatus according to claim 3 , further comprising:

a support member to hold the filter in an opening and have a light shielding portion to partially prevent externally incident infrared light from entering the infrared light absorbing layer.

5. The image acquisition apparatus according to claim 2 , further comprising:

a light shielding member placed above the infrared light absorbing layer, to partially prevent externally incident infrared light from entering the infrared light absorbing layer.

6. The image acquisition apparatus according to claim 2 , wherein

the infrared light absorbing layer is divided into a plurality of pieces by a plurality of grooves extending substantially parallel to the principal surface of the base.

7. The image acquisition apparatus according to claim 1 , further comprising:

a plurality of condenser lenses.

8. The image acquisition apparatus according to claim 1 , wherein

the dielectric layer is divided into a plurality of pieces by a plurality of grooves extending substantially parallel to the principal surface of the base.

9. The image acquisition apparatus according to claim 1 , wherein

the conductive thin film is divided into a plurality of pieces by a plurality of grooves extending substantially parallel to the principal surface of the base.

10. The image acquisition apparatus according to claim 1 , further comprising:

a lens to parallelize light emitted from the light source.

11. The image acquisition apparatus according to claim 10 , further comprising:

a polarizer to output light in a predetermined polarized state based on input of light emitted from the light source.

12. The image acquisition apparatus according to claim 1 , wherein

the base includes:

a flat-plate substrate having a first surface corresponding to the principal surface and a second surface opposite to the first surface, and

a plurality of projecting portions placed on the second surface of the substrate, and

each of the plurality of projecting portions has a light input surface for input of light emitted from the light source and a light output surface for output of light reflected from the interface.

13. An image acquisition apparatus for acquiring an image indicating an intensity distribution of externally incident infrared light, comprising:

a conductive thin film;

a dielectric layer placed on the conductive thin film, where a dielectric constant distribution is generated corresponding to an intensity distribution of the infrared light based on input of the infrared light;

a base to support the conductive thin film and the dielectric layer in this order on a principal surface;

a light source to emit light to an interface between the conductive thin film and the base; and

an image pickup device to receive light reflected on the interface between the conductive thin film and the base and having a light intensity distribution corresponding to the dielectric constant distribution.

14. An image acquisition apparatus for acquiring an image indicating an intensity distribution of infrared light, comprising:

a conductive thin film;

a dielectric layer placed on the conductive thin film;

a base to support the conductive thin film and the dielectric layer in this order on a principal surface; and

an image pickup device to receive light reflected on a interface between the conductive thin film and the base.

15. An image acquisition apparatus comprising:

a laminate including a heat ray absorbing layer laminated on a dielectric layer formed by attaching conductive particles to a surface of a dielectric;

a light source to emit light to be incident on the laminate; and

an image pickup unit to receive light emitted from the light source and intensity-modulated by the dielectric layer and to capture an image corresponding to an intensity distribution of a heat ray incident on the laminate.

16. The image acquisition apparatus according to claim 15 , wherein

the laminate is divided into a plurality of island portions arranged two-dimensionally by a plurality of grooves cut to depth in a lamination direction of the laminate.

17. The image acquisition apparatus according to claim 16 , further comprising:

a supporting member to support the laminate, the supporting member including:

a heat insulating layer to support the laminate on a principal surface, and

a supporting substrate with the heat insulating layer placed on a principal surface.

18. The image acquisition apparatus according to claim 17 , wherein

the supporting substrate has a plurality of openings in positions corresponding to the plurality of island portions.

19. The image acquisition apparatus according to claim 15 , wherein

the laminate further includes a light reflecting layer placed between the heat ray absorbing layer and the dielectric layer, to reflect light emitted from the light source.

20. The image acquisition apparatus according to claim 15 , wherein

the dielectric layer is formed by flocculating dielectrics in particle form with the conductive particles attached to surfaces.

21. A conversion apparatus comprising:

a dielectric layer formed by attaching conductive particles to a surface of a dielectric;

a heat ray absorbing layer to absorb a heat ray; and

a supporting member with at least the dielectric layer and the heat ray absorbing layer laminated on a principal surface.

22. The conversion apparatus according to claim 21 , wherein

the laminate formed by lamination of at least the dielectric layer and the heat ray absorbing layer is divided into a plurality of island portions arranged two-dimensionally by a plurality of grooves cut to depth in a lamination direction of the laminate.

23. The conversion apparatus according to claim 22 , wherein

the supporting member includes:

a heat insulating layer with the laminate placed on a principal surface, and

a supporting substrate with the heat insulating layer placed on a principal surface.

24. The conversion apparatus according to claim 23 , wherein

the supporting substrate has a plurality of openings in positions corresponding to the plurality of island portions.

25. An image acquisition method for acquiring an image indicating an intensity distribution of a heat ray, comprising:

applying light to a laminate including a heat ray absorbing layer laminated on a dielectric layer formed by attaching conductive particles to a surface of a dielectric; and

receiving light intensity-modulated by the dielectric layer and capturing an image corresponding to an intensity distribution of a heat ray incident on the laminate.

Assignments (4)
CHANGE OF NAME Recorded Dec 3, 2021
From: MAXELL HOLDINGS, LTD.
To: MAXELL, LTD.
Reel/Frame 058666/0407 →
MERGER Recorded Nov 29, 2021
From: MAXELL, LTD.
To: MAXELL HOLDINGS, LTD.
Reel/Frame 058255/0579 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 25, 2018
From: HITACHI MAXELL, LTD.
To: MAXELL, LTD.
Reel/Frame 045142/0208 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 21, 2008
From: SAKEMOTO, AKITO; ONUKI, SATORU
To: HITACHI MAXELL, LTD.
Reel/Frame 021723/0956 →
Priority Claims (2)
JP 2007-209548 · Aug 10, 2007 · national
JP 2008-176510 · Jul 7, 2008 · national
Continuity (1)
Related Publication 20090078873A1 · Mar 26, 2009