Robust determination of the anisotropic polarizability of nanoparticles using coherent confocal microscopy
View Patent ↗A coherent confocal microscope for fully characterizing the elastic scattering properties of a nanoparticle as a function of wavelength. Using a high numerical aperture lens, two-dimensional scanning and a simple vector beam shaper, the rank-2 polarizability tensor is estimated from a single confocal image. A computationally efficient data processing method is described and numerical simulations show that this algorithm is robust to noise and uncertainty in the focal plane position. The measurement of the polarizability removes the need for a priori assumptions regarding the nanoparticle shape.
1. A method for measuring, with respect to a nanoparticle characterized by a polarizabilty, the polarizability of the nanoparticle as a function of wavelength, the method comprising:
a. illuminating the nanoparticle with an illuminating electromagnetic wave via a first vector beam shaper;
b. coherently detecting light scattered by the nanoparticle and propagated through a vector analyzer to generate a detected signal, wherein the vector analyzer is a beam shaper;
c. employing a computer system to perform an inversion of the detected signal based on a comparison of the detected signal to data predicted from a forward scattering model; and
d. estimating nanoparticle polarizability based on the inversion.
2. A method in accordance with claim 1 , further comprising a step of spectrally resolving the detected light.
3. A method in accordance with claim 1 , further comprising scanning the illuminating radiation in a plane transverse to the illumination direction.
4. A method in accordance with claim 1 , wherein the vector analyzer is identical to the vector beam shaper.
5. A method in accordance with claim 1 , further comprising varying a physical parameter of an environment in which the nanoparticle is disposed.
6. A method in accordance with claim 1 , wherein the step of estimating nanoparticle polarizability includes minimizing a cost function based on a norm relating the detected signal to an estimate.
7. A method in accordance with claim 1 , wherein the beam shaper is a spatially-uniform polarization analyzer rotated between sequential measurements.
8. A computer program product for use on a computer system for calculating, with respect to a nanoparticle characterized by a polarizabilty, the polarizability of the nanoparticle as a function of wavelength, the computer program product comprising a computer usable tangible medium having computer readable program code fixed thereon, the computer readable program code including:
a. program code for generating a forward scattering model based on forward scattering by a point source;
b. program code for receiving a signal based on coherent detection of light scattered by the nanoparticle and propagated through a vector analyzer, wherein the vector analyzer is a beam shaper;
c. program code for performing an inversion of the detected signal based on a comparison of the detected signal to data predicted from a forward scattering model; and
d. program code for estimating nanoparticle polarizability based on the inversion.