IP Library Granted Patent US 7,989,909
Granted Patent B2
US 7,989,909 · App. 12/329,814 · Granted Aug 2, 2011

Image sensor module and method of manufacturing the same

Assignee: Hynix Semiconductor Inc.
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Quick Facts
Patent No.
US 7,989,909
App. No.
12/329,814
Granted
Aug 2, 2011
Kind
B2
Abstract

An image sensor module includes a semiconductor chip. Photodiode units are disposed in an active region of the semiconductor chip to convert light into electric signals. Pads are disposed in a peripheral region formed around the active region and the pads are electrically connected to the photodiode units. A connecting region is formed around the peripheral region. Re-distribution layers are electrically connected to respective pads and extend to the connecting region. A transparent substrate covers the photodiode units and the pads and exposes at least a portion of the re-distribution layers. Connecting layers are electrically connected to the respective re-distribution layers and extend to a top surface of the transparent substrate. Connecting members are connected to the respective connecting layers disposed on the top surface of the transparent substrate.

Claims (43)

1. An image sensor module, comprising:

a semiconductor chip comprising:

photodiode units disposed in an active region converting light into electric signals;

pads disposed in a peripheral region formed around the active region and electrically connected to the photodiode units; and

a connecting region formed around the peripheral region;

re-distribution layers electrically connected to the pads and extended to the connecting region;

a transparent substrate covering the photodiode units and the pads, wherein at least a portion of each of the re-distribution layers is exposed from the transparent substrate;

connecting layers electrically connected to the re-distribution layers and extended to a top surface of the transparent substrate; and

connecting members electrically connected to the connecting layers disposed on the top surface of the transparent substrate.

2. The image sensor module according to claim 1 , wherein each of the photodiode units comprises:

a photodiode converting light into electric signals;

a driving unit having a driving transistor driving the photodiode;

a color filter disposed over the photodiode; and

a condensing member disposed over the color filter.

3. The image sensor module according to claim 1 , wherein the transparent substrate includes any one of a transparent glass substrate, a transparent quartz substrate, and a transparent synthetic resin substrate.

4. The image sensor module according to claim 1 , wherein an angle made by the top surface of the transparent substrate and a side surface connected to the top surface of the transparent substrate is an obtuse angle.

5. The image sensor module according to claim 1 , further comprising a transparent adhesion member interposed between the transparent substrate and the semiconductor chip.

6. The image sensor module according to claim 1 , further comprising at least one lens unit disposed at a portion of the top surface of the transparent substrate corresponding to the active region.

7. The image sensor module according to claim 1 , further comprising a circuit substrate, the circuit substrate comprising:

a first opening exposing the active region; and

connecting pads disposed around the first opening wherein the connecting pads are electrically connected to a connecting member of the connecting members.

8. The image sensor module according to claim 7 , further comprising a holder surrounding the semiconductor chip and the circuit substrate, wherein the holder includes a second opening exposing the first opening of the circuit substrate.

9. The image sensor module according to claim 1 , wherein the transparent substrate comprises:

a first transparent substrate portion corresponding to the active region, the first transparent substrate portion having a first thickness; and

a second transparent substrate portion corresponding to the peripheral region, the second transparent substrate portion having a second thickness,

wherein the first thickness is greater than the second thickness.

10. An image sensor module, comprising:

a semiconductor chip comprising:

photodiode units disposed in an active region converting light into electric signals; and

pads disposed in a peripheral region formed around the active region and electrically connected to the photodiode units;

a transparent substrate comprising:

a first transparent substrate portion corresponding to the active region, the first transparent substrate portion having a first thickness;

a second transparent substrate portion corresponding to the peripheral region, the first transparent substrate portion having a first thickness, wherein the first thickness is greater than the second thickness;

a transparent substrate body covering the photodiode units and the pads and having through-holes exposing at least a portion of each of the pads;

through-electrodes electrically connected to the pads exposed through the through-holes; and

connection members connected to the through-electrodes, respectively.

11. The image sensor module according to claim 10 , wherein the transparent substrate includes any one of a transparent glass substrate, a transparent quartz substrate, and a transparent synthetic resin substrate.

12. The image sensor module according to claim 10 , further comprising a transparent adhesion member interposed between the transparent substrate and the semiconductor chip.

13. The image sensor module according to claim 10 , further comprising at least one lens unit disposed at a portion of a top surface of the transparent substrate corresponding to the active region.

14. The image sensor module according to claim 10 , further comprising a circuit substrate comprising:

a first opening exposing the active region; and

connecting pads disposed around the first opening, wherein the connecting pads are electrically connected to the connecting members.

15. The image sensor module according to claim 14 , further comprising a holder surrounding the semiconductor chip and the circuit substrate, wherein the holder includes a second opening exposing the first opening of the circuit substrate.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 8, 2008
From: KIM, SUNG MIN
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 021937/0793 →
Priority Claims (1)
KR 10-2008-0098755 · Oct 8, 2008 · national
Continuity (1)
Related Publication 20100084694A1 · Apr 8, 2010