Plasma treating methods of fabricating phase change memory devices, and memory devices so fabricated

1. A method of fabricating a phase change memory device comprising:

forming a first electrode on a substrate;

forming a chalcogenide material on the first electrode; then

plasma treating the chalcogenide material that was formed on the first electrode sufficiently to introduce a plasma species throughout the chalcogenide material that was formed on the first electrode; and

forming a second electrode on the chalcogenide material.

2. A method according to claim 1 :

wherein forming a chalcogenide material on the first electrode comprises forming an insulating layer on the first electrode including a hole therein and forming the chalcogenide material in the hole and on the insulating layer outside the hole; and

wherein plasma treating the chalcogenide material comprises plasma treating the chalcogenide material in the hole and on the insulating layer outside the hole.

3. A method according to claim 1 :

wherein forming a chalcogenide material on the first electrode comprises forming an insulating layer on the first electrode including a hole therein, forming the chalcogenide material in the hole and on the insulating layer outside the hole and removing the chalcogenide material outside the hole; and

wherein plasma treating the chalcogenide material comprises plasma treating the chalcogenide material in the hole after removing the chalcogenide material outside the hole but before forming the second electrode on the chalcogenide material.

4. A method according to claim 1 wherein forming a second electrode on the chalcogenide material is performed so as to expose a sidewall of the chalcogenide material and wherein plasma treating the chalcogenide material is performed after forming the second electrode on the chalcogenide material, through the exposed sidewall.

5. A method according to claim 1 wherein plasma treating the chalcogenide material comprises hydrogen plasma treating the chalcogenide material that was formed on the first electrode sufficiently to introduce hydrogen throughout the chalcogenide material that was formed on the first electrode.

6. A method according to claim 1 wherein plasma treating the chalcogenide material comprises halogen plasma treating the chalcogenide material that was formed on the first electrode sufficiently to introduce halogen throughout the chalcogenide material that was formed on the first electrode.

7. A method according to claim 1 wherein plasma treating the chalcogenide material is performed at plasma power of less than about 100 W.

8. A method according to claim 1 wherein plasma treating the chalcogenide material is performed at temperature less than about 350° C.

9. A method according to claim 1 wherein plasma treating the chalcogenide material is performed at plasma power of between about 25 W and about 50 W and at temperature between about 200° C. and about 350° C.

10. A method according to claim 1 wherein plasma treating the chalcogenide material is performed sufficiently to introduce at least about 5 at. % of a plasma species throughout the chalcogenide material.

11. A method according to claim 1 wherein plasma treating the chalcogenide material is performed sufficiently to introduce between about 10 at. % and about 20 at. % of a plasma species throughout the chalcogenide material.

12. A method according to claim 1 wherein plasma treating the chalcogenide material is performed sufficiently to introduce a given at. % of a plasma species at an edge of the chalcogenide material and at least ⅙ of the given at. % of the plasma species at a center of the chalcogenide material.

13. A method according to claim 1 wherein plasma treating the chalcogenide material is performed sufficiently to produce less than about 6 times variation of at. % of a plasma species in the chalcogenide material.