IP Library Granted Patent US 7,863,105
Granted Patent B2
US 7,863,105 · App. 12/117,087 · Granted Jan 4, 2011

Image sensor package and forming method of the same

Assignee: Advanced Chip Engineering Technology Inc.
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Quick Facts
Patent No.
US 7,863,105
App. No.
12/117,087
Granted
Jan 4, 2011
Kind
B2
Abstract

An image sensor package comprises a substrate, a chip mounted over the substrate. A molding material is formed surrounding the chip to expose a micron lens area, wherein the molding material includes via structure passing there through. A protection layer is formed on the micro lens area to prevent the micro lens. A redistributed conductive layer is formed over the molding material to connect to a pad of the chip. Metal pads are formed on via structure as connecting points with PCB. A cover layer is formed over the substrate to isolate the metal pads.

Claims (18)

1. A method of making an image sensor package, comprising:

providing a chip with a protection layer formed on a micro lens;

filling a molding material surrounding said chip;

providing a substrate mounting on said chip;

forming a first dielectric layer over said molding material and said chip, said first dielectric layer having a first opening and a second opening exposing a micro lens area formed therein;

removing part of said first dielectric layer and said molding material to form a third opening;

forming a redistributed conductive layer over said first dielectric layer to fill into said first opening to connect pad of said chip;

forming a via structure to fill into said third opening;

forming a second dielectric layer over said first dielectric layer and said redistributed conductive layer, said second dielectric layer having a fourth opening exposing said micro lens area;

forming metal pads on said via structure;

forming a cover layer over said substrate.

2. The method claim 1 , wherein said first opening and said second opening is formed by employing a lithography process and an etching process.

3. The method claim 1 , wherein said third opening is formed by employing a lithography process and an etching process.

4. The method claim 1 , wherein said third opening is formed by employing a laser drilling process.

5. The method claim 1 , wherein said redistributed conductive layer is formed by employing an electro-plating process.

6. The method claim 1 , wherein said via structure is formed by employing an electro-plating process.

7. The method claim 1 , wherein said fourth opening is formed by employing a lithography process and an etching process.

8. The method claim 1 , further comprising a step of performing a half etching process of said substrate.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 5, 2024
From: ADL ENERGY CORP.
To: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
Reel/Frame 066387/0450 →
CHANGE OF NAME Recorded Jan 11, 2024
From: ADL ENGINEERING INC.
To: ADL ENERGY CORP.
Reel/Frame 066270/0406 →
MERGER Recorded Jan 4, 2024
From: ADL ENGINEERING INC.; ADVANCED CHIP ENGINEERING TECHNOLOGY INC.
To: ADL ENGINEERING INC.
Reel/Frame 066013/0296 →
Continuity (2)
Division 1160826600 · Dec 8, 2006
Related Publication 20080206918A1 · Aug 28, 2008