Auto probe device and method of testing liquid crystal panel using the same
An auto probe device used in a method of testing a plurality of signal lines of a liquid crystal panel includes a printed circuit board having a shorting bar, a flexible printed circuit board having a plurality of connection patterns electrically connected to the shorting bar of the printed circuit board, and a plurality of contact pins contacting the plurality of pads formed in a non-display area of the liquid crystal panel. Such an auto probe device reduces a defect generation rate in a lighting test of the liquid crystal panel so that accuracy of the lighting test may be improved.
1. An auto probe device used in a method of testing a plurality of signal lines of a liquid crystal panel, the liquid crystal panel being divided into a display area in which the plurality of signal lines are formed and a non-display area in which a plurality of pads correspondingly connected to the plurality of signal lines and a first shorting bar electrically connected to the plurality of pads are formed, the auto probe device comprising:
a flexible printed circuit board having a plurality of connection patterns electrically one-to-one connected to the plurality of pads, overlapping the non-display area of the liquid crystal panel, and attached to a side surface of the liquid crystal panel;
a printed circuit board on which a second shorting bar electrically connected to the plurality of connection patterns of the flexible printed circuit board is formed; and
a plurality of contact pins contacting a portion where the plurality of pads and the plurality of connection patterns are connected to each other and supplying a signal to the plurality of signal lines of the liquid crystal panel,
wherein one side of the plurality of pads of the liquid crystal panel is connected to the first shorting bar of the liquid crystal panel via a first contact hole, the other side of the plurality of pads is one-to-one connected to one side of the plurality of connection patterns formed on the flexible printed circuit board via a second contact hole,
wherein the second shorting bar is formed of the same material used for the plurality of the connection patterns.
2. The auto probe device claimed as claim 1 , wherein the second shorting bar of the printed circuit board is formed in at least one conductive metal lines across an overall surface of the printed circuit board.
3. The auto probe device claimed as claim 1 , wherein the number of the plurality of connection patterns formed on the flexible printed circuit board is the same as the number of the plurality of pads of the liquid crystal panel.
4. The auto probe device claimed as claim 1 , wherein the other side of the plurality of connection patterns is connected to the second shorting bar of the printed circuit board.
5. A method of testing a liquid crystal panel using an auto probe device, the method comprising:
providing the liquid crystal panel divided into a display area in which a plurality of signal lines are formed and a non-display area in which a plurality of pads correspondingly connected to the plurality of signal lines and a first shorting bar electrically connected to the plurality of pads are formed;
providing the auto probe device comprising a flexible printed circuit board having a plurality of connection patterns electrically one-to-one connected to the plurality of pads, overlapping the non-display area of the liquid crystal panel, and attached to a side surface of the liquid crystal panel, a printed circuit board on which a second shorting bar electrically connected to the plurality of connection patterns of the flexible printed circuit board is formed, and a plurality of contact pins contacting a portion where the plurality of pads and the plurality of connection patterns are connected to each other and supplying a signal to the plurality of signal lines of the liquid crystal panel; and
connecting the plurality of connection patterns of the auto probe device to the plurality of pads of the liquid crystal panel, and simultaneously, allowing the plurality of contact pins of the auto probe device to contact a portion where the plurality of pads and the plurality of connection patterns are connected to each other,
wherein one side of the plurality of pads of the liquid crystal panel is connected to the first shorting bar of the liquid crystal panel via a first contact hole, the other side of the plurality of pads is one-to-one connected to one side of the plurality of connection patterns formed on the flexible printed circuit board via a second contact hole,
wherein the second shorting bar is formed of the same material used for the plurality of the connection patterns.