Method and apparatus for identifying outliers following burn-in testing

1. A method, comprising:

interfacing a device in a sorter to determine its identity; and

in a computing device,

retrieving pre-burn-in data and post burn-in data associated with the device responsive to determining the identity, wherein retrieving the post burn-in data comprises extracting the post burn-in data associated with the device from a data file generated by a tester;

comparing pre-burn-in data associated with the device to the post burn-in data; and

identifying the device as an outlier device based on the comparison.

2. The method of claim 1 , further comprising scrapping the outlier device.

3. The method of claim 1 , further comprising changing a performance grade of the outlier device.

4. The method of claim 1 , wherein the tester has a first set of acceptance criteria for determining if the device is an outlier device, and comparing the pre-burn-in data to the post burn-in data comprises comparing the pre-burn-in data to the post burn-in data using a second set of acceptance criteria different from the first set of acceptance criteria.

5. The method of claim 1 , further comprising comparing the pre-burn-in data and the post burn-in data using a predetermined threshold.

6. The method of claim 1 , wherein the pre-burn-in data and the post burn-in data comprise at least one of static current data, thermsense data, capacitance data, voltage data, or temperature data.

7. A system, comprising:

means for interfacing a device in a sorter to determine its identity;

means for retrieving pre-burn-in data and post burn-in data associated with the device responsive to determining the identity, wherein retrieving the post burn-in data comprises extracting the post burn-in data associated with the device from a data file generated by a tester;

means for comparing pre-burn-in data associated with the device to the post burn-in data; and

means for identifying the device as an outlier device based on the comparison.

8. A method, comprising:

in a computing device,

extracting post burn-in data associated with a associated with a plurality of devices from a data file generated by at least one tester;

retrieving pre-burn-in data for at least a subset of the devices;

comparing the pre-burn-in data associated with the devices in the subset to the post burn-in data; and

identifying devices in the subset as outlier devices based on the comparisons.

9. The method of claim 8 , further comprising scrapping the outlier devices.

10. The method of claim 8 , further comprising changing a performance grade of the outlier devices.

11. The method of claim 8 , wherein the tester has a first set of acceptance criteria for determining if a particular device is an outlier device, and comparing the pre-burn-in data to the post burn-in data comprises comparing the pre-burn-in data to the post burn-in data using a second set of acceptance criteria different from the first set of acceptance criteria.

12. The method of claim 8 , further comprising comparing the pre-burn-in data and the post burn-in data using a predetermined threshold.

13. The method of claim 8 , wherein the pre-burn-in data and the post burn-in data comprise at least one of static current data, thermsense data, capacitance data, voltage data, or temperature data.

14. A system, comprising:

means for extracting post burn-in data associated with a associated with a plurality of devices from a data file generated by at least one tester;

means for retrieving pre-burn-in data for at least a subset of the devices;

means for comparing the pre-burn-in data associated with the devices in the subset to the post burn-in data; and

means for identifying devices in the subset as outlier devices based on the comparisons.