Optical metrological scale and laser-based manufacturing method therefor
A reflective metrological scale has a metal tape substrate and a scale pattern of elongated side-by-side marks surrounded by reflective surface areas of the substrate. Each mark has a furrowed cross section and may have a depth in the range of 0.5 to 2 microns. The central region of each mark may be rippled and darkened to provide an enhanced optical reflection ratio with respect to surrounding surface areas. A manufacturing method includes the repeated steps of (1) creating a scale mark by irradiating the substrate surface at a mark location with overlapped pulses from a laser, each pulse having an energy density of less than about 1 joule per cm2, and (2) changing the relative position of the laser and the substrate by a displacement amount defining a next mark location on the substrate at which a next mark of the scale is to be created.
1. A reflective scale for a diffractive optical encoder, comprising a metal substrate having a scale pattern formed on a reflective surface thereof, the scale pattern including a plurality of elongated side-by-side marks surrounded by reflective surface areas of the substrate, each mark having a generally furrowed cross section with a central region below a mean height of the surface of the substrate and two outer ridge regions above the mean height of the surface of the substrate, wherein the central and outer ridge regions define a mark depth being in the range of about 0.5 microns to about 2 microns, and wherein the central region of each mark is darkened to provide an optical reflection ratio with respect to the surrounding reflective surface areas of the substrate of about 1:4 or less.
2. A reflective scale according to claim 1 , wherein each mark in its central region has a rippled texture with a ripple height less than about 20% of the mark depth.
3. A reflective scale according to claim 2 , wherein each mark is rippled in its lengthwise direction.
4. A reflective scale according to claim 1 , wherein the metal substrate consists essentially of a metal alloy.
5. A reflective scale according to claim 4 , wherein the metal alloy is a nickel alloy.
6. A reflective scale according to claim 2 , wherein the nickel alloy comprises about 60% nickel, about 20% chromium, about 5% iron, and about 10% molybdenum.
7. A reflective scale according to claim 1 , wherein the marks have elongated side edges being straight to within about 10% of the width of the marks.
8. A reflective scale for a diffractive optical encoder, comprising a metal substrate having a scale pattern formed on a reflective surface thereof, the scale pattern including a plurality of elongated side-by-side marks surrounded by reflective surface areas of the substrate, each mark having a generally furrowed cross section with a central region below a mean height of the surface of the substrate and two outer ridge regions above the mean height of the surface of the substrate, the central and outer ridge regions defining a mark depth being in the range of about 0.5 microns to about 2 microns, each mark in its central region being rippled in the lengthwise direction with a ripple height less than about 20% of the mark depth, the central region of each mark being darkened to provide an optical reflection ratio with respect to the surrounding reflective surface areas of the substrate of about 1:4 or less.
9. A metrology system comprising:
the reflective scale of claim 1 ;
a source of radiant energy adapted to irradiate a plurality of the side by side marks of the reflective scale;
an optical scale reader operative to receive, within a reader field of view, reflected radiant energy from the marks, at least a portion of the reflected radiant energy comprising a plurality of diffracted energy portions that produce a fringe pattern as a result of interference between the diffracted portions, the contrast of the fringes of the pattern being dependent on the optical contrast of the marks relative to the surrounding substrate, the contrast being measurable within the reader field of view;
a displacement mechanism operative to move the scale relative to the reader;
a signal processor operative to produce an output signal representative of the displacement based on a shift of the fringes; and
a system controller operative to accept the output signal and control the operation of the displacement mechanism in response to the output signal.
10. An optical encoder comprising:
the reflective scale of claim 1 ;
a source of radiant energy adapted to irradiate a plurality of the side by side marks of the reflective scale;
an optical scale reader operative to receive, within a reader field of view, reflected radiant energy from the marks, at least a portion of the reflected radiant energy comprising a plurality of diffracted energy portions that produce a fringe pattern as a result of interference between the diffracted portions, the contrast of the fringes of the pattern being dependent on the optical contrast of the marks relative to the surrounding substrate, the contrast being measurable within the reader field of view; and
a signal processor operative to produce an output signal representative of relative movement between the scale and the reader based on a shift of the fringes.