Test lead probe with retractable insulative sleeve

1. A test probe, comprising:

a conductive member having a main section and a first end, the first end being defined by an electrically conductive tip;

an insulative member surrounding a portion of the main section of the conductive member; and

an insulative sleeve positioned between the insulative member and the conductive member, the insulative sleeve mechanically coupled to the insulative member to cause axial movement of the insulative sleeve relative to the conductive member and insulative member responsive to rotating the insulative member relative to the insulative sleeve.

2. The test probe of claim 1 wherein the mechanical coupling includes a protrusion on an inner surface of the insulative member aligned with a slot on the insulative sleeve.

3. The test probe of claim 2 wherein rotating the insulative member causes the protrusion to move the insulative sleeve from a first position to a second position.

4. The test probe of claim 2 wherein the slot has a first recess at a first end and a second recess at a second end.

5. The test probe of claim 4 wherein when the protrusion is positioned in the first recess or the second recess, a greater force is required to rotate the insulative member relative to the insulative sleeve than when the protrusion is positioned in the slot.

6. The test probe of claim 1 wherein the insulative member has an opening aligned with a label portion on a second insulative member, the label portion describing the length of the conductive member that is exposed from an end of the insulative sleeve or the category safety rating for the length of the conductive member that is exposed from the end of the insulative sleeve.

7. A test probe, comprising:

an insulative member having an opening at a first end, an inner surface of the insulative member including at least one protrusion;

an insulative sleeve positioned within the opening of the insulative member, the insulative sleeve having at least one slot aligned with a respective one of the at least one protrusions;

a conductive member extending from a first end of the insulative sleeve, the conductive member having an electrically conductive tip defining a first end, the insulative member and insulative sleeve configured to cause the insulative sleeve to slide relative to the conductive member responsive to rotating the insulative member relative to the insulative sleeve.

8. The test probe of claim 7 wherein the at least one slot is a helix.

9. The test probe of claim 8 wherein the helix includes a first recess at a first end and a second recess at a second end.

10. The test probe of claim 9 wherein the insulative sleeve locks relative to the conductive member when the at least one protrusion is positioned within the respective first or second recess.

11. The test probe of claim 10 wherein a first length of the conductive member extends from the insulative sleeve when the at least one protrusion is positioned in the first recess and a second length of the conductive member is exposed from the insulative sleeve when the at least one protrusion is positioned in the second recess, the first length being a specific distance from the second length.

12. The test probe of claim 7 wherein the insulative member includes a label portion describing an characteristic of the conductive member extending from the insulative sleeve when the protrusion is positioned in the first detent.

13. The test probe of claim 7 wherein the insulative member includes a label portion describing a category rating for the length of the conductive member exposed from the insulative sleeve when the protrusion is positioned in the first detent.

14. A method for adjusting a length of a probe tip exposed from an insulative sleeve in a test probe, comprising:

providing a first length of the insulative sleeve extending from the test probe; and

altering the length of the insulative sleeve extending from the test probe from the first length to a second length by altering the length of the probe tip exposed from the insulative sleeve, the first and second lengths being determined by physical characteristics in the test probe.

15. The method of claim 14 further comprising indicating that the length of the probe tip exposed from the insulative sleeve is less than a particular length.

16. The method of claim 14 further comprising indicating that the length of the probe tip exposed from the insulative material meets a requirement for a particular application.

17. The method of claim 14 wherein the act of altering the length of the insulative sleeve extending from the test probe comprises rotating a first insulative material relative to a second insulative material to cause the insulative sleeve to move axially relative to the probe tip.

18. The method of claim 17 wherein the physical characteristics in the test probe that alter the length of the insulative sleeve extending from the test probe includes a protrusion on an inner surface of the first insulative material that travels along a helix on an outer surface of the second insulative material.