IP Library › Granted Patent US 8,164,954
Granted Patent B2
US 8,164,954 · App. 13/224,101 · Granted Apr 24, 2012

Flash memory device and program method thereof

Assignee: Samsung Electronics Co., Ltd.
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Quick Facts
Patent No.
US 8,164,954
App. No.
13/224,101
Granted
Apr 24, 2012
Kind
B2
Abstract

A nonvolatile memory device that includes first and second storage areas, and a control logic configured to control the first and second storage areas, wherein when a program operation of the first storage area is passed before a program operation of the second storage area is passed, the control logic completes the program operation of the first storage area and continues the program operation of the second storage area is provided.

Claims (24)

1. A method of programming a flash memory device that includes a plurality of planes having a memory cell array formed of memory cells arranged in rows and columns, comprising:

programming the plurality of planes of the flash memory device by simultaneously applying a program voltage to the plurality of planes;

verify reading the plurality of planes to detect a program-passed plane and a program-failed plane; and

interrupting a programming of the program-passed plane by preventing the program voltage from being applied to the program-passed plane and continuing a programming of the program-failed plane by applying the program voltage to the program-failed plane,

wherein first applications of the program voltage to the plurality of planes are performed simultaneously.

2. The method of claim 1 , wherein levels of the program voltage applied to the plurality of planes simultaneously are the same.

3. A method of programming a flash memory device that includes a plurality of planes having a memory cell array formed of memory cells arranged in rows and columns, comprising:

programming a plurality of planes of the flash memory device by simultaneously applying a program voltage to the plurality of planes;

verify reading the plurality of planes to detect a program-passed plane and a program-failed plane; and

interrupting a programming of the program-passed plane by preventing the program voltage from being applied to the program-passed plane and continuing a programming of the program-failed plane by applying the program voltage to the program-failed plane, wherein the program voltage is applied to each plane of the plurality of planes by driving a high voltage; applying the high voltage to pass transistors of each plane to turn-on the pass transistors; and transferring the program voltage through the turned-on pass transistors to each plane,

wherein first applications of the program voltage to the plurality of planes are performed simultaneously.

4. A method of programming a flash memory device that includes a plurality of planes having a memory cell array formed of memory cells arranged in rows and columns, comprising:

programming a plurality of planes of the flash memory device by simultaneously applying a program voltage to the plurality of planes;

verify reading the plurality of planes to detect a program-passed plane and a program-failed plane; and

interrupting a programming of the program-passed plane by preventing the program voltage from being applied to the program-passed plane and continuing a programming of the program-failed plane by applying the program voltage to the program-failed plane,

wherein the program voltage is applied to each plane of the plurality of planes by driving a high voltage; applying the high voltage to pass transistors of each plane to turn-on the pass transistors; and transferring the program voltage through the turned-on pass transistors to each plane,

wherein the programming of the program-passed plane is interrupted by preventing the driving the high voltage,

wherein first applications of the program voltage to the plurality of planes are performed simultaneously.

5. The method of claim 4 , wherein the programming of the program-passed plane is interrupted by preventing the applying the high voltage in addition to the preventing the driving the high voltage.

6. The method of claim 4 , wherein the programming of the program-passed plane is interrupted by preventing the transferring the program voltage in addition to the preventing the driving the high voltage.

7. The method of claim 4 , wherein levels of the program voltage applied to the plurality of planes simultaneously are the same.

8. The method of claim 4 , wherein further comprising:

loading program data to the plurality of planes before the programming the plurality of planes.

9. the method of claim 4 , wherein the driving the high voltage, the applying the high voltage and the transferring the program voltage are performed simultaneously.

Priority Claims (1)
KR 10-2007-0039417 · Apr 23, 2007 · national
Continuity (3)
Continuation 12482590 · Jun 11, 2009
Continuation In Part 12100490 · Apr 10, 2008
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