Method for manufacturing ferroelectric memory device and ferroelectric memory device
A method for manufacturing a ferroelectric memory device includes: forming a conductive base layer above a substrate; and laminating above the base layer a first electrode, a ferroelectric layer and a second electrode, wherein, prior to the step of forming the base layer, the method includes forming an active element in the substrate, forming an interlayer dielectric film on the substrate, and forming a contact plug in the interlayer dielectric film, and wherein the step of forming the base layer includes: forming a first conductive layer composed of a conductive material having a self-orienting property on the interlayer dielectric film including the contact plug; planarizing the first conductive layer by a chemical mechanical polishing method thereby forming a planarized first conductive layer that covers the interlayer dielectric film including the contact plug; applying an ammonia plasma process to a surface of the planarized first conductive layer; forming a titanium layer on the planarized first conductive layer treated with the ammonia plasma process; and heat-treating the titanium layer in a nitrogen atmosphere thereby changing the titanium layer to a titanium nitride layer which forms a second conductive layer.
1. A method for manufacturing a ferroelectric memory device, the method comprising:
forming a conductive base layer above a substrate; and
laminating above the base layer a first electrode, a ferroelectric layer and a second electrode,
wherein, prior to the step of forming the base layer, the method includes forming an active element in the substrate, forming an interlayer dielectric film on the substrate, and forming a contact plug in the interlayer dielectric film, and
wherein the step of forming the base layer includes:
forming a first conductive layer composed of a conductive material having a self-orienting property on the interlayer dielectric film including the contact plug;
planarizing the first conductive layer by a chemical mechanical polishing method thereby forming a planarized first conductive layer that covers the interlayer dielectric film including the contact plug;
applying an ammonia plasma process to a surface of the planarized first conductive layer;
forming a titanium layer on the planarized first conductive layer treated with the ammonia plasma process; and
heat-treating the titanium layer in a nitrogen atmosphere thereby changing the titanium layer to a titanium nitride layer which forms a second conductive layer,
wherein the step of forming the first conductive layer includes applying an ammonia plasma process to the surface of the interlayer dielectric film including the contact plug, forming a titanium layer on the interlayer dielectric layer treated with the ammonia plasma process, and heat-treating the titanium layer in a nitrogen atmosphere to be changed to a titanium nitride layer that forms the first conductive layer; and
in the step of forming the first conductive layer, a series of the steps including applying the ammonia plasma process, forming the titanium layer and changing the titanium layer into a titanium nitride layer that forms the first conductive layer is repeated multiple times.
2. A method for manufacturing a ferroelectric memory device according to claim 1 , comprising forming a barrier layer having a barrier property to oxygen as a topmost layer of the base layer.
3. A method for manufacturing a ferroelectric memory device according to claim 2 , wherein the barrier layer is composed of a compound expressed by Ti (1-x) Al x N y (0<x≦0.3, 0<y).