IP Library › Granted Patent US 7,953,249
Granted Patent B2
US 7,953,249 · App. 11/543,623 · Granted May 31, 2011

Fractal S

Assignee: University of Antwerp (UIA)
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Quick Facts
Patent No.
US 7,953,249
App. No.
11/543,623
Granted
May 31, 2011
Kind
B2
Abstract

This invention provides an improved method for evaluating the quality of images using a test S kr -matrix system. The index k refers to the fractal level in an S kr -matrix, having matrices themselves as elements. The index r≦k refers to the Kronecker sub-level to which a typical internal sum structure is present. S kr -matrices can be explained in terms of cognition numbers, basic components, eigenvalues and sine-like eigenvectors. S kr -matrices also form vector spaces in which matrix distances can be properly calculated. The image S kr -quality parameters are derived from an intermediate quasi-S kr -matrix and its best-S kr -approximation in relation to a theoretical reference S kr -matrix. Useful applications are in the field of analogue and digital cameras, scanners, vision sensors, monitors, printers, spectrophotometers, infrared cameras, copying machines, TV-screens, GPS screens, X-rays, Gamma rays, Laser rays, or every other component in the image production and image handling field.

Claims (35)

1. A method of evaluating image quality of an image with a processor, the method comprising:

a) generating an Sk,r-image of an object using an optical device;

b) defining an actual Sk,r-matrix for said generated Sk,r-image, said actual Sk,r-matrix comprising a value for each pixel of the generated Sk,r-image;

c) providing a test matrix system comprising a plurality of reference Sk,r-matrices which define a plurality of corresponding reference Sk,r-images, wherein each reference Sk,r-matrix comprises a value for each pixel of the corresponding reference Sk,r-image, and wherein the reference Sk,r-matrices have an internal Sk,r-matrix structure, wherein k and r are different from zero;

d) selecting one of the reference Sk,r-matrices as a best-fit matrix, the best-fit matrix having a best-fit with the actual Sk,r-matrix; and

e) determining image Sk,r-quality parameters of the generated Sk,r-image based on the best-fit matrix,

wherein the method is performed in conjunction with a processor, and wherein the actual Sk,r-matrix and the reference Sk,r-matrices are formed such that for each matrix, every order with respect to r and with respect to the matrix dimensions spans a unique space.

2. The method according to claim 1 , further comprising selecting a region of interest (ROI) on the generated Sk,r-image for evaluating the image quality of said generated Sk,r-image.

3. The method according to claim 1 , wherein the method further comprises:

correcting the image Sk,r-quality parameters of the generated Sk,r-image such that the generated Sk,r-image more closely fits standard image Sk,r-quality parameters; and

visually displaying the generated Sk,r-image after image correction.

4. The method according to claim 1 , wherein the image Sk,r-quality parameters are corrected by correcting operational parameters of the optical device with a software program based on self-tuning algorithms.

5. The method according to claim 1 , wherein said image comprises a sequence of images.

6. The method according to claim 1 , wherein said test matrix system comprises reference Sk,r-matrices each having only one eigenvalue which differs from zero.

7. The method according to claim 1 , wherein the test matrix system comprises reference Sk,r-matrices which are the Kronecker product of two or more Sk,r-matrices having an internal S k,r sum structure.

8. The method according to claim 1 , further comprising determining image Sk,r-quality parameters of the generated Sk,r-image on a two dimensional basis.

9. The method according to claim 1 , further comprising evaluating optical quality of the optical device.

10. The method according to claim 1 , further comprising calibrating the optical device.

11. The method according to claim 1 , wherein the actual Sk,r-matrix and the reference Sk,r-matrices comprise elements which are matrices.

12. The method according to claim 1 , wherein the image Sk,r-quality parameters of the generated Sk,r-image comprise at least one of gamma factor, sharpness, resolution, brightness, contrast, intensity, gamut, symmetry, color coherence, and radial distortion.

13. A non-transitory computer readable medium comprising instructions, which when executed, cause the computer to perform a method of evaluating image quality of an image with a processor, the method comprising:

a) generating an Sk,r-image of an object using an optical device;

b) defining an actual Sk,r-matrix for said generated Sk,r-image, said actual Sk,r-matrix comprising a value for each pixel of the generated Sk,r-image;

c) providing a test matrix system comprising a plurality of reference Sk,r-matrices which define a plurality of corresponding reference Sk,r-images, wherein each reference Sk,r-matrix comprises a value for each pixel of the corresponding reference Sk,r-image, and wherein the reference Sk,r-matrices have an internal Sk,r-matrix structure, wherein k and r are different from zero;

d) selecting one of the reference Sk,r-matrices as a best-fit matrix, the best-fit matrix having a best-fit with the actual Sk,r-matrix;

e) determining image Sk,r-quality parameters of the generated Sk,r-image based on the best-fit matrix; and

f) generating a report of the image Sk,r-quality parameters of the generated Sk,r-image,

wherein the actual Sk,r-matrix and the reference Sk,r-matrices are formed such that for each matrix, every order with respect to r and with respect to the matrix dimensions spans a unique space.

14. A method of evaluating image quality of an image with a processor, the method comprising:

defining an actual Sk,r-matrix for a generated Sk,r-image, said actual Sk,r-matrix comprising a value for each pixel of the generated Sk,r-image;

providing a test matrix system comprising a plurality of reference Sk,r-matrices which define a plurality of corresponding reference Sk,r-images, wherein each reference Sk,r-matrix comprises a value for each pixel of the corresponding reference Sk,r-image, and wherein the reference Sk,r-matrices have an internal Sk,r-matrix structure, wherein k and r are different from zero;

selecting one of the reference Sk,r-matrices as a best-fit matrix, the best-fit matrix having a best-fit with the actual Sk,r-matrix;

determining image Sk,r-quality parameters of the generated Sk,r-image based on the best-fit matrix; and

generating a report of the image Sk,r-quality parameters of the generated Sk,r-image,

wherein the method is performed in conjunction with a processor, and wherein the actual Sk,r-matrix and the reference Sk,r-matrices are formed such that for each matrix, every order with respect to r and with respect to the matrix dimensions spans a unique space.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 1, 2009
From: MERTENS, LUC
To: ANTWERP (UIA), UNIVERSITY OF
Reel/Frame 023321/0155 →
Priority Claims (1)
WO PCT/EP2004/003894 · Apr 13, 2004 · international
Continuity (2)
Continuation PCTEP2005003889 · Apr 13, 2005
Related Publication 20070184373A1 · Aug 9, 2007