Apparatus and method for measuring surface topography of an object
An apparatus for measuring surface topography of an object includes an optical arrangement capable of directing a first light beam at a surface of the object, providing a second light beam coherent with and spatially phase-shifted relative to the first light beam, and generating an interference beam from the second light beam and a reflection of the first light beam from the surface of the object. The apparatus further includes at least one line scan sensor for detecting and measuring the interference beam.
1. An apparatus for measuring surface topography of an object, comprising:
an optical arrangement capable of (i) directing a first light beam at a surface of the object, (ii) providing a second light beam coherent with and spatially phase-shifted relative to the first light beam, and (iii) generating an interference beam from the second light beam and a reflection of the first light beam from the surface of the object;
at least one line scan sensor for detecting and measuring the interference beam; and
at least one spatial phase shifter optically coupled to the at least one line scan sensor for interrogating the interference beam at different phase delays, wherein the at least one spatial phase shifter is a linear pixelated phase mask comprising a linear arrangement of polarization elements.
2. The apparatus of claim 1 , further comprising a light source capable of providing a source light beam with a coherence length less than twice an optical thickness of the object.
3. The apparatus of claim 2 , wherein the optical arrangement includes a beam splitter capable of splitting the source light beam into the first light beam and the second light beam.
4. The apparatus of claim 3 , wherein the optical arrangement includes a reference surface which interacts with the second light beam.
5. The apparatus of claim 2 , wherein the optical arrangement further comprises a beam shaper capable of shaping the source light beam into a substantially linear beam.
6. The apparatus of claim 1 , wherein the polarization elements are arranged in a repeating pattern and the polarization elements in each repeating pattern have different polarization angles.
7. The apparatus of claim 1 , which comprises a plurality of independent line scan sensors.
8. The apparatus of claim 7 , comprising a plurality of spatial phase shifters optically coupled to the plurality of line scan sensors for interrogating the interference beam at different phase delays.
9. The apparatus of claim 8 , further comprising an optical module for making copies of the interference beam such that a copy of the interference beam is received at each spatial phase shifter.
10. The apparatus of claim 1 , further comprising a mechanism for moving the optical arrangement and the at least one line scan sensor relative to the surface of the object.
11. The apparatus of claim 1 , further comprising a data acquisition module for collecting data from the at least one line scan sensor and processing the data to reconstruct the surface topography.
12. A method of measuring surface topography of an object, comprising:
directing a first light beam at the surface of the object;
providing a second light beam coherent with and spatially phase-shifted relative to the first light beam;
producing an interference beam from the second light beam and a reflection of the first light beam from the surface of the object;
making multiple copies of the interference beam;
passing each copy of the interference beam through one of a plurality of spatial phase splitters; and
detecting and measuring the copies of the interference beam using a plurality of line scan sensors associated with the plurality of spatial phase splitters.