Manufacture method of a multilayer structure having non-polar a-plane {11-20} III-nitride layer
A manufacture method of a multilayer structure having a non-polar a-plane {11-22} III-nitride layer includes forming a nucleation layer on a r-plane substrate, wherein the nucleation layer is composed of multiple nitride layers; and forming a non-polar a-plane {11-20} III-nitride layer on the nucleation layer. The nucleation layer features reduced stress, reduced phase difference of lattice, blocked elongation of dislocation, and reduced density of dislocation. Thus, the non-polar a-plane {11-20} III-nitride layer with flat surface can be formed.
1. A manufacture method of a multilayer structure having a non-polar III-nitride layer, comprising the steps of:
providing a substrate;
forming a plurality of nucleation layers on the substrate; and
forming a non-polar III-nitride layer on the nucleation layers, wherein each of the nucleation layers is independently made of nitride having formula (I) shown below:
A x B 1-x N (I)
in which A and B are different elements selected from B, Al, Ga, In and Tl, and 0≦x≦1, wherein the formation of the nucleation layers comprises the steps of forming a first nucleation layer at 1000-1200° C. and a second nucleation layer at 700-900° C. on the substrate in sequence, the first and second nucleation layers being made of aluminum nitride.
2. The manufacture method of a multilayer structure having a non-polar III-nitride layer of claim 1 , further comprising forming a third nucleation layer at 1000-1200° C. after formation of the second nucleation layer, the third nucleation layer being made of aluminum nitride.
3. The manufacture method of a multilayer structure having a non-polar III-nitride layer of claim 1 , wherein the substrate is an r-plane substrate, and the non-polar III-nitride layer is a non-polar a-plane {11-20} III-nitride layer.
4. The manufacture method of a multilayer structure having a non-polar III-nitride layer of claim 1 , further comprising forming an aluminum gallium nitride layer after formation of the nucleation layers to sandwich the aluminum gallium nitride layer in between the nucleation layers and the non-polar III-nitride layer, the aluminum gallium nitride having formula (I):
A x B 1-x N (I)
wherein A is Al, B is Ga, and 0.1≦x≦0.9.
5. The manufacture method of a multilayer structure having a non-polar III-nitride layer of claim 1 , wherein the nucleation layers are formed at a pressure of 50-150 torr.
6. The manufacture method of a multilayer structure having a non-polar III-nitride layer of claim 5 , wherein epitaxial V/III ratio of the nucleation layers is 1000-1800.
7. The manufacture method of a multilayer structure having a non-polar III-nitride layer of claim 1 , wherein the non-polar III-nitride layer is non-polar a-plane {11-20} gallium nitride.
8. The manufacture method of a multilayer structure having a non-polar III-nitride layer of claim 1 , wherein the non-polar III-nitride layer is formed at 1000-1200° C.
9. The manufacture method of a multilayer structure having a non-polar III-nitride layer of claim 8 , wherein the non-polar III-nitride layer is formed at a pressure of 50-150 torr.
10. The manufacture method of a multilayer structure having a non-polar III-nitride layer of claim 9 , wherein epitaxial V/III ratio of the nucleation layers is 700-1600.
11. The manufacture method of a multilayer structure having a non-polar III-nitride layer of claim 1 , wherein the substrate is sapphire, gallium nitride, zinc oxide or silicon carbide.
12. A multilayer structure having a non-polar III-nitride layer, comprising:
a substrate;
a plurality of nucleation layers formed on the substrate; and
a non-polar III-nitride layer formed on the nucleation layers so as to sandwich the nucleation layers in between the substrate and the non-polar III-nitride layer, wherein each of the nucleation layers is independently made of nitride having formula (I) shown below:
A x B 1-x N (I)
in which A and B are different elements selected from B, Al, Ga, In and Tl, and 0≦x≦1, wherein the nucleation layers comprise a first nucleation layer formed at 1000-1200° C. and a second nucleation layer formed at 700-900° C. on the substrate in sequence, the first and second nucleation layers being made of aluminum nitride.
13. The multilayer structure having a non-polar III-nitride layer of claim 12 , further comprising a third nucleation layer formed at 1000-1200° C. and made of aluminum nitride so as to sandwich the second nucleation layer in between the first nucleation layer and the third nucleation layer.
14. The multilayer structure having a non-polar III-nitride layer of claim 12 , wherein the substrate is an r-plane substrate, and the III-nitride layer is a non-polar a-plane {11-20} III-nitride layer.
15. The multilayer structure having a non-polar III-nitride layer of claim 12 , further comprising an aluminum gallium nitride layer sandwiched in between the nucleation layers and the non-polar III-nitride layer, the aluminum gallium nitride having formula (I):
A x B 1-x N (I)
wherein A is Al, B is Ga, and 0.1≦x≦0.9.
16. The multilayer structure having a non-polar III-nitride layer of claim 12 , wherein the non-polar III-nitride layer is non-polar a-plane {11-20} gallium nitride.
17. The multilayer structure having a non-polar III-nitride layer of claim 12 , wherein the substrate is sapphire, gallium nitride, zinc oxide or silicon carbide.