Defect inspection method and apparatus
Arrangements for inspecting a specimen on which plural patterns are formed; capturing a first image of a first area; capturing a second image of a second area in which patterns which are essentially the same with the patterns formed in the first area; creating data relating to corresponding pixels of the first and second images, for each pixel; determining a threshold for each pixel for detecting defects directly in accordance with the first and second images; and detecting defects on the specimen by processing the first and second images by using the threshold for each pixel and information of a scattered diagram of brightness of the first and second images, wherein the threshold is determined by using information of brightness of a local region of at least one of the first and second images, with the local region including an aimed pixel and peripheral pixels of the aimed pixel.
1. A method of inspecting a specimen, comprising:
illuminating a specimen, on which plural patterns are formed, with light emitted from a light source;
capturing a first image of a first area of the specimen in which patterns are formed; capturing a second image of a second area of the specimen in which patterns which are essentially the same with the patterns formed in the first area, are formed;
creating data relating to pixels of the first image and corresponding pixels of the second image, for each pixel;
determining a threshold for each pixel for detecting defects directly in accordance with the first image and the second image; and
detecting defects on the specimen by processing said first image and the second image by using said threshold for each pixel and information of a scattered diagram of brightness of the first image and the second image,
wherein the threshold is determined by using information of brightness of a local region of at least one of the first image and the second image, with the local region including an aimed pixel and peripheral pixels of the aimed pixel.
2. A method of inspecting a specimen according to claim 1 , wherein said first image and said second image are both bright field images.
3. A method of inspecting a specimen according to claim 1 , wherein said first image and said second image are both dark field images.
4. A method of inspecting a specimen according to claim 1 , wherein in the creating operation, said pixel data includes brightness of the first image and brightness of the second image.
5. An apparatus for inspecting a specimen, comprising:
a light source which emits a light;
an illuminator which illuminates a specimen, on which plural patterns are formed, with light emitted from the light sources;
an image capturing unit which captures a first image of a first area of the specimen in which patterns are formed, and a second image of a second area of the specimen in which patterns which are essentially the same with the patterns formed in the first area, are formed;
a pixel data creating unit which creates pixel data of the first image and corresponding pixel data of the second image, for each pixel;
a threshold determining unit which determines a threshold for each pixel for detecting defects directly in accordance with the first image and the second image; and
defect detecting unit which detects defects on the specimen by processing said first image and the second image by using said threshold for each pixel and information of a scattered diagram of brightness of the first image and the second image,
wherein the threshold is determined by using information of brightness of a local region of at least one of the first image and the second image, with the local region including an aimed pixel and peripheral pixels of the aimed pixel.
6. An apparatus for inspecting a specimen according to claim 5 , wherein in said image capturing unit, said captured first image and said second image are both bright field images.
7. An apparatus for inspecting a specimen according to claim 5 , wherein in said image capturing unit, said captured first image and said second image are both dark field images.
8. An apparatus for inspecting a specimen according to claim 5 , wherein said pixel data creating unit creates said pixel data of the first image including brightness of the first image and said pixel data of the second image including brightness of the second image.
9. A method of inspecting a specimen, comprising:
illuminating a specimen, on which plural patterns are formed, with light emitted from a light source;
capturing a first bright field image of a first area of the specimen in which patterns are formed;
capturing a second bright field image of a second area of the specimen in which patterns which are essentially the same with the patterns formed in the first area, are formed;
aligning the first bright field image and the second bright field image with an accuracy of less than one pixel unit;
creating data relating to pixels of the first image and corresponding pixels of the second image which are aligned with the accuracy of less than one pixel to match a brightness between the first bright field image and the second bright field image;
determining a threshold for each pixel for detecting defects directly in accordance with the first image and the second image; and
detecting defects on the specimen by processing said first image and the second image by using said threshold for each pixel and information of a scattered diagram of brightness of the first image and the second image,
wherein the threshold is determined by using information of brightness of a local region of at least one of the first image and the second image, with the local region including an aimed pixel and peripheral pixels of the aimed pixel.
10. A method of inspecting a specimen according to claim 9 , wherein in the creating operation, the data relating to pixels of the first image including brightness of the first image and the data relating to pixels of the second image are both including brightness of the second image.
11. A method of inspecting a specimen according to claim 1 , wherein regarding an extent of which pixels are used, the thresholds are determined by using information of brightness of only a local region of at least one of the first image and the second image, with the local region including only the aimed pixel and the peripheral pixels of the aimed pixel.
12. An apparatus for inspecting a specimen according to claim 5 , wherein regarding an extent of which pixels are used, the thresholds are determined by using information of brightness of only a local region of at least one of the first image and the second image, with the local region including only the aimed pixel and the peripheral pixels of the aimed pixel.
13. A method of inspecting a specimen according to claim 9 , wherein regarding an extent of which pixels are used, the thresholds are determined by using information of brightness of only a local region of at least one of the first image and the second image, with the local region including only the aimed pixel and the peripheral pixels of the aimed pixel.
14. A method of inspecting a specimen according to claim 1 , wherein the creating, determining and detecting operations are conducted via pipeline-type image processing.
15. An apparatus for inspecting a specimen according to claim 5 , wherein the pixel data creating unit, threshold determining unit and defect detecting unit operate via pipeline-type image processing.
16. A method of inspecting a specimen according to claim 9 , wherein the creating, determining and detecting operations are conducted via pipeline-type image processing.