IP Library Granted Patent US 8,106,522
Granted Patent B2
US 8,106,522 · App. 12/958,446 · Granted Jan 31, 2012

Adhesive sheet for a stealth dicing and a production method of a semiconductor wafer device

Assignee: LINTEC Corporation
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Quick Facts
Patent No.
US 8,106,522
App. No.
12/958,446
Granted
Jan 31, 2012
Kind
B2
Abstract

An adhesive sheet is provided enabling to efficiently produce the very small size semiconductor chip by a stealth dicing method. An adhesive sheet for a stealth dicing includes a substrate and an adhesive layer formed on one side of the substrate, wherein a Young's modulus of the adhesive sheet at 23° C. is 200 to 600 MPa, and a storage elastic modulus of the adhesive layer at 23° C. is 0.10 to 50 MPa.

Claims (17)

1. An adhesive sheet for a stealth dicing comprising a substrate and an adhesive layer formed on one side of the substrate, wherein a Young's modulus of the adhesive sheet at 23° C. is 200 to 600 MPa, and a storage elastic modulus of the adhesive layer at 23° C. is 0.10 to 50 MPa.

2. The adhesive sheet for the stealth dicing as set forth in claim 1 , wherein a breaking elongation of the adhesive sheet when stretched at 200 mm/min is 50% or more.

3. The adhesive sheet for the stealth dicing as set forth in claim 1 , wherein the adhesive layer comprises an adhesive agent composition including an acrylic copolymer, and the thickness of the adhesive layer is 1 to 15 μm.

4. The adhesive sheet for the stealth dicing as set forth in claim 1 , wherein the substrate is vinyl chloride film and a thickness of the substrate is 40 to 90 μm.

5. A production method of a semiconductor device comprising,

a step of forming a modified portion inside a wafer by irradiating a laser beam to the semiconductor wafer formed with a circuit on a surface,

a step of adhering the adhesive sheet for the stealth dicing as set forth in claim 1 to a backside of the semiconductor wafer,

a step of forming chips by dividing the semiconductor wafer by expanding the adhesive sheet, and

a step of picking up the semiconductor chips.

6. A production method of a semiconductor device comprising,

forming a modified portion inside a wafer by irradiating a laser beam to the semiconductor wafer formed with a circuit on a surface;

adhering the adhesive sheet for the stealth dicing as set forth in claim 1 to a backside of the semiconductor wafer;

forming chips by dividing the semiconductor wafer by expanding the adhesive sheet; and

picking up the semiconductor chips.

7. A production method according to claim 6 , comprising adhering the adhesive sheet for the stealth dicing as set forth in claim 2 to a backside of the semiconductor wafer.

8. A production method according to claim 6 , comprising adhering the adhesive sheet for the stealth dicing as set forth in claim 3 to a backside of the semiconductor wafer.

9. A production method according to claim 6 , comprising adhering the adhesive sheet for the stealth dicing as set forth in claim 4 to a backside of the semiconductor wafer.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 2, 2010
From: SATO, YOSUKE; NAKAMURA, MASATOMO
To: LINTEC CORPORATION
Reel/Frame 025436/0387 →
Priority Claims (1)
JP 2009-276906 · Dec 4, 2009 · national
Continuity (1)
Related Publication 20110136322A1 · Jun 9, 2011