IP Library › Granted Patent US 8,158,464
Granted Patent B2
US 8,158,464 · App. 12/411,957 · Granted Apr 17, 2012

Method of manufacturing a liquid crystal display device with a semiconductor film including zinc oxide

Assignee: Semiconductor Energy Laboratory Co., Ltd.
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Quick Facts
Patent No.
US 8,158,464
App. No.
12/411,957
Granted
Apr 17, 2012
Kind
B2
Abstract

To provide a semiconductor device in which a defect or fault is not generated and a manufacturing method thereof even if a ZnO semiconductor film is used and a ZnO film to which an n-type or p-type impurity is added is used for a source electrode and a drain electrode. The semiconductor device includes a gate insulating film formed by using a silicon oxide film or a silicon oxynitride film over a gate electrode, an Al film or an Al alloy film over the gate insulating film, a ZnO film to which an n-type or p-type impurity is added over the Al film or the Al alloy film, and a ZnO semiconductor film over the ZnO film to which an n-type or p-type impurity is added and the gate insulating film.

Claims (61)

1. A method of manufacturing a liquid crystal display device having an active matrix portion, the method comprising:

forming a metal film over a first substrate;

forming a conductive film comprising an oxide over and in contact with the metal film;

forming a semiconductor film containing zinc oxide as a channel formation region, over and in contact with the conductive film;

removing a portion of the conductive film, wherein the portion is out of contact with the semiconductor film prior to removing the portion;

forming a closed pattern of a sealant around the active matrix portion;

dropping liquid crystal composition in the closed pattern; and

attaching the first substrate and a second substrate to each other after dropping the liquid crystal composition.

2. A method of manufacturing a liquid crystal display device according to claim 1 , wherein the metal film is aluminum film or aluminum alloy film.

3. A method of manufacturing a liquid crystal display device according to claim 1 , wherein the conductive film comprises zinc oxide.

4. A method of manufacturing a liquid crystal display device according to claim 1 , wherein the metal film is a Ti film.

5. A method of manufacturing a liquid crystal display device according to claim 1 , wherein the metal film includes a first metal layer comprising aluminum and a second metal layer comprising titanium wherein the second metal layer is in contact with the conductive film.

6. A method of manufacturing a liquid crystal display device comprising:

forming a thin film transistor over a first substrate by the method comprising:

forming a metal film over the first substrate;

forming a conductive film comprising an oxide over and in contact with the metal film;

forming a semiconductor film comprising zinc oxide over and in contact with the conductive film;

forming a gate electrode adjacent to the semiconductor film with a gate insulating film interposed therebetween; and

removing a portion of the conductive film, wherein the portion is out of contact with the semiconductor film prior to removing the portion

forming a pixel electrode over the first substrate wherein the pixel electrode is electrically connected to the thin film transistor;

forming a closed pattern of a sealant over the first substrate;

dropping liquid crystal composition over the pixel electrode in the closed pattern; and

attaching a second substrate to the first substrate with the liquid crystal composition between the first substrate and the second substrate.

7. A method of manufacturing a liquid crystal display device according to claim 6 , wherein the metal film is aluminum film or aluminum alloy film.

8. A method of manufacturing a liquid crystal display device according to claim 6 , wherein the conductive film comprises zinc oxide.

9. A method of manufacturing a liquid crystal display device according to claim 6 , wherein the metal film is a Ti film.

10. A method of manufacturing a liquid crystal display device according to claim 6 , wherein the metal film includes a first metal layer comprising aluminum and a second metal layer comprising titanium wherein the second metal layer is in contact with the conductive film.

11. A method of manufacturing a liquid crystal display device comprising:

forming a thin film transistor over a first substrate by a method comprising:

forming a gate electrode;

forming a gate insulating film formed over the gate electrode;

forming a metal film formed over the first substrate;

forming a conductive film comprising an oxide on and in contact with the metal film;

forming a semiconductor film comprising zinc oxide on and in contact with the conductive film and the gate insulating film interposed therebetween; and

removing a portion of the conductive film, wherein the portion is out of contact with the semiconductor film prior to removing the portion

forming an insulating film comprising a resin material on the semiconductor film;

forming a pixel electrode over the insulating film wherein the pixel electrode is electrically connected to the thin film transistor through a contact hole of the insulating film;

forming a closed pattern of a sealant over the first substrate;

dropping liquid crystal composition over the pixel electrode in the closed pattern; and

attaching a second substrate to the first substrate with the liquid crystal composition between the first substrate and the second substrate.

12. A method of manufacturing a liquid crystal display device according to claim 11 , wherein the metal film is aluminum film or aluminum alloy film.

13. A method of manufacturing a liquid crystal display device according to claim 11 , wherein the conductive film comprises zinc oxide.

14. A method of manufacturing a liquid crystal display device according to claim 11 , wherein the metal film is a Ti film.

15. A method of manufacturing a liquid crystal display device according to claim 11 , wherein the metal film includes a first metal layer comprising aluminum and a second metal layer comprising titanium wherein the second metal layer is in contact with the conductive film.

16. A method of manufacturing a liquid crystal display device comprising:

forming a gate electrode over a first substrate;

forming a gate insulating film over the gate electrode;

forming a metal film over the first substrate;

forming a conductive film comprising an oxide on and in contact with the metal film; and

forming a semiconductor film comprising zinc oxide on and in contact with the conductive film and the gate insulating film;

removing a portion of the conductive film, wherein the portion is out of contact with the semiconductor film prior to removing the portion

forming an insulating film on the semiconductor film;

forming a pixel electrode over the insulating film wherein the pixel electrode is in contact with the conductive film through a contact hole of the insulating film;

forming a closed pattern of a sealant over the first substrate;

dropping liquid crystal composition over the pixel electrode in the closed pattern; and

attaching a second substrate to the first substrate with the liquid crystal composition between the first substrate and the second substrate.

17. A method of manufacturing a liquid crystal display device according to claim 16 , wherein the metal film is aluminum film or aluminum alloy film.

18. A method of manufacturing a liquid crystal display device according to claim 16 , wherein the conductive film comprises zinc oxide.

19. A method of manufacturing a liquid crystal display device according to claim 16 , wherein the metal film is a Ti film.

20. A method of manufacturing a liquid crystal display device according to claim 16 , wherein the metal film includes a first metal layer comprising aluminum and a second metal layer comprising titanium wherein the second metal layer is in contact with the conductive film.

21. A method of manufacturing a liquid crystal display device according to claim 16 , wherein the insulating film comprises a resin.

Priority Claims (1)
JP 2005-329806 · Nov 15, 2005 · national
Continuity (2)
Division 11598669 · Nov 14, 2006
Related Publication 20090186437A1 · Jul 23, 2009