IP Library › Granted Patent US 7,825,569
Granted Patent B2
US 7,825,569 · App. 12/385,539 · Granted Nov 2, 2010

Ceramic and method of manufacturing the same, dielectric capacitor, semiconductor device, and element

Assignee: Seiko Epson Corporation
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Quick Facts
Patent No.
US 7,825,569
App. No.
12/385,539
Granted
Nov 2, 2010
Kind
B2
Abstract

A method of manufacturing a ceramic includes forming a film which includes a complex oxide material having an oxygen octahedral structure and a paraelectric material having a catalytic effect for the complex oxide material in a mixed state, and performing a heat treatment to the film, wherein the paraelectric material is one of a layered catalytic substance which includes Si in the constituent elements and a layered catalytic substance which includes Si and Ge in the constituent elements. The heat treatment includes sintering and post-annealing. At least the post-annealing is performed in a pressurized atmosphere including at least one of oxygen and ozone. A ceramic is a complex oxide having an oxygen octahedral structure, and has Si and Ge in the oxygen octahedral structure.

Claims (9)

1. An actuator comprising:

a lower electrode, a ceramic film, and an upper electrode, wherein the ceramic film includes a complex oxide having Si in an oxygen octahedral structure,

wherein the ceramic film further includes a paraelectric oxide having an oxygen tetrahedral structure.

2. The actuator according to claim 1 , wherein at least part of the ceramic film has a column-shaped structure which is continuous between the upper electrode and the lower electrode.

3. The actuator according to claim 2 , wherein a diameter of the column-shaped structure is 1 to 50 nm.

4. The actuator according to claim 1 , wherein the Si in the oxygen octahedral structure has a coordination number of six.

5. The actuator according to claim 1 , wherein the complex oxide has a perovskite structure.

6. The actuator according to claim 1 , wherein the complex oxide has a bismuth-layer structure.

7. The actuator according to claim 1 , wherein the paraelectric oxide has Si in the oxygen tetrahedral structure.

Priority Claims (3)
JP 2001-178840 · Jun 13, 2001 · national
JP 2001-193048 · Jun 26, 2001 · national
JP 2002-086139 · Mar 26, 2002 · national
Continuity (4)
Division 1198797100 · Dec 6, 2007
Continuation 1131499600 · Dec 23, 2005
Continuation 1016670700 · Jun 12, 2002
Related Publication 20090230821A1 · Sep 17, 2009